{"id":"https://openalex.org/W4391183394","doi":"https://doi.org/10.1109/isocc59558.2023.10396265","title":"GPU-Based Redundancy Analysis using Partitioning Method for Memory Repair","display_name":"GPU-Based Redundancy Analysis using Partitioning Method for Memory Repair","publication_year":2023,"publication_date":"2023-10-25","ids":{"openalex":"https://openalex.org/W4391183394","doi":"https://doi.org/10.1109/isocc59558.2023.10396265"},"language":"en","primary_location":{"id":"doi:10.1109/isocc59558.2023.10396265","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc59558.2023.10396265","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064791965","display_name":"Younwoo Yoo","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Younwoo Yoo","raw_affiliation_strings":["Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea","Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100782289","display_name":"Hayoung Lee","orcid":"https://orcid.org/0000-0002-6868-0829"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hayoung Lee","raw_affiliation_strings":["Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea","Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114585267","display_name":"Seung Ho Shin","orcid":"https://orcid.org/0009-0002-1153-0034"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung Ho Shin","raw_affiliation_strings":["Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea","Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea","Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yonsei University,Dept. of Electrical and Electronic Engineering,Seoul,Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.36484964,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9217000007629395,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9217000007629395,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13731","display_name":"Advanced Computing and Algorithms","score":0.9147999882698059,"subfield":{"id":"https://openalex.org/subfields/3322","display_name":"Urban Studies"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9088000059127808,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7871285676956177},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.6589879989624023},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.6154192686080933},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.15932172536849976}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7871285676956177},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.6589879989624023},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.6154192686080933},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.15932172536849976}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc59558.2023.10396265","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc59558.2023.10396265","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1984875683","https://openalex.org/W2522720996","https://openalex.org/W2759999593","https://openalex.org/W2762908080","https://openalex.org/W2995036598","https://openalex.org/W4249672558"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2350741829","https://openalex.org/W2530322880","https://openalex.org/W1596801655","https://openalex.org/W2359140296"],"abstract_inverted_index":{"Redundancy":[0],"Analysis":[1],"(RA)":[2],"is":[3,73],"an":[4],"effective":[5],"memory":[6,11,35],"repair":[7,26,33,93],"method":[8,89],"to":[9,101],"improve":[10],"yield.":[12],"However,":[13,52],"conventional":[14,102],"RA":[15,98,104],"methods":[16],"with":[17,64,95,105],"simple":[18,107],"spare":[19,47,57,71,108],"structures":[20,48,58],"have":[21],"limitations":[22],"in":[23],"achieving":[24],"optimal":[25],"rates":[27],"since":[28],"local":[29],"spares":[30],"can":[31,59],"only":[32],"the":[34,87],"banks":[36],"they":[37],"belong":[38],"to.":[39],"To":[40],"overcome":[41],"this":[42],"penalty,":[43],"research":[44],"on":[45],"complex":[46,56,70],"has":[49],"been":[50],"conducted.":[51],"generating":[53],"solutions":[54],"for":[55],"be":[60],"time-consuming":[61],"when":[62],"dealing":[63],"multiple":[65],"memories.":[66],"Therefore,":[67],"a":[68,91,96,106],"new":[69],"structure":[72],"proposed":[74,88],"using":[75],"GPU":[76],"parallel":[77],"processing":[78],"and":[79],"redundancy":[80],"group":[81],"partitioning.":[82],"Experimental":[83],"results":[84],"show":[85],"that":[86],"achieves":[90],"higher":[92],"rate":[94],"similar":[97],"time":[99],"compared":[100],"GPU-based":[103],"structure.":[109]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}