{"id":"https://openalex.org/W2566639268","doi":"https://doi.org/10.1109/isocc.2016.7799762","title":"Software-based embedded core test using multi-polynomial for test data reduction","display_name":"Software-based embedded core test using multi-polynomial for test data reduction","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2566639268","doi":"https://doi.org/10.1109/isocc.2016.7799762","mag":"2566639268"},"language":"en","primary_location":{"id":"doi:10.1109/isocc.2016.7799762","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2016.7799762","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015238797","display_name":"So Yeon Kang","orcid":"https://orcid.org/0000-0002-3209-9418"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Soyeon Kang","raw_affiliation_strings":["Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108630780","display_name":"Inhyuk Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Inhyuk Choi","raw_affiliation_strings":["Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010275772","display_name":"Hyeonchan Lim","orcid":"https://orcid.org/0009-0000-8331-7684"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeonchan Lim","raw_affiliation_strings":["Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036881913","display_name":"Sungyoul Seo","orcid":"https://orcid.org/0000-0001-9469-758X"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungyoul Seo","raw_affiliation_strings":["Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Department of Electrical & Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5015238797"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16043554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"39","last_page":"40"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.7166367173194885},{"id":"https://openalex.org/keywords/polynomial","display_name":"Polynomial","score":0.6312369108200073},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5849724411964417},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.5446892976760864},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.4962175488471985},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.47752276062965393},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.46677345037460327},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.46650829911231995},{"id":"https://openalex.org/keywords/property","display_name":"Property (philosophy)","score":0.4506126940250397},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4265938103199005},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.4203421175479889},{"id":"https://openalex.org/keywords/core","display_name":"Core (optical fiber)","score":0.41423550248146057},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2667296528816223},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.22576528787612915},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.09159213304519653},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09083670377731323},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.06265416741371155}],"concepts":[{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.7166367173194885},{"id":"https://openalex.org/C90119067","wikidata":"https://www.wikidata.org/wiki/Q43260","display_name":"Polynomial","level":2,"score":0.6312369108200073},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5849724411964417},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.5446892976760864},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.4962175488471985},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.47752276062965393},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.46677345037460327},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.46650829911231995},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.4506126940250397},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4265938103199005},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.4203421175479889},{"id":"https://openalex.org/C2164484","wikidata":"https://www.wikidata.org/wiki/Q5170150","display_name":"Core (optical fiber)","level":2,"score":0.41423550248146057},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2667296528816223},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.22576528787612915},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.09159213304519653},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09083670377731323},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.06265416741371155},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc.2016.7799762","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2016.7799762","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1585450308","https://openalex.org/W2018032749","https://openalex.org/W2120294448","https://openalex.org/W2160997819"],"related_works":["https://openalex.org/W2989159162","https://openalex.org/W2153201966","https://openalex.org/W2122754719","https://openalex.org/W2139513292","https://openalex.org/W1982569681","https://openalex.org/W1874778078","https://openalex.org/W776711554","https://openalex.org/W2068588503","https://openalex.org/W2536854812","https://openalex.org/W2005858638"],"abstract_inverted_index":{"Software-based":[0],"self-test":[1,5],"(SBST)":[2],"is":[3,24],"a":[4,35,52,85],"where":[6],"processors":[7],"and":[8,55,59,66],"intellectual":[9],"property":[10],"(IP)":[11],"cores":[12],"test":[13,46,82],"itself":[14],"using":[15,39],"an":[16,20],"embedded":[17],"memory.":[18],"However,":[19],"environment-limited":[21],"memory":[22],"size":[23,79],"one":[25],"of":[26,51,80,87],"the":[27,44,48,78,81,88],"biggest":[28],"challenges.":[29],"In":[30],"this":[31,74],"paper,":[32],"we":[33],"present":[34],"new":[36],"SBST":[37,75],"solution":[38],"multiple":[40],"polynomials.":[41],"For":[42],"reducing":[43],"required":[45],"data,":[47],"polynomials":[49,58],"consist":[50],"primitive":[53],"polynomial":[54,61],"(BM)-algorithm":[56],"based":[57],"each":[60],"generates":[62],"pseudo":[63],"random":[64],"patterns":[65,68],"deterministic":[67],"respectively.":[69],"Experimental":[70],"results":[71],"show":[72],"that":[73],"method":[76],"reduces":[77],"program":[83],"without":[84],"reduction":[86],"fault":[89],"coverage.":[90]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}