{"id":"https://openalex.org/W4391183445","doi":"https://doi.org/10.1109/isocc59558.2023.10396148","title":"A Compact Design of SPAD Detector with Quenching Circuit for Reduced Dark Count Rate","display_name":"A Compact Design of SPAD Detector with Quenching Circuit for Reduced Dark Count Rate","publication_year":2023,"publication_date":"2023-10-25","ids":{"openalex":"https://openalex.org/W4391183445","doi":"https://doi.org/10.1109/isocc59558.2023.10396148"},"language":"en","primary_location":{"id":"doi:10.1109/isocc59558.2023.10396148","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc59558.2023.10396148","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102445493","display_name":"Jaehun Jeong","orcid":null},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jaehun Jeong","raw_affiliation_strings":["Sogang University,Dept. of Electronics Engineering,Seoul,Korea,121-742"],"affiliations":[{"raw_affiliation_string":"Sogang University,Dept. of Electronics Engineering,Seoul,Korea,121-742","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114121282","display_name":"Jonghyuk Chae","orcid":null},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jonghyuk Chae","raw_affiliation_strings":["Sogang University,Dept. of Electronics Engineering,Seoul,Korea,121-742"],"affiliations":[{"raw_affiliation_string":"Sogang University,Dept. of Electronics Engineering,Seoul,Korea,121-742","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101797435","display_name":"Seungju Lee","orcid":"https://orcid.org/0000-0002-7384-9158"},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungju Lee","raw_affiliation_strings":["Sogang University,Dept. of Electronics Engineering,Seoul,Korea,121-742"],"affiliations":[{"raw_affiliation_string":"Sogang University,Dept. of Electronics Engineering,Seoul,Korea,121-742","institution_ids":["https://openalex.org/I148751991"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065103824","display_name":"Jinwook Burm","orcid":"https://orcid.org/0000-0002-9594-771X"},"institutions":[{"id":"https://openalex.org/I148751991","display_name":"Sogang University","ror":"https://ror.org/056tn4839","country_code":"KR","type":"education","lineage":["https://openalex.org/I148751991"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinwook Burm","raw_affiliation_strings":["Sogang University,Dept. of Electronics Engineering,Seoul,Korea,121-742"],"affiliations":[{"raw_affiliation_string":"Sogang University,Dept. of Electronics Engineering,Seoul,Korea,121-742","institution_ids":["https://openalex.org/I148751991"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5102445493"],"corresponding_institution_ids":["https://openalex.org/I148751991"],"apc_list":null,"apc_paid":null,"fwci":0.4806,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.79348064,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"261","last_page":"262"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13869","display_name":"Ocular and Laser Science Research","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2731","display_name":"Ophthalmology"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10540","display_name":"Advanced Fluorescence Microscopy Techniques","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quenching","display_name":"Quenching (fluorescence)","score":0.6459404230117798},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6341079473495483},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.6321825981140137},{"id":"https://openalex.org/keywords/dark-current","display_name":"Dark current","score":0.5592477321624756},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.5460838675498962},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4908915162086487},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.48839157819747925},{"id":"https://openalex.org/keywords/single-photon-avalanche-diode","display_name":"Single-photon avalanche diode","score":0.4739822447299957},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.4468737244606018},{"id":"https://openalex.org/keywords/avalanche-photodiode","display_name":"Avalanche photodiode","score":0.3710266947746277},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35404542088508606},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.34202682971954346},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2825861871242523},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12673574686050415},{"id":"https://openalex.org/keywords/fluorescence","display_name":"Fluorescence","score":0.057476550340652466}],"concepts":[{"id":"https://openalex.org/C121745418","wikidata":"https://www.wikidata.org/wiki/Q585536","display_name":"Quenching (fluorescence)","level":3,"score":0.6459404230117798},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6341079473495483},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6321825981140137},{"id":"https://openalex.org/C180651308","wikidata":"https://www.wikidata.org/wiki/Q1265973","display_name":"Dark current","level":3,"score":0.5592477321624756},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.5460838675498962},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4908915162086487},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.48839157819747925},{"id":"https://openalex.org/C193361668","wikidata":"https://www.wikidata.org/wiki/Q7523761","display_name":"Single-photon avalanche diode","level":4,"score":0.4739822447299957},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4468737244606018},{"id":"https://openalex.org/C109679912","wikidata":"https://www.wikidata.org/wiki/Q175932","display_name":"Avalanche photodiode","level":3,"score":0.3710266947746277},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35404542088508606},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34202682971954346},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2825861871242523},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12673574686050415},{"id":"https://openalex.org/C91881484","wikidata":"https://www.wikidata.org/wiki/Q191807","display_name":"Fluorescence","level":2,"score":0.057476550340652466},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc59558.2023.10396148","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc59558.2023.10396148","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 20th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322064","display_name":"Korea Institute for Advancement of Technology","ror":"https://ror.org/015w1qa96"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320322202","display_name":"IC Design Education Center","ror":"https://ror.org/005v57z85"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1977891801","https://openalex.org/W2099552383","https://openalex.org/W2983086314"],"related_works":["https://openalex.org/W2335509959","https://openalex.org/W2955612997","https://openalex.org/W2806465940","https://openalex.org/W3093728880","https://openalex.org/W2087610735","https://openalex.org/W1997266405","https://openalex.org/W4242124019","https://openalex.org/W3135396822","https://openalex.org/W2008253019","https://openalex.org/W2781769039"],"abstract_inverted_index":{"We":[0],"present":[1],"a":[2,6,13,42,74],"compact":[3],"design":[4],"of":[5,47,61,70,76],"Single-Photon":[7],"Avalanche":[8],"Diode":[9],"(SPAD)":[10],"detector":[11],"with":[12],"Passive":[14],"Quenching":[15],"Active":[16],"Reset":[17],"(PQAR)":[18],"circuit":[19,50],"for":[20],"reducing":[21],"the":[22,32,36,48,53,58,62],"Dark":[23],"Count":[24],"Rate":[25],"(DCR).":[26],"Fabricated":[27],"in":[28],"0.11\u03bcm":[29],"CMOS":[30],"Technology,":[31],"single":[33],"pixel":[34],"includes":[35],"SPAD":[37,63],"device,":[38],"quenching":[39],"circuit,":[40],"and":[41,56],"10-bit":[43],"counter.":[44],"The":[45],"integration":[46],"PQAR":[49],"effectively":[51],"suppresses":[52],"dark":[54],"counts":[55],"improves":[57],"overall":[59],"performance":[60],"detector.":[64],"By":[65],"applying":[66],"an":[67],"excess":[68],"bias":[69],"2.5V,":[71],"we":[72],"achieved":[73],"DCR":[75],"150cps.":[77]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-25T23:11:45.687758","created_date":"2025-10-10T00:00:00"}
