{"id":"https://openalex.org/W2566384148","doi":"https://doi.org/10.1109/isocc.2016.7799751","title":"Discussion of cost-effective redundancy architectures","display_name":"Discussion of cost-effective redundancy architectures","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2566384148","doi":"https://doi.org/10.1109/isocc.2016.7799751","mag":"2566384148"},"language":"en","primary_location":{"id":"doi:10.1109/isocc.2016.7799751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2016.7799751","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076182107","display_name":"Keewon Cho","orcid":"https://orcid.org/0000-0003-0641-774X"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Keewon Cho","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114860286","display_name":"Joo-Young Kim","orcid":"https://orcid.org/0000-0001-5396-8961"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jooyoung Kim","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100782289","display_name":"Hayoung Lee","orcid":"https://orcid.org/0000-0002-6868-0829"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hayoung Lee","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068528309","display_name":"Sungho Kang","orcid":"https://orcid.org/0000-0002-7093-2095"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungho Kang","raw_affiliation_strings":["Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea"],"affiliations":[{"raw_affiliation_string":"Dept. of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5076182107"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17723989,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"97","last_page":"98"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.9284433126449585},{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.8488945960998535},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7012357711791992},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5178378224372864},{"id":"https://openalex.org/keywords/maintenance-engineering","display_name":"Maintenance engineering","score":0.41794437170028687},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.370096892118454},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21210959553718567},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.07779911160469055}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.9284433126449585},{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.8488945960998535},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7012357711791992},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5178378224372864},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.41794437170028687},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.370096892118454},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21210959553718567},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.07779911160469055},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc.2016.7799751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2016.7799751","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.47999998927116394,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2066134189","https://openalex.org/W2069676814","https://openalex.org/W2152425525"],"related_works":["https://openalex.org/W2344117897","https://openalex.org/W2356702869","https://openalex.org/W2067279514","https://openalex.org/W2025178194","https://openalex.org/W1971749138","https://openalex.org/W3010895039","https://openalex.org/W2168348447","https://openalex.org/W2132635813","https://openalex.org/W2008730376","https://openalex.org/W2122594448"],"abstract_inverted_index":{"To":[0],"get":[1],"a":[2,73,86],"reasonable":[3],"yield,":[4],"memories":[5],"incorporate":[6],"redundancies":[7],"to":[8,49,64],"substitute":[9],"for":[10,30],"faulty":[11,81],"cells.":[12],"As":[13],"the":[14,51,59,66],"performance":[15],"of":[16,39,53,58,68],"repair":[17,32,60],"algorithm":[18],"reaches":[19],"some":[20],"saturation":[21],"point,":[22],"recent":[23],"studies":[24],"focus":[25],"on":[26],"various":[27],"redundancy":[28,54,75,92],"architectures":[29,55,76],"higher":[31],"rate.":[33],"In":[34,62],"this":[35],"paper,":[36],"three":[37],"kinds":[38],"spares,":[40,46],"i.e.,":[41],"local,":[42],"common,":[43],"and":[44,89],"global":[45],"are":[47,77],"discussed":[48],"analyze":[50],"efficiency":[52],"in":[56],"respect":[57],"cost.":[61],"order":[63],"estimate":[65],"impact":[67],"each":[69],"spare,":[70],"more":[71],"than":[72],"hundred":[74],"simulated":[78],"with":[79],"different":[80],"patterns.":[82],"This":[83],"paper":[84],"performs":[85],"data":[87],"analysis":[88],"suggests":[90],"cost-effective":[91],"architectures.":[93]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}