{"id":"https://openalex.org/W4287882993","doi":"https://doi.org/10.1109/isie51582.2022.9831533","title":"A novel SEU injection setup for Automotive SoC","display_name":"A novel SEU injection setup for Automotive SoC","publication_year":2022,"publication_date":"2022-06-01","ids":{"openalex":"https://openalex.org/W4287882993","doi":"https://doi.org/10.1109/isie51582.2022.9831533"},"language":"en","primary_location":{"id":"doi:10.1109/isie51582.2022.9831533","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isie51582.2022.9831533","pdf_url":null,"source":{"id":"https://openalex.org/S4363605663","display_name":"2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5050269605","display_name":"G. Iaria","orcid":"https://orcid.org/0000-0002-4018-3820"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"G. Iaria","raw_affiliation_strings":["Politecnico di Torino,Italy","Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031839947","display_name":"Tommaso Foscale","orcid":"https://orcid.org/0009-0000-0735-087X"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"T. Foscale","raw_affiliation_strings":["Politecnico di Torino,Italy","Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049430681","display_name":"Paolo Bernardi","orcid":"https://orcid.org/0000-0002-0985-9327"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"P. Bernardi","raw_affiliation_strings":["Politecnico di Torino,Italy","Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015057412","display_name":"L. Presicce","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Presicce","raw_affiliation_strings":["Politecnico di Torino,Italy","Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Politecnico di Torino,Italy","Politecnico di Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Politecnico di Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024226992","display_name":"D. Appello","orcid":"https://orcid.org/0000-0001-8178-2785"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"D. Appello","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043908290","display_name":"Vincenzo Tancorre","orcid":"https://orcid.org/0000-0001-7959-0784"},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"V. Tancorre","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5091628822","display_name":"R. Ugioli","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R. Ugioli","raw_affiliation_strings":["STMicroelectronics,Italy","STMicroelectronics, Italy"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Italy","institution_ids":["https://openalex.org/I4210154781"]},{"raw_affiliation_string":"STMicroelectronics, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5050269605"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.6431,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.56723964,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"623","last_page":"626"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.7684600949287415},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.7067553997039795},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.691336989402771},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.6766140460968018},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.6532580256462097},{"id":"https://openalex.org/keywords/system-on-a-chip","display_name":"System on a chip","score":0.5442214012145996},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.47835108637809753},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.4187677204608917},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4160863161087036},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.3112003207206726},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24415069818496704},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.20508483052253723}],"concepts":[{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7684600949287415},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.7067553997039795},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.691336989402771},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.6766140460968018},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.6532580256462097},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.5442214012145996},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.47835108637809753},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.4187677204608917},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4160863161087036},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.3112003207206726},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24415069818496704},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.20508483052253723},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isie51582.2022.9831533","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isie51582.2022.9831533","pdf_url":null,"source":{"id":"https://openalex.org/S4363605663","display_name":"2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2099839042","https://openalex.org/W2114503349","https://openalex.org/W2123934961","https://openalex.org/W2150025103","https://openalex.org/W2508980427","https://openalex.org/W2761444476","https://openalex.org/W2937225767","https://openalex.org/W3208363838"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2064238555","https://openalex.org/W2150046587","https://openalex.org/W2142405811","https://openalex.org/W2114980936","https://openalex.org/W2164493372","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2164349885"],"abstract_inverted_index":{"The":[0],"world":[1],"of":[2,9,16,41,63,78],"embedded":[3,19],"electronic":[4],"systems":[5,20],"is":[6,21,32,87],"increasingly":[7],"part":[8],"everyone's":[10],"daily":[11],"life.":[12],"Therefore,":[13],"the":[14,36,61,64,68,72,76],"production":[15],"chip":[17],"and":[18,25,38,57,67],"becoming":[22],"more":[23],"complex":[24],"massive":[26],"in":[27,94],"recent":[28],"years.":[29],"This":[30,45],"aspect":[31],"also":[33],"responsible":[34],"for":[35,75],"continuous":[37],"rapid":[39],"growth":[40],"abnormal":[42],"system":[43],"behaviors.":[44],"paper":[46],"aims":[47],"to":[48,70,89],"propose":[49],"an":[50],"automated":[51],"setup":[52],"that":[53],"connects":[54],"Functional":[55],"Testing":[56],"Scan":[58],"Technique,":[59],"exploiting":[60],"versatility":[62],"functional":[65],"environment":[66],"Design-for-Testability":[69],"reduce":[71],"time":[73],"needed":[74],"evaluation":[77],"device":[79],"SEUs":[80],"effects.":[81],"Preliminary":[82],"experimental":[83],"results":[84],"show":[85],"it":[86],"possible":[88],"inject":[90],"a":[91],"single":[92],"SEU":[93],"milliseconds":[95],"while":[96],"keeping":[97],"high":[98],"accuracy.":[99]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}