{"id":"https://openalex.org/W4391183398","doi":"https://doi.org/10.1109/isocc59558.2023.10396397","title":"Tcl-based Simulation Platform for Light-weight ResNet Implementation","display_name":"Tcl-based Simulation Platform for Light-weight ResNet Implementation","publication_year":2023,"publication_date":"2023-10-25","ids":{"openalex":"https://openalex.org/W4391183398","doi":"https://doi.org/10.1109/isocc59558.2023.10396397"},"language":"en","primary_location":{"id":"doi:10.1109/isocc59558.2023.10396397","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc59558.2023.10396397","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048067770","display_name":"Seunghyun Park","orcid":"https://orcid.org/0000-0001-5260-1252"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Seunghyun Park","raw_affiliation_strings":["Kyungpook National University,School of Electronic and Electrical Engineering,Daegu,Republic of Korea","School of Electronic and Electrical Engineering, Kyungpook National University, Daegu, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Kyungpook National University,School of Electronic and Electrical Engineering,Daegu,Republic of Korea","institution_ids":["https://openalex.org/I31419693"]},{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Kyungpook National University, Daegu, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100643556","display_name":"Dongkyu Lee","orcid":"https://orcid.org/0000-0002-1318-6276"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongkyu Lee","raw_affiliation_strings":["Kyungpook National University,School of Electronic and Electrical Engineering,Daegu,Republic of Korea","School of Electronic and Electrical Engineering, Kyungpook National University, Daegu, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Kyungpook National University,School of Electronic and Electrical Engineering,Daegu,Republic of Korea","institution_ids":["https://openalex.org/I31419693"]},{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Kyungpook National University, Daegu, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030304824","display_name":"Daejin Park","orcid":"https://orcid.org/0000-0002-5560-873X"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Daejin Park","raw_affiliation_strings":["Kyungpook National University,School of Electronic and Electrical Engineering,Daegu,Republic of Korea","School of Electronic and Electrical Engineering, Kyungpook National University, Daegu, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Kyungpook National University,School of Electronic and Electrical Engineering,Daegu,Republic of Korea","institution_ids":["https://openalex.org/I31419693"]},{"raw_affiliation_string":"School of Electronic and Electrical Engineering, Kyungpook National University, Daegu, Republic of Korea","institution_ids":["https://openalex.org/I31419693"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5048067770"],"corresponding_institution_ids":["https://openalex.org/I31419693"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19107453,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"335","last_page":"336"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9815000295639038,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9815000295639038,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9610999822616577,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12535","display_name":"Machine Learning and Data Classification","score":0.9391999840736389,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual-neural-network","display_name":"Residual neural network","score":0.7576422691345215},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7021189332008362},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18505698442459106},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.13989964127540588}],"concepts":[{"id":"https://openalex.org/C2944601119","wikidata":"https://www.wikidata.org/wiki/Q43744058","display_name":"Residual neural network","level":3,"score":0.7576422691345215},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7021189332008362},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18505698442459106},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.13989964127540588}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc59558.2023.10396397","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc59558.2023.10396397","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Decent work and economic growth","score":0.550000011920929,"id":"https://metadata.un.org/sdg/8"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321408","display_name":"Ministry of Education","ror":"https://ror.org/01p262204"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"},{"id":"https://openalex.org/F4320326288","display_name":"K2","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2599472179","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W3196952692","https://openalex.org/W4323057981","https://openalex.org/W2382290278","https://openalex.org/W2350741829"],"abstract_inverted_index":{"The":[0,50],"growing":[1],"computational":[2],"cost":[3],"and":[4,32],"size":[5],"of":[6,76,87,105],"artificial":[7],"intelligence":[8],"have":[9],"led":[10],"to":[11,28,109],"a":[12,24,40,47,85],"need":[13],"for":[14,20,56],"hardware":[15],"accelerators.":[16],"However,":[17],"training":[18],"times":[19,31],"neural":[21],"networks":[22],"remain":[23],"significant":[25],"obstacle,":[26],"leading":[27],"increased":[29],"simulation":[30,44,70,91],"decreased":[33],"productivity.":[34],"In":[35],"this":[36],"paper,":[37],"we":[38],"propose":[39],"runtime":[41],"layer":[42],"replaceable":[43],"platform":[45,52,67],"using":[46,60,92],"depth-reduction":[48],"algorithm.":[49],"proposed":[51],"generates":[53],"weights":[54],"optimized":[55],"various":[57],"ResNet":[58],"depths":[59],"the":[61,74,81,88,93,97,103],"first":[62],"trained":[63],"high-depth":[64],"weights.":[65],"This":[66],"can":[68],"reduce":[69],"time":[71],"by":[72],"reducing":[73],"number":[75,104],"trainings":[77],"without":[78],"significantly":[79],"degrading":[80],"inference":[82],"accuracy.":[83],"As":[84],"result":[86],"depth":[89],"reduction":[90],"MNIST":[94],"data":[95],"set,":[96],"accuracy":[98],"was":[99,107],"over":[100],"97%":[101],"when":[102],"layers":[106],"reduced":[108],"less":[110],"than":[111],"71%":[112]},"counts_by_year":[],"updated_date":"2025-12-21T01:58:51.020947","created_date":"2025-10-10T00:00:00"}