{"id":"https://openalex.org/W2582579727","doi":"https://doi.org/10.1109/isicir.2016.7829699","title":"Design of millimeter-wave transformer balun with isolation circuit in silicon based technology","display_name":"Design of millimeter-wave transformer balun with isolation circuit in silicon based technology","publication_year":2016,"publication_date":"2016-12-01","ids":{"openalex":"https://openalex.org/W2582579727","doi":"https://doi.org/10.1109/isicir.2016.7829699","mag":"2582579727"},"language":"en","primary_location":{"id":"doi:10.1109/isicir.2016.7829699","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isicir.2016.7829699","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International Symposium on Integrated Circuits (ISIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100379736","display_name":"Dawei Zhang","orcid":"https://orcid.org/0000-0001-6630-0872"},"institutions":[{"id":"https://openalex.org/I194716290","display_name":"China Academy of Space Technology","ror":"https://ror.org/025397a59","country_code":"CN","type":"government","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dawei Zhang","raw_affiliation_strings":["China Academy of Space Technology (Xi'an), Xi'an, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Academy of Space Technology (Xi'an), Xi'an, China","institution_ids":["https://openalex.org/I194716290"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100432188","display_name":"Hongxi Yu","orcid":"https://orcid.org/0000-0003-2375-6962"},"institutions":[{"id":"https://openalex.org/I194716290","display_name":"China Academy of Space Technology","ror":"https://ror.org/025397a59","country_code":"CN","type":"government","lineage":["https://openalex.org/I194716290","https://openalex.org/I2802615301"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongxi Yu","raw_affiliation_strings":["China Academy of Space Technology, Beijing, Beijing, CN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Academy of Space Technology, Beijing, Beijing, CN","institution_ids":["https://openalex.org/I194716290"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Thangarasu Bharatha Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Thangarasu Bharatha Kumar","raw_affiliation_strings":["Singapore University of Technology and Design, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013176599","display_name":"Kai Men","orcid":null},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kai Men","raw_affiliation_strings":["Singapore University of Technology and Design, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067995995","display_name":"Muting Lu","orcid":"https://orcid.org/0000-0001-6992-0719"},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Muting Lu","raw_affiliation_strings":["Singapore University of Technology and Design, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074291976","display_name":"Xiaopeng Yu","orcid":"https://orcid.org/0000-0002-4531-6645"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaopeng Yu","raw_affiliation_strings":["Zhejiang University, Hangzhou, Zhejiang, CN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University, Hangzhou, Zhejiang, CN","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009974389","display_name":"Kiat Seng Yeo","orcid":"https://orcid.org/0000-0002-4524-707X"},"institutions":[{"id":"https://openalex.org/I152815399","display_name":"Singapore University of Technology and Design","ror":"https://ror.org/05j6fvn87","country_code":"SG","type":"education","lineage":["https://openalex.org/I152815399"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kiat Seng Yeo","raw_affiliation_strings":["Singapore University of Technology and Design, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Singapore University of Technology and Design, Singapore","institution_ids":["https://openalex.org/I152815399"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.372,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.68527966,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/balun","display_name":"Balun","score":0.9387784004211426},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.7452511787414551},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5848395228385925},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.5504051446914673},{"id":"https://openalex.org/keywords/impedance-matching","display_name":"Impedance matching","score":0.5233727693557739},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.5021953582763672},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5005347728729248},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4549713432788849},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3513043522834778},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.19065824151039124},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16939741373062134},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15258297324180603}],"concepts":[{"id":"https://openalex.org/C114489654","wikidata":"https://www.wikidata.org/wiki/Q805838","display_name":"Balun","level":3,"score":0.9387784004211426},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.7452511787414551},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5848395228385925},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.5504051446914673},{"id":"https://openalex.org/C612350","wikidata":"https://www.wikidata.org/wiki/Q1761108","display_name":"Impedance matching","level":3,"score":0.5233727693557739},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.5021953582763672},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5005347728729248},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4549713432788849},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3513043522834778},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.19065824151039124},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16939741373062134},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15258297324180603},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isicir.2016.7829699","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isicir.2016.7829699","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 International Symposium on Integrated Circuits (ISIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323292","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2007234024","https://openalex.org/W2007508874","https://openalex.org/W2008312516","https://openalex.org/W2051952209","https://openalex.org/W2109632562","https://openalex.org/W2123462276","https://openalex.org/W2131099994","https://openalex.org/W2152392891","https://openalex.org/W2154138716"],"related_works":["https://openalex.org/W4316672380","https://openalex.org/W2109953808","https://openalex.org/W2131099994","https://openalex.org/W1544971221","https://openalex.org/W2135564033","https://openalex.org/W2107261388","https://openalex.org/W2154934836","https://openalex.org/W2117575464","https://openalex.org/W2783830416","https://openalex.org/W3134507124"],"abstract_inverted_index":{"In":[0,43],"this":[1,44,95],"paper":[2],"a":[3,8,62],"novel":[4],"method":[5],"to":[6,51],"design":[7,86],"transformer":[9,29,58],"based":[10,101],"balun":[11,30,59,70],"with":[12,71,103],"isolation":[13,41,47,74,96],"between":[14,53,68],"output":[15,54],"ports":[16,22,55],"and":[17,40,72],"matching":[18,39],"characteristic":[19],"at":[20,31],"all":[21],"is":[23,34,49,88],"proposed.":[24],"The":[25],"main":[26],"issue":[27],"of":[28,82,94],"millimeter-wave":[32,91],"frequencies":[33],"that":[35],"it":[36],"has":[37,65,77],"poor":[38],"performance.":[42],"work,":[45],"an":[46],"circuit":[48,97],"introduced":[50],"place":[52],"in":[56,98],"the":[57,69],"design.":[60,84],"As":[61],"validation,":[63],"comparison":[64],"been":[66],"made":[67],"without":[73],"circuit,":[75],"which":[76],"shown":[78],"great":[79],"performance":[80],"improvement":[81],"proposed":[83],"Moreover,":[85],"example":[87],"given":[89],"for":[90],"on-chip":[92],"implementation":[93],"standard":[99],"silicon":[100],"technology":[102],"6":[104],"metal":[105],"layers.":[106]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}