{"id":"https://openalex.org/W3215556174","doi":"https://doi.org/10.1109/isocc53507.2021.9613980","title":"An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA","display_name":"An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA","publication_year":2021,"publication_date":"2021-10-06","ids":{"openalex":"https://openalex.org/W3215556174","doi":"https://doi.org/10.1109/isocc53507.2021.9613980","mag":"3215556174"},"language":"en","primary_location":{"id":"doi:10.1109/isocc53507.2021.9613980","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc53507.2021.9613980","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 18th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5114585267","display_name":"Seung Ho Shin","orcid":"https://orcid.org/0009-0002-1153-0034"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seung Ho Shin","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100782289","display_name":"Hayoung Lee","orcid":"https://orcid.org/0000-0002-6868-0829"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hayoung Lee","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064791965","display_name":"Younwoo Yoo","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Younwoo Yoo","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.814,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.67573325,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"429","last_page":"430"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.9807392358779907},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7328997850418091},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.591958224773407},{"id":"https://openalex.org/keywords/row","display_name":"Row","score":0.5434761643409729},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.515531063079834},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15671077370643616},{"id":"https://openalex.org/keywords/operations-management","display_name":"Operations management","score":0.09404674172401428},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.08256736397743225}],"concepts":[{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.9807392358779907},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7328997850418091},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.591958224773407},{"id":"https://openalex.org/C135598885","wikidata":"https://www.wikidata.org/wiki/Q1366302","display_name":"Row","level":2,"score":0.5434761643409729},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.515531063079834},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15671077370643616},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.09404674172401428},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.08256736397743225},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc53507.2021.9613980","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc53507.2021.9613980","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 18th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2086716781","https://openalex.org/W2152425525","https://openalex.org/W2155640457","https://openalex.org/W2783723606","https://openalex.org/W3123810022"],"related_works":["https://openalex.org/W2096502566","https://openalex.org/W2356702869","https://openalex.org/W2433052208","https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847"],"abstract_inverted_index":{"Three-dimensional":[0],"(3D)":[1],"memory":[2,10],"is":[3,89],"widely":[4],"developed":[5],"to":[6,33,46,66],"fulfill":[7],"the":[8,13,19,35,58,83,86,92,104],"ever-increasing":[9],"densities.":[11],"For":[12,73],"high":[14,49],"reliability":[15],"of":[16,25,37],"3D":[17],"memory,":[18],"traditional":[20],"spare":[21,38,42,69,79,101],"structures":[22,43,70,102],"that":[23],"consist":[24],"simple":[26],"rows":[27],"and":[28,85],"columns":[29],"have":[30,61],"a":[31,48,76],"difficulty":[32],"maximize":[34],"efficiency":[36],"allocation.":[39],"Therefore,":[40],"various":[41,68,100],"are":[44],"adopted":[45],"achieve":[47],"repair":[50,88],"rate":[51],"improvement":[52],"for":[53,82],"multiple":[54],"banks":[55],"memory.":[56],"However,":[57],"previous":[59],"studies":[60],"not":[62],"proposed":[63],"any":[64],"methodology":[65,81,93],"allocate":[67],"with":[71,103],"BIRA.":[72,107],"this":[74],"reason,":[75],"new":[77],"effective":[78],"allocation":[80,106],"pre-bond":[84],"post-bond":[87],"proposed.":[90],"Also,":[91],"can":[94],"be":[95],"verified":[96],"by":[97],"six":[98],"representative":[99],"sequential":[105]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}