{"id":"https://openalex.org/W4319430806","doi":"https://doi.org/10.1109/isocc56007.2022.10031296","title":"Data extraction from flash memory and reverse engineering using Xilinx 7 series FPGA boards","display_name":"Data extraction from flash memory and reverse engineering using Xilinx 7 series FPGA boards","publication_year":2022,"publication_date":"2022-10-19","ids":{"openalex":"https://openalex.org/W4319430806","doi":"https://doi.org/10.1109/isocc56007.2022.10031296"},"language":"en","primary_location":{"id":"doi:10.1109/isocc56007.2022.10031296","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc56007.2022.10031296","pdf_url":null,"source":{"id":"https://openalex.org/S4363608048","display_name":"2022 19th International SoC Design Conference (ISOCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 19th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101595841","display_name":"Dong\u2010Chan Lee","orcid":"https://orcid.org/0000-0002-3042-6411"},"institutions":[{"id":"https://openalex.org/I94588446","display_name":"Hongik University","ror":"https://ror.org/00egdv862","country_code":"KR","type":"education","lineage":["https://openalex.org/I94588446"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongchan Lee","raw_affiliation_strings":["School of Electronic & Electrical, Eng. Hongik University,Seoul,Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic & Electrical, Eng. Hongik University,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I94588446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100460359","display_name":"Sang Hyun Lee","orcid":"https://orcid.org/0000-0002-2246-7440"},"institutions":[{"id":"https://openalex.org/I94588446","display_name":"Hongik University","ror":"https://ror.org/00egdv862","country_code":"KR","type":"education","lineage":["https://openalex.org/I94588446"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sanghyun Lee","raw_affiliation_strings":["School of Electronic & Electrical, Eng. Hongik University,Seoul,Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic & Electrical, Eng. Hongik University,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I94588446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035729850","display_name":"Mannhee Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Mannhee Cho","raw_affiliation_strings":["School of Electrical Engineering, Korea University,Seoul,Republic of Korea","School of Electrical Engineering, Korea University, Seoul, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042373004","display_name":"Hyung\u2010Min Lee","orcid":"https://orcid.org/0000-0003-1191-3553"},"institutions":[{"id":"https://openalex.org/I197347611","display_name":"Korea University","ror":"https://ror.org/047dqcg40","country_code":"KR","type":"education","lineage":["https://openalex.org/I197347611"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyung-Min Lee","raw_affiliation_strings":["School of Electrical Engineering, Korea University,Seoul,Republic of Korea","School of Electrical Engineering, Korea University, Seoul, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Korea University,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I197347611"]},{"raw_affiliation_string":"School of Electrical Engineering, Korea University, Seoul, Republic of Korea","institution_ids":["https://openalex.org/I197347611"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100337301","display_name":"Youngmin Kim","orcid":"https://orcid.org/0000-0002-6893-5270"},"institutions":[{"id":"https://openalex.org/I94588446","display_name":"Hongik University","ror":"https://ror.org/00egdv862","country_code":"KR","type":"education","lineage":["https://openalex.org/I94588446"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngmin Kim","raw_affiliation_strings":["School of Electronic & Electrical, Eng. Hongik University,Seoul,Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic & Electrical, Eng. Hongik University,Seoul,Republic of Korea","institution_ids":["https://openalex.org/I94588446"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.413,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.56942636,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"330","last_page":"331"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.979200005531311,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.863808810710907},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.8404216766357422},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.740710437297821},{"id":"https://openalex.org/keywords/reverse-engineering","display_name":"Reverse engineering","score":0.71873939037323},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.6510106325149536},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.5360496640205383},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5096726417541504},{"id":"https://openalex.org/keywords/flash-file-system","display_name":"Flash file system","score":0.4383181631565094},{"id":"https://openalex.org/keywords/flash-memory-emulator","display_name":"Flash memory emulator","score":0.424843966960907},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.2853422164916992},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.21434637904167175},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11936002969741821}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.863808810710907},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.8404216766357422},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.740710437297821},{"id":"https://openalex.org/C207850805","wikidata":"https://www.wikidata.org/wiki/Q269608","display_name":"Reverse engineering","level":2,"score":0.71873939037323},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.6510106325149536},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5360496640205383},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5096726417541504},{"id":"https://openalex.org/C27670709","wikidata":"https://www.wikidata.org/wiki/Q5457555","display_name":"Flash file system","level":4,"score":0.4383181631565094},{"id":"https://openalex.org/C96535780","wikidata":"https://www.wikidata.org/wiki/Q5457561","display_name":"Flash memory emulator","level":5,"score":0.424843966960907},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.2853422164916992},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.21434637904167175},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11936002969741821},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc56007.2022.10031296","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isocc56007.2022.10031296","pdf_url":null,"source":{"id":"https://openalex.org/S4363608048","display_name":"2022 19th International SoC Design Conference (ISOCC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 19th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4000000059604645,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2165547651","https://openalex.org/W2895952230","https://openalex.org/W2919561762","https://openalex.org/W3134045669"],"related_works":["https://openalex.org/W2378783493","https://openalex.org/W3008214483","https://openalex.org/W2376144476","https://openalex.org/W2365583730","https://openalex.org/W2365088500","https://openalex.org/W2372201479","https://openalex.org/W2364580619","https://openalex.org/W2376668782","https://openalex.org/W2369836424","https://openalex.org/W50351137"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"introduce":[4],"a":[5,52],"general":[6],"methodology":[7],"of":[8,25,51,57],"reverse":[9,39,67],"engineering":[10,40,68],"for":[11,18,30,38],"Xilinx":[12],"FPGA":[13],"devices":[14],"using":[15,64],"flash":[16,27,46],"memory":[17,28,47],"programming.":[19],"Based":[20],"on":[21],"the":[22,26,31,45,49,58,65],"structural":[23],"analysis":[24],"used":[29],"most":[32],"recent":[33],"7-Series":[34],"FPGA,":[35],"data":[36],"extraction":[37],"is":[41,61],"carried":[42],"out":[43],"targeting":[44],"with":[48],"help":[50],"logic":[53],"analyzer.":[54],"The":[55],"accuracy":[56],"extracted":[59],"bitstream":[60],"finally":[62],"verified":[63],"in-house":[66],"tool.":[69]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}