{"id":"https://openalex.org/W1991863960","doi":"https://doi.org/10.1109/isocc.2012.6406898","title":"Proposal of a new ultra low leakage 10T sub threshold SRAM bitcell","display_name":"Proposal of a new ultra low leakage 10T sub threshold SRAM bitcell","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W1991863960","doi":"https://doi.org/10.1109/isocc.2012.6406898","mag":"1991863960"},"language":"en","primary_location":{"id":"doi:10.1109/isocc.2012.6406898","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2012.6406898","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009134887","display_name":"Anis F\u00e9ki","orcid":"https://orcid.org/0000-0002-9817-9445"},"institutions":[{"id":"https://openalex.org/I4210145913","display_name":"Laboratoire Amp\u00e8re","ror":"https://ror.org/04xbczw40","country_code":"FR","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I4210095849","https://openalex.org/I4210145913","https://openalex.org/I48430043"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Anis Feki","raw_affiliation_strings":["STMicroelectronics, Crolles, FR","Amp\u00e8re, D\u00e9partement Energie Electrique","ESC de Sfax"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, FR","institution_ids":[]},{"raw_affiliation_string":"Amp\u00e8re, D\u00e9partement Energie Electrique","institution_ids":["https://openalex.org/I4210145913"]},{"raw_affiliation_string":"ESC de Sfax","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011435361","display_name":"Bruno Allard","orcid":"https://orcid.org/0000-0001-8547-5483"},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Universit\u00e9 Claude Bernard Lyon 1","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I4210145913","display_name":"Laboratoire Amp\u00e8re","ror":"https://ror.org/04xbczw40","country_code":"FR","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I4210095849","https://openalex.org/I4210145913","https://openalex.org/I48430043"]},{"id":"https://openalex.org/I48430043","display_name":"Institut National des Sciences Appliqu\u00e9es de Lyon","ror":"https://ror.org/050jn9y42","country_code":"FR","type":"education","lineage":["https://openalex.org/I203339264","https://openalex.org/I48430043"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Bruno Allard","raw_affiliation_strings":["INSA-Lyon, University of Lyon, Villeurbanne, France","Amp\u00e8re, D\u00e9partement Energie Electrique"],"affiliations":[{"raw_affiliation_string":"INSA-Lyon, University of Lyon, Villeurbanne, France","institution_ids":["https://openalex.org/I48430043","https://openalex.org/I100532134"]},{"raw_affiliation_string":"Amp\u00e8re, D\u00e9partement Energie Electrique","institution_ids":["https://openalex.org/I4210145913"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048806425","display_name":"David Turgis","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]},{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]}],"countries":["CZ","FR"],"is_corresponding":false,"raw_author_name":"David Turgis","raw_affiliation_strings":["STMicroelectronics, Crolles, France","STMicroelectronics"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics","institution_ids":["https://openalex.org/I4210124177"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040882026","display_name":"Jean-Christophe Lafont","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]},{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["CZ","FR"],"is_corresponding":false,"raw_author_name":"Jean-Christophe Lafont","raw_affiliation_strings":["STMicroelectronics, Crolles, France","STMicroelectronics"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, France","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"STMicroelectronics","institution_ids":["https://openalex.org/I4210124177"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024938018","display_name":"L. Ciampolini","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Lorenzo Ciampolini","raw_affiliation_strings":["STMicroelectronics, Crolles, FR","STMicroelectronics"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Crolles, FR","institution_ids":[]},{"raw_affiliation_string":"STMicroelectronics","institution_ids":["https://openalex.org/I4210124177"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5009134887"],"corresponding_institution_ids":["https://openalex.org/I4210145913"],"apc_list":null,"apc_paid":null,"fwci":0.9967,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.77682393,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"46","issue":null,"first_page":"470","last_page":"474"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9452019929885864},{"id":"https://openalex.org/keywords/interleaving","display_name":"Interleaving","score":0.7215436100959778},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5923856496810913},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5742446184158325},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.546440839767456},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.538937509059906},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5319913625717163},{"id":"https://openalex.org/keywords/low-power-electronics","display_name":"Low-power