{"id":"https://openalex.org/W4319430741","doi":"https://doi.org/10.1109/isocc56007.2022.10031510","title":"A survey and perspective on electronic design automation tools for ensuring SoC security","display_name":"A survey and perspective on electronic design automation tools for ensuring SoC security","publication_year":2022,"publication_date":"2022-10-19","ids":{"openalex":"https://openalex.org/W4319430741","doi":"https://doi.org/10.1109/isocc56007.2022.10031510"},"language":"en","primary_location":{"id":"doi:10.1109/isocc56007.2022.10031510","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc56007.2022.10031510","pdf_url":null,"source":{"id":"https://openalex.org/S4363608048","display_name":"2022 19th International SoC Design Conference (ISOCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 19th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100745500","display_name":"Feng Tian","orcid":"https://orcid.org/0000-0001-5180-6002"},"institutions":[{"id":"https://openalex.org/I204553293","display_name":"China University of Petroleum, Beijing","ror":"https://ror.org/041qf4r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I204553293"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Tian Feng","raw_affiliation_strings":["China University of Petroleum (Beijing),Department of Computer Science and Technology,Beijing,China","Department of Computer Science and Technology, China University of Petroleum (Beijing), Beijing, China"],"affiliations":[{"raw_affiliation_string":"China University of Petroleum (Beijing),Department of Computer Science and Technology,Beijing,China","institution_ids":["https://openalex.org/I204553293"]},{"raw_affiliation_string":"Department of Computer Science and Technology, China University of Petroleum (Beijing), Beijing, China","institution_ids":["https://openalex.org/I204553293"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063086391","display_name":"Haojie Pei","orcid":"https://orcid.org/0000-0002-4665-5657"},"institutions":[{"id":"https://openalex.org/I204553293","display_name":"China University of Petroleum, Beijing","ror":"https://ror.org/041qf4r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I204553293"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haojie Pei","raw_affiliation_strings":["China University of Petroleum (Beijing),Department of Computer Science and Technology,Beijing,China","Department of Computer Science and Technology, China University of Petroleum (Beijing), Beijing, China"],"affiliations":[{"raw_affiliation_string":"China University of Petroleum (Beijing),Department of Computer Science and Technology,Beijing,China","institution_ids":["https://openalex.org/I204553293"]},{"raw_affiliation_string":"Department of Computer Science and Technology, China University of Petroleum (Beijing), Beijing, China","institution_ids":["https://openalex.org/I204553293"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057257864","display_name":"Zhou Jin","orcid":"https://orcid.org/0000-0002-0632-9494"},"institutions":[{"id":"https://openalex.org/I204553293","display_name":"China University of Petroleum, Beijing","ror":"https://ror.org/041qf4r12","country_code":"CN","type":"education","lineage":["https://openalex.org/I204553293"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhou Jin","raw_affiliation_strings":["China University of Petroleum (Beijing),Department of Computer Science and Technology,Beijing,China","Department of Computer Science and Technology, China University of Petroleum (Beijing), Beijing, China"],"affiliations":[{"raw_affiliation_string":"China University of Petroleum (Beijing),Department of Computer Science and Technology,Beijing,China","institution_ids":["https://openalex.org/I204553293"]},{"raw_affiliation_string":"Department of Computer Science and Technology, China University of Petroleum (Beijing), Beijing, China","institution_ids":["https://openalex.org/I204553293"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100446386","display_name":"Wu Xiao","orcid":"https://orcid.org/0000-0002-2793-5602"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xiao Wu","raw_affiliation_strings":["Huada Empyrean Software Co. Ltd,Beijing,China","Huada Empyrean Software Co. Ltd, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Huada Empyrean Software Co. Ltd,Beijing,China","institution_ids":[]},{"raw_affiliation_string":"Huada Empyrean Software Co. Ltd, Beijing, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100745500"],"corresponding_institution_ids":["https://openalex.org/I204553293"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22750253,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"215","last_page":"216"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.7782919406890869},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6032984256744385},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5845657587051392},{"id":"https://openalex.org/keywords/supply-chain","display_name":"Supply chain","score":0.5799020528793335},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.5582813620567322},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.5459056496620178},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5312504768371582},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4853150248527527},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.47347843647003174},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.45224982500076294},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.447849839925766},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.32876259088516235},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26690274477005005},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2416762113571167},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12380954623222351},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11649519205093384},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.08606100082397461}],"concepts":[{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.7782919406890869},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6032984256744385},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5845657587051392},{"id":"https://openalex.org/C108713360","wikidata":"https://www.wikidata.org/wiki/Q1824206","display_name":"Supply chain","level":2,"score":0.5799020528793335},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.5582813620567322},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.5459056496620178},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5312504768371582},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4853150248527527},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.47347843647003174},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.45224982500076294},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.447849839925766},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.32876259088516235},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26690274477005005},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2416762113571167},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12380954623222351},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11649519205093384},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.08606100082397461},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc56007.2022.10031510","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc56007.2022.10031510","pdf_url":null,"source":{"id":"https://openalex.org/S4363608048","display_name":"2022 19th International SoC Design Conference (ISOCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 19th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5400000214576721,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2122760471","https://openalex.org/W2745235995","https://openalex.org/W3036696276","https://openalex.org/W4206991428","https://openalex.org/W4285309987","https://openalex.org/W4288550587","https://openalex.org/W6790607911","https://openalex.org/W6841541013","https://openalex.org/W6983454339"],"related_works":["https://openalex.org/W2384601745","https://openalex.org/W2537171119","https://openalex.org/W1997699367","https://openalex.org/W2110366946","https://openalex.org/W2108753284","https://openalex.org/W2142409304","https://openalex.org/W2139353707","https://openalex.org/W2166975036","https://openalex.org/W1497133609","https://openalex.org/W1885297255"],"abstract_inverted_index":{"With":[0],"the":[1,22,41,54,60],"increasing":[2],"scales":[3],"and":[4,20,72,98],"complexity":[5],"of":[6,63,85],"SoC":[7,43,55,77,90],"integration,":[8],"electronic":[9],"design":[10,45,78],"automation":[11],"(EDA)":[12],"tools":[13,75,87],"have":[14],"been":[15],"becoming":[16],"indispensable":[17],"for":[18,52],"simulating":[19],"verifying":[21],"chip":[23,44],"before":[24],"highly":[25,35],"expensive":[26],"tape-out.":[27],"From":[28],"design,":[29],"test":[30],"to":[31],"manufacture,":[32],"EDA":[33,74,86],"is":[34],"evolved":[36],"almost":[37],"every":[38],"step":[39],"during":[40],"entire":[42],"process,":[46],"making":[47],"it":[48],"a":[49],"crucial":[50],"part":[51],"ensuring":[53,89],"supply":[56,66,91],"chain":[57,92],"security":[58,93],"under":[59],"intensified":[61],"tension":[62],"global":[64],"semiconductor":[65],"chain.":[67],"In":[68],"this":[69],"paper,":[70],"commercial":[71],"open-source":[73],"in":[76],"process":[79],"will":[80,94],"be":[81,95],"introduced.":[82],"The":[83],"impact":[84],"on":[88],"also":[96],"expounded":[97],"analyzed.":[99]},"counts_by_year":[],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}