{"id":"https://openalex.org/W4386323818","doi":"https://doi.org/10.1109/isie51358.2023.10228145","title":"Fault-Tolerant Active Neutral-Point-Clamped Multilevel Inverter Maintaining Output Voltage at Failure","display_name":"Fault-Tolerant Active Neutral-Point-Clamped Multilevel Inverter Maintaining Output Voltage at Failure","publication_year":2023,"publication_date":"2023-06-19","ids":{"openalex":"https://openalex.org/W4386323818","doi":"https://doi.org/10.1109/isie51358.2023.10228145"},"language":"en","primary_location":{"id":"doi:10.1109/isie51358.2023.10228145","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isie51358.2023.10228145","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092819227","display_name":"Jun Hitokuwata","orcid":null},"institutions":[{"id":"https://openalex.org/I161296585","display_name":"Tokyo University of Science","ror":"https://ror.org/05sj3n476","country_code":"JP","type":"education","lineage":["https://openalex.org/I161296585"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Jun Hitokuwata","raw_affiliation_strings":["Tokyo University of Science,Department of Electrical Engineering,Tokyo,Japan","Department of Electrical Engineering, Tokyo University of Science, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Tokyo University of Science,Department of Electrical Engineering,Tokyo,Japan","institution_ids":["https://openalex.org/I161296585"]},{"raw_affiliation_string":"Department of Electrical Engineering, Tokyo University of Science, Tokyo, Japan","institution_ids":["https://openalex.org/I161296585"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103091105","display_name":"Hirotaka Koizumi","orcid":"https://orcid.org/0000-0002-4948-1955"},"institutions":[{"id":"https://openalex.org/I161296585","display_name":"Tokyo University of Science","ror":"https://ror.org/05sj3n476","country_code":"JP","type":"education","lineage":["https://openalex.org/I161296585"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hirotaka Koizumi","raw_affiliation_strings":["Tokyo University of Science,Department of Electrical Engineering,Tokyo,Japan","Department of Electrical Engineering, Tokyo University of Science, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Tokyo University of Science,Department of Electrical Engineering,Tokyo,Japan","institution_ids":["https://openalex.org/I161296585"]},{"raw_affiliation_string":"Department of Electrical Engineering, Tokyo University of Science, Tokyo, Japan","institution_ids":["https://openalex.org/I161296585"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5092819227"],"corresponding_institution_ids":["https://openalex.org/I161296585"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09224033,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"21","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.6029422879219055},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5847945809364319},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5518702268600464},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.5388088226318359},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.515021562576294},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5037421584129333},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.45887553691864014},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.42000848054885864},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4176372289657593},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.41524338722229004},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3287699520587921},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2979634702205658},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2708861231803894},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.1832546591758728},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10511904954910278}],"concepts":[{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.6029422879219055},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5847945809364319},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5518702268600464},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.5388088226318359},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.515021562576294},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5037421584129333},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.45887553691864014},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.42000848054885864},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4176372289657593},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.41524338722229004},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3287699520587921},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2979634702205658},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2708861231803894},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.1832546591758728},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10511904954910278},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isie51358.2023.10228145","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/isie51358.2023.10228145","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8199999928474426,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2083442383","https://openalex.org/W2111528612","https://openalex.org/W2116444921","https://openalex.org/W2160830391","https://openalex.org/W2167630521","https://openalex.org/W2405535781","https://openalex.org/W2586797985","https://openalex.org/W2588138493","https://openalex.org/W2588271208","https://openalex.org/W2606192696","https://openalex.org/W2764091729","https://openalex.org/W2905275287","https://openalex.org/W2969466260"],"related_works":["https://openalex.org/W2367891013","https://openalex.org/W2007108787","https://openalex.org/W2084837496","https://openalex.org/W2103570580","https://openalex.org/W2373210218","https://openalex.org/W3147659851","https://openalex.org/W3119861251","https://openalex.org/W2364828775","https://openalex.org/W2972711000","https://openalex.org/W4281730786"],"abstract_inverted_index":{"For":[0],"safety-critical":[1],"application,":[2],"fault-tolerant":[3],"operation":[4],"capability":[5],"under":[6],"the":[7,40,71],"condition":[8],"of":[9,23,48,70],"switching":[10,51,55,58],"device":[11],"fault":[12,52],"is":[13,20,44,74],"getting":[14],"significantly":[15],"important.":[16],"The":[17],"proposed":[18,72],"circuit":[19,73,79],"a":[21],"combination":[22],"three":[24],"phase":[25],"Active":[26],"Neutral":[27],"Point":[28],"Clamped":[29],"(ANPC)":[30],"multilevel":[31,35],"invert":[32],"and":[33,53,78],"T-type":[34],"inverter.":[36],"In":[37,66],"this":[38,67],"circuit,":[39],"rated":[41],"output":[42],"voltage":[43],"maintained":[45],"in":[46],"cases":[47],"both":[49],"open-circuit":[50],"short-circuit":[54],"fault.":[56],"Also,":[57],"devices":[59],"are":[60],"reduced":[61],"compared":[62],"to":[63],"conventional":[64],"circuits.":[65],"paper,":[68],"utility":[69],"verified":[75],"by":[76],"simulation":[77],"experiment.":[80]},"counts_by_year":[],"updated_date":"2025-12-24T23:09:58.560324","created_date":"2025-10-10T00:00:00"}