{"id":"https://openalex.org/W2806550470","doi":"https://doi.org/10.1109/isocc.2017.8368898","title":"An 8Gb/s adaptive DFE with level calibration using training data pattern for mobile DRAM interface","display_name":"An 8Gb/s adaptive DFE with level calibration using training data pattern for mobile DRAM interface","publication_year":2017,"publication_date":"2017-11-01","ids":{"openalex":"https://openalex.org/W2806550470","doi":"https://doi.org/10.1109/isocc.2017.8368898","mag":"2806550470"},"language":"en","primary_location":{"id":"doi:10.1109/isocc.2017.8368898","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2017.8368898","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103083519","display_name":"Minchang Kim","orcid":"https://orcid.org/0009-0006-6812-0692"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Minchang Kim","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100740581","display_name":"Jihwan Park","orcid":"https://orcid.org/0000-0002-7661-5365"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jihwan Park","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045809760","display_name":"Joo\u2010Hyung Chae","orcid":"https://orcid.org/0000-0001-6354-5612"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joo-Hyung Chae","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043836783","display_name":"Hyeongjun Ko","orcid":"https://orcid.org/0000-0002-5025-6771"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeongjun Ko","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011378967","display_name":"Mino Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Mino Kim","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080332152","display_name":"Suhwan Kim","orcid":"https://orcid.org/0000-0001-9107-2963"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Suhwan Kim","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Seoul National University, Seoul, Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5103083519"],"corresponding_institution_ids":["https://openalex.org/I139264467"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.21376546,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"286","last_page":"287"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9872000217437744,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.6776373386383057},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6236255764961243},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5439115166664124},{"id":"https://openalex.org/keywords/training","display_name":"Training (meteorology)","score":0.5405356884002686},{"id":"https://openalex.org/keywords/interface","display_name":"Interface (matter)","score":0.46965232491493225},{"id":"https://openalex.org/keywords/adaptation","display_name":"Adaptation (eye)","score":0.4587760865688324},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.45798933506011963},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.45499569177627563},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.41460925340652466},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3873084783554077},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3196313679218292},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3178328573703766},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24891290068626404},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1701740026473999},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.10909885168075562},{"id":"https://openalex.org/keywords/geography","display_name":"Geography","score":0.08388376235961914}],"concepts":[{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.6776373386383057},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6236255764961243},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5439115166664124},{"id":"https://openalex.org/C2777211547","wikidata":"https://www.wikidata.org/wiki/Q17141490","display_name":"Training (meteorology)","level":2,"score":0.5405356884002686},{"id":"https://openalex.org/C113843644","wikidata":"https://www.wikidata.org/wiki/Q901882","display_name":"Interface (matter)","level":4,"score":0.46965232491493225},{"id":"https://openalex.org/C139807058","wikidata":"https://www.wikidata.org/wiki/Q352374","display_name":"Adaptation (eye)","level":2,"score":0.4587760865688324},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.45798933506011963},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.45499569177627563},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.41460925340652466},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3873084783554077},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3196313679218292},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3178328573703766},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24891290068626404},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1701740026473999},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.10909885168075562},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.08388376235961914},{"id":"https://openalex.org/C157915830","wikidata":"https://www.wikidata.org/wiki/Q2928001","display_name":"Bubble","level":2,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.0},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C129307140","wikidata":"https://www.wikidata.org/wiki/Q6795880","display_name":"Maximum bubble pressure method","level":3,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc.2017.8368898","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2017.8368898","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8899999856948853}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2096768943","https://openalex.org/W2119510461","https://openalex.org/W2156436603","https://openalex.org/W2164893802","https://openalex.org/W2169033055","https://openalex.org/W6684586533"],"related_works":["https://openalex.org/W3120961607","https://openalex.org/W4401568740","https://openalex.org/W2098207691","https://openalex.org/W3148568549","https://openalex.org/W1648516568","https://openalex.org/W361036515","https://openalex.org/W2269474412","https://openalex.org/W4386903460","https://openalex.org/W4211178602","https://openalex.org/W2433923775"],"abstract_inverted_index":{"An":[0],"8Gb/s":[1],"adaptive":[2],"decision":[3],"feedback":[4],"equalizer":[5],"(DFE)":[6],"using":[7],"training":[8,17,37,79],"sequence":[9],"is":[10,21,57,67],"designed":[11],"in":[12],"a":[13],"65nm":[14],"CMOS.":[15],"The":[16,29,54,69,83],"data":[18,26,47,76,84],"pattern":[19],"`10111111'":[20],"used":[22],"to":[23,93,98],"detect":[24],"distorted":[25,46],"level":[27,48],"periodically.":[28],"tap":[30,81],"coefficients":[31],"are":[32,89],"automatically":[33],"adjusted":[34],"during":[35],"the":[36,42,45,64,73,80],"mode":[38],"by":[39],"compensating":[40],"for":[41],"difference":[43],"between":[44],"and":[49,63,87,95],"ideal":[50],"high":[51],"DC":[52],"level.":[53],"power":[55],"consumption":[56],"10.4mW":[58],"at":[59],"1.05V":[60],"supply":[61],"voltage":[62],"adaptation":[65],"time":[66],"90ns.":[68],"simulation":[70],"results":[71],"show":[72],"improvement":[74],"of":[75],"eye":[77,85],"after":[78],"coefficients.":[82],"width":[86],"height":[88],"improved":[90],"from":[91,96],"0.36UI":[92],"0.84UI":[94],"40mV":[97],"90mV,":[99],"respectively.":[100]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}