{"id":"https://openalex.org/W2120989797","doi":"https://doi.org/10.1109/isie.2012.6237098","title":"Design & implementation of an A-type residual current circuit breaker IC","display_name":"Design & implementation of an A-type residual current circuit breaker IC","publication_year":2012,"publication_date":"2012-05-01","ids":{"openalex":"https://openalex.org/W2120989797","doi":"https://doi.org/10.1109/isie.2012.6237098","mag":"2120989797"},"language":"en","primary_location":{"id":"doi:10.1109/isie.2012.6237098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isie.2012.6237098","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Industrial Electronics","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100511705","display_name":"Yan Han","orcid":"https://orcid.org/0000-0002-2041-3115"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yan Han","raw_affiliation_strings":["Department of Information Science& Electronic Engineering, Hangzhou Huahang Electronics Company, Hangzhou, China","[Zhejiang University, Department of Information Science& Electronic Engineering, Hangzhou, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Science& Electronic Engineering, Hangzhou Huahang Electronics Company, Hangzhou, China","institution_ids":[]},{"raw_affiliation_string":"[Zhejiang University, Department of Information Science& Electronic Engineering, Hangzhou, China]","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Chen Ding","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chen Ding","raw_affiliation_strings":["Department of Information Science& Electronic Engineering, Hangzhou Huahang Electronics Company, Hangzhou, China","[Zhejiang University, Department of Information Science& Electronic Engineering, Hangzhou, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Science& Electronic Engineering, Hangzhou Huahang Electronics Company, Hangzhou, China","institution_ids":[]},{"raw_affiliation_string":"[Zhejiang University, Department of Information Science& Electronic Engineering, Hangzhou, China]","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111917173","display_name":"Xinli Shou","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xinli Shou","raw_affiliation_strings":["Department of Information Science& Electronic Engineering, Hangzhou Huahang Electronics Company, Hangzhou, China","[Zhejiang University, Department of Information Science& Electronic Engineering, Hangzhou, China]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Science& Electronic Engineering, Hangzhou Huahang Electronics Company, Hangzhou, China","institution_ids":[]},{"raw_affiliation_string":"[Zhejiang University, Department of Information Science& Electronic Engineering, Hangzhou, China]","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"280","last_page":"285"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.9642000198364258,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9581000208854675,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.6349793076515198},{"id":"https://openalex.org/keywords/application-specific-integrated-circuit","display_name":"Application-specific integrated circuit","score":0.6025579571723938},{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.5915128588676453},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5847806930541992},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5719781517982483},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5530704259872437},{"id":"https://openalex.org/keywords/residual-current-device","display_name":"Residual-current device","score":0.518976628780365},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.4609852731227875},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4573388397693634},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43434858322143555},{"id":"https://openalex.org/keywords/power-grid","display_name":"Power grid","score":0.42989373207092285},{"id":"https://openalex.org/keywords/intellectual-property","display_name":"Intellectual property","score":0.4137875735759735},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.36435186862945557},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3226514458656311},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.2701931893825531},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07955843210220337}],"concepts":[{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.6349793076515198},{"id":"https://openalex.org/C77390884","wikidata":"https://www.wikidata.org/wiki/Q217302","display_name":"Application-specific integrated circuit","level":2,"score":0.6025579571723938},{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.5915128588676453},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5847806930541992},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5719781517982483},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5530704259872437},{"id":"https://openalex.org/C15116251","wikidata":"https://www.wikidata.org/wiki/Q337716","display_name":"Residual-current device","level":3,"score":0.518976628780365},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.4609852731227875},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4573388397693634},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43434858322143555},{"id":"https://openalex.org/C2983254600","wikidata":"https://www.wikidata.org/wiki/Q1096907","display_name":"Power grid","level":3,"score":0.42989373207092285},{"id":"https://openalex.org/C34974158","wikidata":"https://www.wikidata.org/wiki/Q131257","display_name":"Intellectual property","level":2,"score":0.4137875735759735},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.36435186862945557},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3226514458656311},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.2701931893825531},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07955843210220337},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isie.2012.6237098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isie.2012.6237098","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Symposium on Industrial Electronics","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1976105857","https://openalex.org/W2089753710","https://openalex.org/W2369354683"],"related_works":["https://openalex.org/W2350644057","https://openalex.org/W2380605266","https://openalex.org/W2380044501","https://openalex.org/W2386690649","https://openalex.org/W2357178458","https://openalex.org/W2364283896","https://openalex.org/W4312991835","https://openalex.org/W2392215035","https://openalex.org/W3112690980","https://openalex.org/W2270758087"],"abstract_inverted_index":{"Nowadays,":[0],"electrical":[1],"equipments":[2],"are":[3],"becoming":[4,62],"more":[5,7,59,122,124],"and":[6,12,45,81,89,111,123,126,134],"complex":[8],"in":[9,23,30,83],"industrial":[10],"production":[11],"people's":[13],"daily":[14],"lives.":[15],"The":[16,117],"case":[17],"that":[18,100],"non-sinusoidal":[19],"residual":[20,43],"current":[21],"appearing":[22],"the":[24,34,53,104,108],"power":[25],"grid":[26],"is":[27,39,58,61,79],"gradually":[28],"increasing":[29],"modern":[31],"society.":[32],"However,":[33],"traditional":[35],"AC-type":[36],"leakage":[37,55,75,119],"protector":[38,56,120],"insensitive":[40],"to":[41],"such":[42],"current,":[44],"it":[46],"cannot":[47],"have":[48],"an":[49],"effective":[50],"protection.":[51],"So":[52],"A-type":[54,74,118],"which":[57],"functional":[60],"widely":[63],"used.":[64],"This":[65,77],"paper":[66],"introduces":[67],"a":[68,113],"new":[69],"ASIC":[70],"chip":[71,78,128],"ZDAB01":[72,101,127],"for":[73],"protector.":[76],"designed":[80],"implemented":[82],"CSMC":[84],"0.5um":[85],"Mixed":[86],"CMOS":[87],"process,":[88],"has":[90,98,112],"completely":[91],"independent":[92],"intellectual":[93],"property":[94],"rights.":[95],"Test":[96],"results":[97],"confirmed":[99],"performance":[102],"meets":[103],"corresponding":[105],"provisions":[106],"of":[107],"national":[109],"standard":[110],"strong":[114],"anti-interference":[115],"ability.":[116],"becomes":[121],"popular,":[125],"will":[129],"show":[130],"great":[131],"market":[132],"prospects":[133],"social":[135],"benefits.1.":[136]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}