{"id":"https://openalex.org/W2556990844","doi":"https://doi.org/10.1109/isicir.2014.7029573","title":"An improved scan cell ordering method using the scan cells with complementary outputs","display_name":"An improved scan cell ordering method using the scan cells with complementary outputs","publication_year":2014,"publication_date":"2014-12-01","ids":{"openalex":"https://openalex.org/W2556990844","doi":"https://doi.org/10.1109/isicir.2014.7029573","mag":"2556990844"},"language":"en","primary_location":{"id":"doi:10.1109/isicir.2014.7029573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isicir.2014.7029573","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Symposium on Integrated Circuits (ISIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100462415","display_name":"Mengyang Li","orcid":"https://orcid.org/0000-0002-8958-3163"},"institutions":[{"id":"https://openalex.org/I158809036","display_name":"Shenzhen Institute of Information Technology","ror":"https://ror.org/03wrf9427","country_code":"CN","type":"education","lineage":["https://openalex.org/I158809036"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Mengyang Li","raw_affiliation_strings":["School of Electronic and Information Engineering, Harbin Institute of Technology Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Harbin Institute of Technology Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003304424","display_name":"Aijiao Cui","orcid":"https://orcid.org/0000-0002-4728-9265"},"institutions":[{"id":"https://openalex.org/I158809036","display_name":"Shenzhen Institute of Information Technology","ror":"https://ror.org/03wrf9427","country_code":"CN","type":"education","lineage":["https://openalex.org/I158809036"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aijiao Cui","raw_affiliation_strings":["School of Electronic and Information Engineering, Harbin Institute of Technology Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Harbin Institute of Technology Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017977612","display_name":"Tingting Yu","orcid":"https://orcid.org/0000-0002-0663-283X"},"institutions":[{"id":"https://openalex.org/I158809036","display_name":"Shenzhen Institute of Information Technology","ror":"https://ror.org/03wrf9427","country_code":"CN","type":"education","lineage":["https://openalex.org/I158809036"]},{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tingting Yu","raw_affiliation_strings":["School of Electronic and Information Engineering, Harbin Institute of Technology Shenzhen Graduate School, Shenzhen, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Harbin Institute of Technology Shenzhen Graduate School, Shenzhen, China","institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100462415"],"corresponding_institution_ids":["https://openalex.org/I158809036","https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":1.2259,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.80965052,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"103","last_page":"106"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.94508957862854},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.7031029462814331},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.544054388999939},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5439640283584595},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5373342037200928},{"id":"https://openalex.org/keywords/connection","display_name":"Connection (principal bundle)","score":0.5235925912857056},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.49950456619262695},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4819181263446808},{"id":"https://openalex.org/keywords/scan-line","display_name":"Scan line","score":0.47292715311050415},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.4549143314361572},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4153040647506714},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40287864208221436},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.17658409476280212},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.17441892623901367},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.16818293929100037},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16007041931152344},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1430566906929016},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.14150682091712952},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0897989571094513}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.94508957862854},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.7031029462814331},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.544054388999939},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5439640283584595},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5373342037200928},{"id":"https://openalex.org/C13355873","wikidata":"https://www.wikidata.org/wiki/Q2920850","display_name":"Connection (principal bundle)","level":2,"score":0.5235925912857056},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.49950456619262695},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4819181263446808},{"id":"https://openalex.org/C142748172","wikidata":"https://www.wikidata.org/wiki/Q3240002","display_name":"Scan line","level":4,"score":0.47292715311050415},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.4549143314361572},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4153040647506714},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40287864208221436},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.17658409476280212},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.17441892623901367},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.16818293929100037},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16007041931152344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1430566906929016},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.14150682091712952},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0897989571094513},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isicir.2014.7029573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isicir.2014.7029573","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Symposium on Integrated Circuits (ISIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1528223898","https://openalex.org/W1595368737","https://openalex.org/W1820769975","https://openalex.org/W2001817755","https://openalex.org/W2080510479","https://openalex.org/W2102168889","https://openalex.org/W2116129521","https://openalex.org/W2118966417","https://openalex.org/W2120872844","https://openalex.org/W2126641963","https://openalex.org/W2135615172","https://openalex.org/W6650674693"],"related_works":["https://openalex.org/W2117171289","https://openalex.org/W1852363244","https://openalex.org/W2127184179","https://openalex.org/W1501621551","https://openalex.org/W1974621628","https://openalex.org/W2001654810","https://openalex.org/W2172250424","https://openalex.org/W3088373974","https://openalex.org/W2012436574","https://openalex.org/W2121956161"],"abstract_inverted_index":{"Scan-based":[0],"testing":[1],"always":[2],"consumes":[3],"considerable":[4],"power":[5],"due":[6,94],"to":[7,48,95,146,155],"the":[8,11,42,58,68,90,96,109,117,134,150],"transitions":[9,69,93,141],"during":[10,57,70],"shifting":[12],"of":[13,60,92,108,140],"test":[14,71,76,148],"data":[15],"in":[16,25,125],"scan":[17,36,43,55,61,97,111,122,135,163],"chain.":[18],"Scan":[19],"cell":[20,37,62,164],"ordering":[21,38],"technique":[22],"is":[23,103,153],"effective":[24],"reducing":[26],"such":[27],"transitions.":[28],"In":[29],"this":[30,80],"paper,":[31],"we":[32],"propose":[33],"an":[34],"improved":[35],"method.":[39],"We":[40,78],"introduce":[41],"cells":[44,56,123],"with":[45,116,137,144],"complementary":[46],"outputs":[47],"enable":[49],"two":[50,159],"alternative":[51],"connection":[52,128,160],"styles":[53,161],"between":[54],"process":[59],"ordering.":[63,165],"This":[64],"can":[65,132],"further":[66],"reduce":[67],"application":[72],"and":[73],"save":[74],"more":[75],"power.":[77],"applied":[79],"method":[81,102,118,131,152],"on":[82,113,120],"several":[83],"benchmark":[84],"circuits.":[85],"The":[86],"results":[87],"show":[88],"that":[89,107,156],"number":[91],"chain":[98],"by":[99],"our":[100,130],"proposed":[101,151],"39.0%":[104],"fewer":[105,139],"than":[106],"original":[110],"design":[112],"average.":[114],"Compared":[115],"based":[119],"all":[121],"connected":[124],"a":[126],"uniform":[127],"style,":[129],"achieve":[133],"designs":[136],"4.5%":[138],"averagely.":[142],"Also,":[143],"regard":[145],"saving":[147],"power,":[149],"superior":[154],"only":[157],"considers":[158],"after":[162]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}