{"id":"https://openalex.org/W2581103875","doi":"https://doi.org/10.1109/isicir.2016.7829710","title":"Safety evaluation based on virtual prototypes: Fault injection with multi-level processor models","display_name":"Safety evaluation based on virtual prototypes: Fault injection with multi-level processor models","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2581103875","doi":"https://doi.org/10.1109/isicir.2016.7829710","mag":"2581103875"},"language":"en","primary_location":{"id":"doi:10.1109/isicir.2016.7829710","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isicir.2016.7829710","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International Symposium on Integrated Circuits (ISIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5011419637","display_name":"Daniel Mueller-Gritschneder","orcid":"https://orcid.org/0000-0003-0903-631X"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Daniel Mueller-Gritschneder","raw_affiliation_strings":["Technische Universitaet, Muenchen, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universitaet, Muenchen, Germany","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039265608","display_name":"Marc Greim","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Marc Greim","raw_affiliation_strings":["Technische Universitaet, Muenchen, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universitaet, Muenchen, Germany","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017567485","display_name":"Ulf Schlichtmann","orcid":"https://orcid.org/0000-0003-4431-7619"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ulf Schlichtmann","raw_affiliation_strings":["Technische Universitaet, Muenchen, Germany"],"affiliations":[{"raw_affiliation_string":"Technische Universitaet, Muenchen, Germany","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5011419637"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.16118634,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/systemc","display_name":"SystemC","score":0.9187813997268677},{"id":"https://openalex.org/keywords/plug-in","display_name":"Plug-in","score":0.8627539873123169},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.8358427882194519},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7465968132019043},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.6873066425323486},{"id":"https://openalex.org/keywords/fault-simulator","display_name":"Fault Simulator","score":0.5415284037590027},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.47053655982017517},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.43186286091804504},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.33234575390815735},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2556346356868744},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.186763197183609},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.16995394229888916},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.12569379806518555}],"concepts":[{"id":"https://openalex.org/C2776928060","wikidata":"https://www.wikidata.org/wiki/Q1753563","display_name":"SystemC","level":2,"score":0.9187813997268677},{"id":"https://openalex.org/C4924752","wikidata":"https://www.wikidata.org/wiki/Q184148","display_name":"Plug-in","level":2,"score":0.8627539873123169},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.8358427882194519},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7465968132019043},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.6873066425323486},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.5415284037590027},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.47053655982017517},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.43186286091804504},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.33234575390815735},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2556346356868744},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.186763197183609},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.16995394229888916},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.12569379806518555},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isicir.2016.7829710","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isicir.2016.7829710","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International Symposium on Integrated Circuits (ISIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5699999928474426,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321114","display_name":"Bundesministerium f\u00fcr Bildung und Forschung","ror":"https://ror.org/04pz7b180"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1487950196","https://openalex.org/W1972649107","https://openalex.org/W2005961863","https://openalex.org/W2026833966","https://openalex.org/W2098280085","https://openalex.org/W2134755427","https://openalex.org/W4250247110"],"related_works":["https://openalex.org/W2012037356","https://openalex.org/W4388214509","https://openalex.org/W1550409889","https://openalex.org/W1830510111","https://openalex.org/W2039065447","https://openalex.org/W2208074837","https://openalex.org/W1993058522","https://openalex.org/W2798594638","https://openalex.org/W2123498410","https://openalex.org/W227106366"],"abstract_inverted_index":{"This":[0],"article":[1],"gives":[2],"an":[3],"overview":[4],"of":[5,38],"fault":[6],"injection":[7],"into":[8,20],"embedded":[9],"processors":[10],"at":[11],"VP":[12,23],"level.":[13],"The":[14],"ETISS":[15],"processor":[16,52],"simulator":[17],"is":[18,41],"integrated":[19],"a":[21,46],"SystemC/TLM":[22],"and":[24,49],"extended":[25],"by":[26],"plugins.":[27],"A":[28],"plugin":[29],"for":[30,35,45],"switching":[31],"to":[32],"RTL-level":[33],"simulation":[34,37],"accurate":[36],"soft":[39],"errors":[40],"described.":[42],"Experimental":[43],"results":[44],"control":[47],"system":[48],"the":[50],"OpenRISC":[51],"are":[53],"given.":[54]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}