{"id":"https://openalex.org/W2964686572","doi":"https://doi.org/10.1109/isie.2019.8781176","title":"Localized Fault Protection in the DC Microgrids with Ring Configuration","display_name":"Localized Fault Protection in the DC Microgrids with Ring Configuration","publication_year":2019,"publication_date":"2019-06-01","ids":{"openalex":"https://openalex.org/W2964686572","doi":"https://doi.org/10.1109/isie.2019.8781176","mag":"2964686572"},"language":"en","primary_location":{"id":"doi:10.1109/isie.2019.8781176","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isie.2019.8781176","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039067829","display_name":"Navid Bayati","orcid":"https://orcid.org/0000-0001-9247-0840"},"institutions":[{"id":"https://openalex.org/I891191580","display_name":"Aalborg University","ror":"https://ror.org/04m5j1k67","country_code":"DK","type":"education","lineage":["https://openalex.org/I891191580"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Navid Bayati","raw_affiliation_strings":["Department of Energy Technology, Aalborg University, Esbjerg, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Energy Technology, Aalborg University, Esbjerg, Denmark","institution_ids":["https://openalex.org/I891191580"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044221851","display_name":"Amin Hajizadeh","orcid":"https://orcid.org/0000-0001-7067-1318"},"institutions":[{"id":"https://openalex.org/I891191580","display_name":"Aalborg University","ror":"https://ror.org/04m5j1k67","country_code":"DK","type":"education","lineage":["https://openalex.org/I891191580"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Amin Hajizadeh","raw_affiliation_strings":["Department of Energy Technology, Aalborg University, Esbjerg, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Energy Technology, Aalborg University, Esbjerg, Denmark","institution_ids":["https://openalex.org/I891191580"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009424331","display_name":"Mohsen Soltani","orcid":"https://orcid.org/0000-0003-0741-070X"},"institutions":[{"id":"https://openalex.org/I891191580","display_name":"Aalborg University","ror":"https://ror.org/04m5j1k67","country_code":"DK","type":"education","lineage":["https://openalex.org/I891191580"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Mohsen Soltani","raw_affiliation_strings":["Department of Energy Technology, Aalborg University, Esbjerg, Denmark"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Energy Technology, Aalborg University, Esbjerg, Denmark","institution_ids":["https://openalex.org/I891191580"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2109,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.79840946,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"136","last_page":"140"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.7550860643386841},{"id":"https://openalex.org/keywords/microgrid","display_name":"Microgrid","score":0.6622889637947083},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5590782165527344},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5400444269180298},{"id":"https://openalex.org/keywords/power-system-protection","display_name":"Power-system protection","score":0.5226285457611084},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.5071203708648682},{"id":"https://openalex.org/keywords/ring","display_name":"Ring (chemistry)","score":0.503579318523407},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.43982958793640137},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.40830326080322266},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3889613747596741},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38547542691230774},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.376264750957489},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36274057626724243},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.3283199369907379},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2787908911705017},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1715843677520752},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.12473142147064209},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08273705840110779},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07218432426452637}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.7550860643386841},{"id":"https://openalex.org/C2776784348","wikidata":"https://www.wikidata.org/wiki/Q5762595","display_name":"Microgrid","level":3,"score":0.6622889637947083},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5590782165527344},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5400444269180298},{"id":"https://openalex.org/C38361682","wikidata":"https://www.wikidata.org/wiki/Q1756067","display_name":"Power-system protection","level":4,"score":0.5226285457611084},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.5071203708648682},{"id":"https://openalex.org/C2780378348","wikidata":"https://www.wikidata.org/wiki/Q25351438","display_name":"Ring (chemistry)","level":2,"score":0.503579318523407},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.43982958793640137},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.40830326080322266},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3889613747596741},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38547542691230774},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.376264750957489},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36274057626724243},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.3283199369907379},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2787908911705017},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1715843677520752},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.12473142147064209},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08273705840110779},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07218432426452637},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/isie.2019.8781176","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isie.2019.8781176","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.atira.dk:publications/d28c1f35-43e6-4cd1-aa78-2e04ed21ff26","is_oa":false,"landing_page_url":"http://www.scopus.com/inward/record.url?scp=85070594841&partnerID=8YFLogxK","pdf_url":null,"source":{"id":"https://openalex.org/S4306401731","display_name":"VBN Forskningsportal (Aalborg Universitet)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I891191580","host_organization_name":"Aalborg University","host_organization_lineage":["https://openalex.org/I891191580"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Bayati , N , Hajizadeh , A & N. Soltani , M 2019 , Localized Fault Protection in the DC Microgrids with Ring Configuration . in Proceedings of 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) . , 8781176 , IEEE Press , IEEE International Symposium on Industrial Electronics (ISIE) , pp. 136-140 , 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) , Vancouver , Canada , 12/06/2019 . https://doi.org/10.1109/ISIE.2019.8781176","raw_type":"contributionToPeriodical"},{"id":"pmh:oai:pure.atira.dk:publications/d28c1f35-43e6-4cd1-aa78-2e04ed21ff26","is_oa":false,"landing_page_url":"https://vbn.aau.dk/da/publications/d28c1f35-43e6-4cd1-aa78-2e04ed21ff26","pdf_url":null,"source":{"id":"https://openalex.org/S4306401731","display_name":"VBN Forskningsportal (Aalborg Universitet)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I891191580","host_organization_name":"Aalborg University","host_organization_lineage":["https://openalex.org/I891191580"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Bayati, N, Hajizadeh, A & N. Soltani, M 2019, Localized Fault Protection in the DC Microgrids with Ring Configuration. in Proceedings of 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)., 8781176, IEEE Press, IEEE International Symposium on Industrial Electronics (ISIE), pp. 136-140, 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) , Vancouver, Canada, 12/06/2019. https://doi.org/10.1109/ISIE.2019.8781176","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1972678894","https://openalex.org/W1990211275","https://openalex.org/W2029135909","https://openalex.org/W2041957539","https://openalex.org/W2069032722","https://openalex.org/W2073887634","https://openalex.org/W2115556004","https://openalex.org/W2148895869","https://openalex.org/W2158017035","https://openalex.org/W2229466401","https://openalex.org/W2304131693","https://openalex.org/W2339766197","https://openalex.org/W2414294717","https://openalex.org/W2461319461","https://openalex.org/W2489781746","https://openalex.org/W2586856580","https://openalex.org/W2591846776","https://openalex.org/W2617617186","https://openalex.org/W2888459562","https://openalex.org/W2897636294","https://openalex.org/W2898865511","https://openalex.org/W2898928726","https://openalex.org/W4285719527","https://openalex.org/W6715472072","https://openalex.org/W6718468777"],"related_works":["https://openalex.org/W1574359403","https://openalex.org/W2057975886","https://openalex.org/W4308700935","https://openalex.org/W4210780382","https://openalex.org/W2356033827","https://openalex.org/W4231018432","https://openalex.org/W2099033540","https://openalex.org/W3107844147","https://openalex.org/W2106407917","https://openalex.org/W1967326333"],"abstract_inverted_index":{"DC":[0,166],"Microgrids":[1],"with":[2,17],"ring":[3,125],"configuration":[4],"promises":[5],"a":[6,24,163],"new":[7],"opportunity":[8],"for":[9,143],"distribution":[10],"systems,":[11,126],"but":[12],"it":[13],"is":[14,36,69,80,91,160],"still":[15],"faced":[16],"critical":[18],"protection":[19,26,129],"problems.":[20],"In":[21],"this":[22,72,78],"paper,":[23],"localized":[25,92],"method":[27,79,90,105,178],"based":[28],"on":[29,162],"the":[30,41,45,55,57,61,64,81,84,103,107,113,116,120,127,173,176],"transient":[31],"behavior":[32],"of":[33,77,83,86,102,115,145,175],"fault":[34,42,46,58,135,146,158,181],"current":[35,122],"presented,":[37],"which":[38],"can":[39],"locate":[40],"and":[43,93,111,133,148,170,183],"calculate":[44],"resistance":[47,59,149],"by":[48,71,150],"only":[49,94],"local":[50,152],"measurements.":[51],"Besides,":[52],"due":[53],"to":[54,119],"calculating":[56],"in":[60,124,168,179],"proposed":[62,89,104,128,177],"scheme,":[63],"High":[65],"Impedance":[66],"Fault":[67],"(HIF)":[68],"locatable":[70],"method.":[73],"Another":[74],"important":[75],"feature":[76,101],"reduction":[82],"number":[85],"relays.":[87],"The":[88,140,157],"needs":[95],"two":[96,137],"Protection":[97],"Detection":[98],"(PD).":[99],"This":[100],"removes":[106],"communication":[108],"link,":[109],"noise,":[110],"reduce":[112],"cost":[114],"system.":[117],"Due":[118],"bidirectional":[121],"flow":[123],"scheme":[130],"considers":[131],"that":[132],"locates":[134],"from":[136],"different":[138,180],"sides.":[139],"mathematical":[141],"equations":[142],"calculation":[144],"location":[147,159],"using":[151],"measured":[153],"values":[154],"are":[155],"derived.":[156],"tested":[161],"multi-source":[164],"ring-type":[165],"Microgrid":[167],"Digsilent,":[169],"results":[171],"show":[172],"effectiveness":[174],"locations":[182],"resistances.":[184]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":5}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}