{"id":"https://openalex.org/W2744537801","doi":"https://doi.org/10.1109/islped.2017.8009191","title":"Hotspot monitoring and Temperature Estimation with miniature on-chip temperature sensors","display_name":"Hotspot monitoring and Temperature Estimation with miniature on-chip temperature sensors","publication_year":2017,"publication_date":"2017-07-01","ids":{"openalex":"https://openalex.org/W2744537801","doi":"https://doi.org/10.1109/islped.2017.8009191","mag":"2744537801"},"language":"en","primary_location":{"id":"doi:10.1109/islped.2017.8009191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/islped.2017.8009191","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055001543","display_name":"Pavan Kumar Chundi","orcid":"https://orcid.org/0000-0002-8869-1736"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Pavan Kumar Chundi","raw_affiliation_strings":["Columbia University, New York, NY"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073248079","display_name":"Yini Zhou","orcid":null},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yini Zhou","raw_affiliation_strings":["Columbia University, New York, NY"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035552583","display_name":"Martha Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Martha Kim","raw_affiliation_strings":["Columbia University, New York, NY"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034278781","display_name":"Eren Kursun","orcid":null},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Eren Kursun","raw_affiliation_strings":["Columbia University, New York, NY"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY","institution_ids":["https://openalex.org/I78577930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011887658","display_name":"Mingoo Seok","orcid":"https://orcid.org/0000-0002-9722-0979"},"institutions":[{"id":"https://openalex.org/I78577930","display_name":"Columbia University","ror":"https://ror.org/00hj8s172","country_code":"US","type":"education","lineage":["https://openalex.org/I78577930"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mingoo Seok","raw_affiliation_strings":["Columbia University, New York, NY"],"affiliations":[{"raw_affiliation_string":"Columbia University, New York, NY","institution_ids":["https://openalex.org/I78577930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5055001543"],"corresponding_institution_ids":["https://openalex.org/I78577930"],"apc_list":null,"apc_paid":null,"fwci":1.3519,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.82307418,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hotspot","display_name":"Hotspot (geology)","score":0.8601719737052917},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.794272780418396},{"id":"https://openalex.org/keywords/footprint","display_name":"Footprint","score":0.6446385383605957},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6156173944473267},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5620666146278381},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5501226186752319},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5199540853500366},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.49438929557800293},{"id":"https://openalex.org/keywords/limiting","display_name":"Limiting","score":0.47743162512779236},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4426729679107666},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.34721022844314575},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2174089252948761},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20891249179840088},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09129264950752258}],"concepts":[{"id":"https://openalex.org/C146481406","wikidata":"https://www.wikidata.org/wiki/Q105131","display_name":"Hotspot (geology)","level":2,"score":0.8601719737052917},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.794272780418396},{"id":"https://openalex.org/C132943942","wikidata":"https://www.wikidata.org/wiki/Q2562511","display_name":"Footprint","level":2,"score":0.6446385383605957},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6156173944473267},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5620666146278381},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5501226186752319},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5199540853500366},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.49438929557800293},{"id":"https://openalex.org/C188198153","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiting","level":2,"score":0.47743162512779236},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4426729679107666},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.34721022844314575},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2174089252948761},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20891249179840088},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09129264950752258},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C8058405","wikidata":"https://www.wikidata.org/wiki/Q46255","display_name":"Geophysics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/islped.2017.8009191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/islped.2017.8009191","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1970255480","https://openalex.org/W1988211538","https://openalex.org/W1998246226","https://openalex.org/W2034062945","https://openalex.org/W2036853599","https://openalex.org/W2043174713","https://openalex.org/W2067183916","https://openalex.org/W2076612908","https://openalex.org/W2098228187","https://openalex.org/W2100404320","https://openalex.org/W2102362948","https://openalex.org/W2110939389","https://openalex.org/W2127016647","https://openalex.org/W2139019659","https://openalex.org/W2154857344","https://openalex.org/W2159269870","https://openalex.org/W2169875292","https://openalex.org/W2170382128","https://openalex.org/W2501794502","https://openalex.org/W3141144805","https://openalex.org/W4238549726","https://openalex.org/W6642839732","https://openalex.org/W6669713767"],"related_works":["https://openalex.org/W2379637199","https://openalex.org/W2405057786","https://openalex.org/W2501832907","https://openalex.org/W2063054109","https://openalex.org/W2079602762","https://openalex.org/W2580355466","https://openalex.org/W2765519165","https://openalex.org/W1888682135","https://openalex.org/W1994086845","https://openalex.org/W51246388"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"analysis":[3,36,60],"and":[4,11,24,44,56,68,89,108],"evaluation":[5],"of":[6,9,14,21,31,53,92],"the":[7,19,41,45],"impact":[8],"size":[10],"voltage":[12,70,110],"scalability":[13,71,111],"on-chip":[15],"temperature":[16,25,91],"sensor":[17,64],"on":[18,39,75],"accuracy":[20,85],"hotspot":[22,77],"monitoring":[23],"estimation":[26],"in":[27,51,86],"dynamic":[28],"thermal":[29],"management":[30],"high":[32],"performance":[33],"microprocessors.":[34],"The":[35],"is":[37],"based":[38],"both":[40],"layout":[42],"level":[43,47],"system":[46],"across":[48],"state-of-the-art":[49],"sensors":[50,100],"terms":[52],"accuracy,":[54,105],"voltage-scalability,":[55],"silicon":[57],"footprint.":[58],"Our":[59],"shows":[61],"that":[62,101],"a":[63],"having":[65],"compact":[66],"footprint":[67,107],"good":[69],"can":[72],"be":[73],"placed":[74],"exact":[76],"locations,":[78],"typically":[79],"among":[80],"digital":[81],"cells,":[82],"significantly":[83],"improving":[84],"tracking":[87],"hotspots":[88],"estimating":[90],"microarchitecture":[93],"blocks,":[94],"as":[95],"compared":[96],"to":[97],"two":[98],"other":[99],"have":[102],"higher":[103],"sensor-circuit":[104],"large":[106],"little":[109],"limiting":[112],"flexible":[113],"placement.":[114]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}