{"id":"https://openalex.org/W1984404626","doi":"https://doi.org/10.1109/isicir.2014.7029479","title":"A dynamic-voltage-scaling 1kbyte&amp;#x00D7;8-bit non-imprinting Master-Slave SRAM with high speed erase for low-power operation","display_name":"A dynamic-voltage-scaling 1kbyte&amp;#x00D7;8-bit non-imprinting Master-Slave SRAM with high speed erase for low-power operation","publication_year":2014,"publication_date":"2014-12-01","ids":{"openalex":"https://openalex.org/W1984404626","doi":"https://doi.org/10.1109/isicir.2014.7029479","mag":"1984404626"},"language":"en","primary_location":{"id":"doi:10.1109/isicir.2014.7029479","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isicir.2014.7029479","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Symposium on Integrated Circuits (ISIC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014926180","display_name":"Weng\u2010Geng Ho","orcid":"https://orcid.org/0000-0002-0589-3480"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Weng-Geng Ho","raw_affiliation_strings":["Nanyang Technological University, Singapore","Nanyang Technological University 50 Nanyang Avenue, Singapore 639798"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Nanyang Technological University 50 Nanyang Avenue, Singapore 639798","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073268696","display_name":"Kwen\u2010Siong Chong","orcid":"https://orcid.org/0000-0003-1512-2003"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Kwen-Siong Chong","raw_affiliation_strings":["Nanyang Technological University, Singapore","Nanyang Technological University 50 Nanyang Avenue, Singapore 639798"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Nanyang Technological University 50 Nanyang Avenue, Singapore 639798","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000314679","display_name":"Bah\u2010Hwee Gwee","orcid":"https://orcid.org/0000-0002-3222-2885"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Bah-Hwee Gwee","raw_affiliation_strings":["Nanyang Technological University, Singapore","Nanyang Technological University 50 Nanyang Avenue, Singapore 639798"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Nanyang Technological University 50 Nanyang Avenue, Singapore 639798","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023352317","display_name":"Joseph S. Chang","orcid":"https://orcid.org/0000-0003-0991-8339"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Joseph S. Chang","raw_affiliation_strings":["Nanyang Technological University, Singapore","Nanyang Technological University 50 Nanyang Avenue, Singapore 639798"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Nanyang Technological University 50 Nanyang Avenue, Singapore 639798","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088626085","display_name":"Ne Kyaw Zwa Lwin","orcid":"https://orcid.org/0000-0001-7506-0380"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Ne Kyaw Zwa Lwin","raw_affiliation_strings":["Nanyang Technological University, Singapore, Singapore, SG","Nanyang Technological University 50 Nanyang Avenue, Singapore 639798"],"affiliations":[{"raw_affiliation_string":"Nanyang Technological University, Singapore, Singapore, SG","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Nanyang Technological University 50 Nanyang Avenue, Singapore 639798","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5014926180"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":0.27718137,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.58225711,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"1 b","issue":null,"first_page":"320","last_page":"323"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9156267642974854},{"id":"https://openalex.org/keywords/dynamic-voltage-scaling","display_name":"Dynamic voltage scaling","score":0.6688785552978516},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5984068512916565},{"id":"https://openalex.org/keywords/imprinting","display_name":"Imprinting (psychology)","score":0.5345755219459534},{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.4743698537349701},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4503369629383087},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4429725110530853},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43621110916137695},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4345123767852783},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43344929814338684},{"id":"https://openalex.org/keywords/idle","display_name":"Idle","score":0.41947585344314575},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.39503639936447144},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27603405714035034},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1679157316684723},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.14173579216003418},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07455307245254517}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9156267642974854},{"id":"https://openalex.org/C2776047111","wikidata":"https://www.wikidata.org/wiki/Q632037","display_name":"Dynamic voltage scaling","level":3,"score":0.6688785552978516},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5984068512916565},{"id":"https://openalex.org/C94715292","wikidata":"https://www.wikidata.org/wiki/Q624349","display_name":"Imprinting (psychology)","level":3,"score":0.5345755219459534},{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.4743698537349701},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4503369629383087},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4429725110530853},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43621110916137695},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4345123767852783},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43344929814338684},{"id":"https://openalex.org/C16320812","wikidata":"https://www.wikidata.org/wiki/Q1812200","display_name":"Idle","level":2,"score":0.41947585344314575},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.39503639936447144},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27603405714035034},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1679157316684723},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.14173579216003418},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07455307245254517},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isicir.2014.7029479","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isicir.2014.7029479","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Symposium on Integrated Circuits (ISIC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.75}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W263842235","https://openalex.org/W1489288537","https://openalex.org/W1894354929","https://openalex.org/W1976448626","https://openalex.org/W1997786207","https://openalex.org/W2073126994","https://openalex.org/W2085176118","https://openalex.org/W2104687104","https://openalex.org/W2267744288","https://openalex.org/W2405694905"],"related_works":["https://openalex.org/W124079801","https://openalex.org/W2974485871","https://openalex.org/W2736841911","https://openalex.org/W2148018444","https://openalex.org/W2602541697","https://openalex.org/W2626885911","https://openalex.org/W2079010813","https://openalex.org/W2095383161","https://openalex.org/W2071118425","https://openalex.org/W2030322647"],"abstract_inverted_index":{"We":[0],"propose":[1],"an":[2],"dynamic-voltage-scaling":[3],"(DVS)":[4],"non-imprinting":[5,128],"Master-Slave":[6],"SRAM":[7,37,59,72,91,129],"with":[8],"high":[9,15,62],"speed":[10,63],"erase,":[11],"for":[12],"low":[13],"power":[14,82,163],"secured":[16,48,87],"defense":[17,131],"applications.":[18],"There":[19],"are":[20,143],"three":[21],"key":[22],"features":[23],"in":[24,35,70],"the":[25,29,36,50,55,67,79,86,114,120,138,147,170],"proposed":[26],"design.":[27],"First,":[28],"stored":[30],"data":[31,41,64],"is":[32,46,159],"periodically":[33],"toggling":[34,68,80,115],"cell":[38],"to":[39,77,103,144],"prevent":[40],"imprint,":[42],"hence":[43,111],"our":[44,58,71,90,135,156],"design":[45,136,158],"highly":[47],"against":[49,137],"unauthorized":[51],"attack.":[52],"Once":[53],"detecting":[54],"tampering":[56],"attack,":[57],"can":[60,73,92],"perform":[61,93],"erase.":[65],"Second,":[66],"frequency":[69,153],"be":[74],"scaled":[75],"down":[76],"lower":[78,161],"dynamic":[81],"dissipation":[83],"without":[84],"compromising":[85],"feature.":[88],"Third,":[89],"DVS":[94,126,157],"from":[95],"nominal":[96],"voltage":[97,105,168],"(V":[98,106],"<sub":[99,107],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[100,108],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</sub>":[101,109],"=1.2V)":[102],"near-threshold":[104,167],"=0.6V),":[110],"further":[112],"reducing":[113],"leakage":[116],"power.":[117],"Based":[118],"on":[119],"65nm":[121],"process,":[122],"we":[123],"simulate":[124],"a":[125],"1kbyte\u00d78-bit":[127],"(for":[130,164],"application),":[132],"and":[133],"benchmark":[134],"non-DVS":[139,171],"counterpart.":[140,172],"Both":[141],"designs":[142],"operate":[145],"at":[146,166],"minimum":[148],"energy":[149],"point":[150],"(@1MHz)":[151],"via":[152],"scaling,":[154],"but":[155],"84%":[160],"idle":[162],"toggling)":[165],"than":[169]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
