{"id":"https://openalex.org/W3216009538","doi":"https://doi.org/10.1109/isocc53507.2021.9613949","title":"Detecting LED Chip Surface Defects with Modified Faster R-CNN","display_name":"Detecting LED Chip Surface Defects with Modified Faster R-CNN","publication_year":2021,"publication_date":"2021-10-06","ids":{"openalex":"https://openalex.org/W3216009538","doi":"https://doi.org/10.1109/isocc53507.2021.9613949","mag":"3216009538"},"language":"en","primary_location":{"id":"doi:10.1109/isocc53507.2021.9613949","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc53507.2021.9613949","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 18th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100611977","display_name":"Zhiwen Zhang","orcid":"https://orcid.org/0000-0002-3123-8885"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiwen Zhang","raw_affiliation_strings":["College of IoT, HoHai University, ChangZhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of IoT, HoHai University, ChangZhou, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110996551","display_name":"Qian Gong","orcid":null},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Gong","raw_affiliation_strings":["College of IoT, HoHai University, ChangZhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of IoT, HoHai University, ChangZhou, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051407732","display_name":"Yuan Cao","orcid":"https://orcid.org/0000-0001-5227-2241"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Cao","raw_affiliation_strings":["College of IoT, HoHai University, ChangZhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of IoT, HoHai University, ChangZhou, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102963937","display_name":"Cheng Yin","orcid":"https://orcid.org/0000-0003-4692-9790"},"institutions":[{"id":"https://openalex.org/I163340411","display_name":"Hohai University","ror":"https://ror.org/01wd4xt90","country_code":"CN","type":"education","lineage":["https://openalex.org/I163340411"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cheng Yin","raw_affiliation_strings":["College of IoT, HoHai University, ChangZhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of IoT, HoHai University, ChangZhou, China","institution_ids":["https://openalex.org/I163340411"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035510566","display_name":"Enyi Yao","orcid":"https://orcid.org/0000-0002-0019-2263"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Enyi Yao","raw_affiliation_strings":["School of Microelectronics, South China University of Technology Pazhou Lab, GuangZhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Microelectronics, South China University of Technology Pazhou Lab, GuangZhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100317716","display_name":"Yanhua Liu","orcid":"https://orcid.org/0000-0001-5524-4799"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yanhua Liu","raw_affiliation_strings":["Shanghai Institute of Space Power-Sources, ShangHai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Space Power-Sources, ShangHai, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011369587","display_name":"Yong-Qing Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210153393","display_name":"Geely (China)","ror":"https://ror.org/0446d5v35","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210153393"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongqing Pan","raw_affiliation_strings":["Body & Exterior Development Department, Geely Research Institute, Ningbo"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Body & Exterior Development Department, Geely Research Institute, Ningbo","institution_ids":["https://openalex.org/I4210153393"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"268","last_page":"269"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6446309089660645},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6163160800933838},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.5817052721977234},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5785927772521973},{"id":"https://openalex.org/keywords/production-line","display_name":"Production line","score":0.4560125470161438},{"id":"https://openalex.org/keywords/light-emitting-diode","display_name":"Light-emitting diode","score":0.42792731523513794},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4248999059200287},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.37684640288352966},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.2960771322250366},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.19772976636886597},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1364537477493286},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1020520031452179},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07330897450447083}],"concepts":[{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6446309089660645},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6163160800933838},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.5817052721977234},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5785927772521973},{"id":"https://openalex.org/C99862985","wikidata":"https://www.wikidata.org/wiki/Q10858068","display_name":"Production line","level":2,"score":0.4560125470161438},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.42792731523513794},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4248999059200287},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.37684640288352966},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2960771322250366},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.19772976636886597},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1364537477493286},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1020520031452179},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07330897450447083},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc53507.2021.9613949","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc53507.2021.9613949","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 18th International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W639708223","https://openalex.org/W2194775991","https://openalex.org/W2565639579","https://openalex.org/W2749684264","https://openalex.org/W2944303778","https://openalex.org/W2963037989"],"related_works":["https://openalex.org/W3042595473","https://openalex.org/W2082745643","https://openalex.org/W2392123845","https://openalex.org/W2123219307","https://openalex.org/W2058908375","https://openalex.org/W2049354487","https://openalex.org/W1998065921","https://openalex.org/W2071346341","https://openalex.org/W2104275039","https://openalex.org/W1964371904"],"abstract_inverted_index":{"LED":[0,40,66],"surface":[1,42,67,82],"defect":[2,43],"detection":[3,44],"is":[4,28,52,61],"a":[5,38],"vital":[6],"procedure":[7],"of":[8,15,57,72,81],"quality":[9],"control":[10],"in":[11],"the":[12,46,55,86,90,94,97],"mass":[13],"production":[14,95],"LEDs.":[16],"Traditional":[17],"methods":[18],"rely":[19],"on":[20,31,54,63,85,89,104],"artificial":[21],"vision,":[22],"which":[23,75],"requires":[24],"experienced":[25],"workers":[26],"and":[27,59],"extremely":[29],"low":[30],"efficiency.":[32],"In":[33],"this":[34],"paper,":[35],"we":[36],"develop":[37],"new":[39],"chip":[41],"by":[45],"modified":[47],"Faster":[48],"R-CNN.":[49],"The":[50,69],"model":[51,98],"pre-trained":[53],"dataset":[56,70,92],"COCO":[58],"then":[60],"fine-tuned":[62],"our":[64,105],"collected":[65,91],"dataset.":[68,106],"consists":[71],"1556":[73],"images":[74],"are":[76],"labeled":[77],"with":[78],"5":[79],"types":[80],"defects.":[83],"Based":[84],"experimental":[87],"results":[88],"from":[93],"line,":[96],"can":[99],"achieve":[100],"over":[101],"79%":[102],"mAP":[103]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}