{"id":"https://openalex.org/W2046775396","doi":"https://doi.org/10.1109/isocc.2011.6138615","title":"Enhancing circuits and systems supply noise sensitivity characterization using on-package droop inducers","display_name":"Enhancing circuits and systems supply noise sensitivity characterization using on-package droop inducers","publication_year":2011,"publication_date":"2011-11-01","ids":{"openalex":"https://openalex.org/W2046775396","doi":"https://doi.org/10.1109/isocc.2011.6138615","mag":"2046775396"},"language":"en","primary_location":{"id":"doi:10.1109/isocc.2011.6138615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2011.6138615","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International SoC Design Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046524190","display_name":"Omer Vikinski","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Omer Vikinski","raw_affiliation_strings":["Microprocessors and Chipset Division, Intel Corporation, P.O Box 1659, Haifa 31015, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microprocessors and Chipset Division, Intel Corporation, P.O Box 1659, Haifa 31015, Israel","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027846669","display_name":"Ram Ben-Ezra","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ram Ben-Ezra","raw_affiliation_strings":["Microprocessors and Chipset Division, Intel Corporation, P.O Box 1659, Haifa 31015, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microprocessors and Chipset Division, Intel Corporation, P.O Box 1659, Haifa 31015, Israel","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081298173","display_name":"Jimmy Huat Since Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jimmy Huat Since Huang","raw_affiliation_strings":["Microprocessors and Chipset Division, Intel Corporation, P.O Box 1659, Haifa 31015, Israel"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Microprocessors and Chipset Division, Intel Corporation, P.O Box 1659, Haifa 31015, Israel","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":2.4326,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.89446803,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"397","last_page":"400"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.9085124731063843},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.8667289018630981},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6415026187896729},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5904210805892944},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5887332558631897},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5728604793548584},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.534397304058075},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5159397721290588},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5113915801048279},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39252352714538574},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.33070608973503113},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.2886848449707031},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.253374308347702},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21116620302200317}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.9085124731063843},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.8667289018630981},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6415026187896729},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5904210805892944},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5887332558631897},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5728604793548584},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.534397304058075},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5159397721290588},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5113915801048279},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39252352714538574},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33070608973503113},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.2886848449707031},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.253374308347702},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21116620302200317},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isocc.2011.6138615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isocc.2011.6138615","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 International SoC Design Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7400000095367432,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1505026112","https://openalex.org/W1554637898","https://openalex.org/W1966171437","https://openalex.org/W2060798061","https://openalex.org/W2133155097","https://openalex.org/W2139642492","https://openalex.org/W2169174289","https://openalex.org/W2788706082"],"related_works":["https://openalex.org/W2523432015","https://openalex.org/W2765340260","https://openalex.org/W2153130273","https://openalex.org/W3023710910","https://openalex.org/W2076823813","https://openalex.org/W3008686614","https://openalex.org/W2143080380","https://openalex.org/W1589163333","https://openalex.org/W2389800961","https://openalex.org/W1995389502"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"design":[3],"and":[4,30,71,77],"implementation":[5],"of":[6,14,26,51,67],"noise":[7,69],"inducer":[8,44],"devices":[9,45],"mounted":[10],"on":[11],"the":[12,27,64,68,72],"package":[13],"a":[15,52],"full":[16],"featured":[17],"microprocessor.":[18],"Such":[19],"assembly":[20],"enables":[21],"vast":[22],"sensitivity":[23],"characterization":[24],"capabilities":[25],"chip":[28,74],"circuits":[29],"systems":[31],"to":[32],"supply":[33,49],"noises.":[34],"Prototype":[35],"vehicle":[36],"encompassing":[37],"five":[38],"separate":[39,48],"45nm":[40],"CMOS":[41,54],"process":[42,55],"droop":[43],"stimulating":[46],"four":[47],"rails":[50],"32nm":[53],"microprocessor":[56,73],"is":[57],"reported.":[58],"Multiple":[59],"empirical":[60],"results":[61],"arising":[62],"from":[63],"combined":[65],"operation":[66],"inducers":[70],"were":[75],"obtained":[76],"analyzed.":[78]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}