{"id":"https://openalex.org/W1630879657","doi":"https://doi.org/10.1109/islped.2015.7273541","title":"Reference-circuit analysis for high-bandwidth spin transfer torque random access memory","display_name":"Reference-circuit analysis for high-bandwidth spin transfer torque random access memory","publication_year":2015,"publication_date":"2015-07-01","ids":{"openalex":"https://openalex.org/W1630879657","doi":"https://doi.org/10.1109/islped.2015.7273541","mag":"1630879657"},"language":"en","primary_location":{"id":"doi:10.1109/islped.2015.7273541","is_oa":false,"landing_page_url":"https://doi.org/10.1109/islped.2015.7273541","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113847642","display_name":"Byungkyu Song","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Byungkyu Song","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","[Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea.]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea.]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089907396","display_name":"Taehui Na","orcid":"https://orcid.org/0000-0001-8823-0625"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taehui Na","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","[Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea.]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea.]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037010076","display_name":"Seong\u2010Ook Jung","orcid":"https://orcid.org/0000-0003-0757-2581"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seong-Ook Jung","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","[Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea.]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]},{"raw_affiliation_string":"[Department of Electrical and Electronic Engineering, Yonsei University, Seoul 120-749, South Korea.]","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064984422","display_name":"Jung Pill Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Jung Pill Kim","raw_affiliation_strings":["Advanced Technology Qualcomm Incorporated, San Diego, CA, USA","Advanced Technology, Qualcomm Incorporated, San Diego, CA 92121, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Technology Qualcomm Incorporated, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"Advanced Technology, Qualcomm Incorporated, San Diego, CA 92121, USA","institution_ids":["https://openalex.org/I19268510"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103061707","display_name":"Seung H. Kang","orcid":"https://orcid.org/0000-0003-4270-9918"},"institutions":[{"id":"https://openalex.org/I4210087596","display_name":"Qualcomm (United States)","ror":"https://ror.org/002zrf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210087596"]},{"id":"https://openalex.org/I19268510","display_name":"Qualcomm (United Kingdom)","ror":"https://ror.org/04d3djg48","country_code":"GB","type":"company","lineage":["https://openalex.org/I19268510","https://openalex.org/I4210087596"]}],"countries":["GB","US"],"is_corresponding":false,"raw_author_name":"Seung H. Kang","raw_affiliation_strings":["Advanced Technology Qualcomm Incorporated, San Diego, CA, USA","Advanced Technology, Qualcomm Incorporated, San Diego, CA 92121, USA"],"affiliations":[{"raw_affiliation_string":"Advanced Technology Qualcomm Incorporated, San Diego, CA, USA","institution_ids":["https://openalex.org/I4210087596"]},{"raw_affiliation_string":"Advanced Technology, Qualcomm Incorporated, San Diego, CA 92121, USA","institution_ids":["https://openalex.org/I19268510"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5113847642"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.3946,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.65532565,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"365","last_page":"370"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.7363767027854919},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.592272162437439},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5750607252120972},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5268127918243408},{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.5224370360374451},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4554064869880676},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33335041999816895},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.31425607204437256},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2551180124282837},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1782960295677185},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14324387907981873},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1084887683391571}],"concepts":[{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.7363767027854919},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.592272162437439},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5750607252120972},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5268127918243408},{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.5224370360374451},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4554064869880676},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33335041999816895},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.31425607204437256},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2551180124282837},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1782960295677185},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14324387907981873},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1084887683391571},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C49324399","wikidata":"https://www.wikidata.org/wiki/Q466758","display_name":"Voltage divider","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/islped.2015.7273541","is_oa":false,"landing_page_url":"https://doi.org/10.1109/islped.2015.7273541","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8999999761581421,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1984842310","https://openalex.org/W1997147166","https://openalex.org/W2008904077","https://openalex.org/W2056511998","https://openalex.org/W2065991180","https://openalex.org/W2069795715","https://openalex.org/W2120699192","https://openalex.org/W2130436742","https://openalex.org/W2156728623","https://openalex.org/W2159904000","https://openalex.org/W6683132901","https://openalex.org/W6684149499"],"related_works":["https://openalex.org/W2523432015","https://openalex.org/W2765340260","https://openalex.org/W2153130273","https://openalex.org/W2076823813","https://openalex.org/W1589163333","https://openalex.org/W2143080380","https://openalex.org/W3008686614","https://openalex.org/W2060924671","https://openalex.org/W3180072344","https://openalex.org/W4241196849"],"abstract_inverted_index":{"A":[0],"global":[1,34,59,72],"reference-circuit":[2],"(RC),":[3],"which":[4],"means":[5],"one":[6],"RC":[7,35,60,69,104],"is":[8,15],"shared":[9],"with":[10],"many":[11],"sensing":[12,82],"circuits":[13],"(SC),":[14],"being":[16],"considered":[17],"for":[18,36,105],"high-bandwidth":[19,37,106],"STT-RAMs":[20,38],"because":[21],"of":[22,56,80,89,94,102],"the":[23,33,49,54,58,67,90,99],"low":[24,116],"power":[25,85,117],"consumption":[26],"and":[27,43,70,76,84,92,119],"small":[28,109],"area":[29],"characteristic.":[30],"However,":[31],"using":[32,57],"causes":[39],"a":[40],"droop":[41],"effect":[42],"coupling":[44],"noise":[45],"effect,":[46],"leading":[47],"to":[48],"significant":[50],"performance":[51,113],"degradation.":[52],"Thus,":[53],"validity":[55],"should":[61],"be":[62],"identified.":[63],"In":[64],"this":[65],"paper,":[66],"local":[68],"various":[71,95],"RCs":[73],"are":[74],"introduced,":[75],"compared":[77],"in":[78],"aspects":[79],"area,":[81,110],"time,":[83],"consumption.":[86],"By":[87],"classification":[88],"merits":[91],"demerits":[93],"RCs,":[96],"we":[97],"present":[98],"following":[100],"requirements":[101],"proper":[103],"STT-RAMs:":[107],"1)":[108],"2)":[111],"no":[112],"degradation,":[114],"3)":[115],"consumption,":[118],"4)":[120],"process":[121],"variation":[122],"tolerant":[123],"reference":[124],"signal":[125],"generation.":[126]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2016,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}