{"id":"https://openalex.org/W4319431013","doi":"https://doi.org/10.1109/isocc56007.2022.10031431","title":"Automation Framework for Digital Circuit Design and Verification","display_name":"Automation Framework for Digital Circuit Design and Verification","publication_year":2022,"publication_date":"2022-10-19","ids":{"openalex":"https://openalex.org/W4319431013","doi":"https://doi.org/10.1109/isocc56007.2022.10031431"},"language":"en","primary_location":{"id":"doi:10.1109/isocc56007.2022.10031431","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc56007.2022.10031431","pdf_url":null,"source":{"id":"https://openalex.org/S4363608048","display_name":"2022 19th International SoC Design Conference (ISOCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 19th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019265795","display_name":"Hayun Bong","orcid":null},"institutions":[{"id":"https://openalex.org/I191879574","display_name":"Inha University","ror":"https://ror.org/01easw929","country_code":"KR","type":"education","lineage":["https://openalex.org/I191879574"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hayun Bong","raw_affiliation_strings":["Information and Communication Engineering Inha University,Incheon,Korea,22212"],"affiliations":[{"raw_affiliation_string":"Information and Communication Engineering Inha University,Incheon,Korea,22212","institution_ids":["https://openalex.org/I191879574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014864731","display_name":"Kyungseon Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I191879574","display_name":"Inha University","ror":"https://ror.org/01easw929","country_code":"KR","type":"education","lineage":["https://openalex.org/I191879574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyungseon Cho","raw_affiliation_strings":["Information and Communication Engineering Inha University,Incheon,Korea,22212"],"affiliations":[{"raw_affiliation_string":"Information and Communication Engineering Inha University,Incheon,Korea,22212","institution_ids":["https://openalex.org/I191879574"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051268559","display_name":"Yeongkyo Seo","orcid":"https://orcid.org/0000-0001-7931-6275"},"institutions":[{"id":"https://openalex.org/I191879574","display_name":"Inha University","ror":"https://ror.org/01easw929","country_code":"KR","type":"education","lineage":["https://openalex.org/I191879574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yeongkyo Seo","raw_affiliation_strings":["Information and Communication Engineering Inha University,Incheon,Korea,22212"],"affiliations":[{"raw_affiliation_string":"Information and Communication Engineering Inha University,Incheon,Korea,22212","institution_ids":["https://openalex.org/I191879574"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5019265795"],"corresponding_institution_ids":["https://openalex.org/I191879574"],"apc_list":null,"apc_paid":null,"fwci":1.6094,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.84846897,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"263","last_page":"264"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.7915667295455933},{"id":"https://openalex.org/keywords/electronic-design-automation","display_name":"Electronic design automation","score":0.7411446571350098},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.6558982133865356},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6530547142028809},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4335933327674866},{"id":"https://openalex.org/keywords/circuit-design","display_name":"Circuit design","score":0.4173767566680908},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3919965326786041},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3774629235267639},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26148951053619385},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25353169441223145}],"concepts":[{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.7915667295455933},{"id":"https://openalex.org/C64260653","wikidata":"https://www.wikidata.org/wiki/Q1194864","display_name":"Electronic design automation","level":2,"score":0.7411446571350098},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.6558982133865356},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6530547142028809},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4335933327674866},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.4173767566680908},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3919965326786041},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3774629235267639},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26148951053619385},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25353169441223145},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc56007.2022.10031431","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc56007.2022.10031431","pdf_url":null,"source":{"id":"https://openalex.org/S4363608048","display_name":"2022 19th International SoC Design Conference (ISOCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 19th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6200000047683716,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1996605065","https://openalex.org/W3016362956","https://openalex.org/W3118338221"],"related_works":["https://openalex.org/W2796521923","https://openalex.org/W3214257365","https://openalex.org/W95651076","https://openalex.org/W2349227977","https://openalex.org/W2770163697","https://openalex.org/W2110521006","https://openalex.org/W2385761770","https://openalex.org/W4319431013","https://openalex.org/W2391863233","https://openalex.org/W1970528334"],"abstract_inverted_index":{"Due":[0],"to":[1,13],"the":[2,15,21,43,59,67,83,88],"demands":[3],"for":[4,73],"various":[5],"custom":[6],"digital":[7,39,74],"circuitry,":[8],"it":[9],"is":[10],"very":[11],"important":[12],"reduce":[14,33],"effort":[16,36],"of":[17,52,87],"circuit":[18],"design":[19,35],"in":[20,28,37],"semiconductor":[22],"industry.":[23],"The":[24,47],"automation":[25,61,70,89],"framework":[26,90],"proposed":[27],"this":[29],"paper":[30],"can":[31],"greatly":[32],"unnecessary":[34],"general":[38],"circuits":[40],"while":[41],"maintaining":[42],"power":[44,51],"and":[45,50,62,79,85,93],"performance.":[46],"area,":[48],"time,":[49],"tri-state":[53],"inverter-based":[54],"D":[55],"Flip-Flop":[56],"designed":[57],"using":[58],"layout":[60],"hand-drawn":[63],"were":[64,91,95],"measured":[65],"with":[66],"Python-based":[68],"measurement":[69],"tool":[71],"developed":[72],"circuits.":[75],"And":[76],"by":[77],"comparing":[78],"analyzing":[80],"these":[81],"results,":[82],"performance":[84],"limitations":[86],"confirmed,":[92],"conclusions":[94],"drawn":[96],"comprehensively.":[97]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}