electronics","score":0.49775269627571106},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.48850762844085693},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.47064799070358276},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.42693305015563965},{"id":"https://openalex.org/keywords/low-energy","display_name":"Low energy","score":0.41591233015060425},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41490626335144043},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4144335985183716},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.41374361515045166},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3458594083786011},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3218310475349426},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23983219265937805},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.21518367528915405},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09776413440704346},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06916186213493347}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9452019929885864},{"id":"https://openalex.org/C28034677","wikidata":"https://www.wikidata.org/wiki/Q17092530","display_name":"Interleaving","level":2,"score":0.7215436100959778},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5923856496810913},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5742446184158325},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.546440839767456},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.538937509059906},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5319913625717163},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.49775269627571106},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.48850762844085693},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.47064799070358276},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.42693305015563965},{"id":"https://openalex.org/C2989164559","wikidata":"https://www.wikidata.org/wiki/Q15637420","display_name":"Low energy","level":2,"score":0.41591233015060425},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41490626335144043},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4144335985183716},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.41374361515045166},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3458594083786011},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3218310475349426},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23983219265937805},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.21518367528915405},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09776413440704346},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06916186213493347},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/isocc.2012.6406898","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2012.6406898","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 International SoC Design Conference (ISOCC)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01865458v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01865458","pdf_url":null,"source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISOCC, Nov 2012, Jeju Island, South Korea. ⟨10.1109/ISOCC.2012.6406898⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.9100000262260437}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1486261190","https://openalex.org/W2002612140","https://openalex.org/W2009625811","https://openalex.org/W2040580490","https://openalex.org/W2053693506","https://openalex.org/W2060385046","https://openalex.org/W2079826846","https://openalex.org/W2099278122","https://openalex.org/W2106339466","https://openalex.org/W2108519747","https://openalex.org/W2129756800","https://openalex.org/W2154509298","https://openalex.org/W2543354949","https://openalex.org/W2552366845","https://openalex.org/W6676328995"],"related_works":["https://openalex.org/W2124071587","https://openalex.org/W2045954744","https://openalex.org/W2014592537","https://openalex.org/W2063801514","https://openalex.org/W2092242585","https://openalex.org/W3001391796","https://openalex.org/W2081334908","https://openalex.org/W2293781082","https://openalex.org/W2155579514","https://openalex.org/W1998680654"],"abstract_inverted_index":{"The":[0],"tendency":[1],"for":[2,12,75],"low":[3,51],"energy":[4],"consumption":[5,81],"in":[6,9,15,38],"systems-on-chip":[7],"results":[8],"a":[10,24],"need":[11],"memories":[13],"operating":[14],"the":[16],"near-":[17],"and":[18,49,62,78],"sub-threshold":[19],"regions.":[20],"This":[21],"paper":[22],"gives":[23],"comparative":[25],"study":[26],"of":[27,57],"Static":[28],"Random":[29],"Access":[30],"Memory":[31],"(SRAM)":[32],"bitcells":[33],"working":[34],"under":[35,59],"Ultra-Low":[36],"Voltage":[37],"32nm":[39],"CMOS.":[40],"A":[41],"new":[42],"10T":[43],"SRAM":[44],"bitcell":[45],"is":[46,55,67],"then":[47],"proposed":[48],"features":[50],"leakage":[52],"current.":[53],"It":[54],"capable":[56],"operation":[58],"ULV":[60],"(\u223c300mV)":[61],"allows":[63],"bit-interleaving":[64],"technique":[65],"that":[66],"critical":[68],"to":[69,83],"cope":[70],"with":[71],"multiple":[72],"bit":[73],"soft-errors":[74],"reducing":[76],"dynamic":[77],"static":[79],"power":[80],"compared":[82],"state-of-the-art":[84],"bitcells.":[85]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-03-11T14:59:36.786465","created_date":"2025-10-10T00:00:00"}