{"id":"https://openalex.org/W3021578907","doi":"https://doi.org/10.1109/isgt45199.2020.9087682","title":"Monitoring Bulk Electric System IROLs and RAS Operation by the Online Transient Stability Ananlysis Tool: Peak RC's Practice and Lessons Learned","display_name":"Monitoring Bulk Electric System IROLs and RAS Operation by the Online Transient Stability Ananlysis Tool: Peak RC's Practice and Lessons Learned","publication_year":2020,"publication_date":"2020-02-01","ids":{"openalex":"https://openalex.org/W3021578907","doi":"https://doi.org/10.1109/isgt45199.2020.9087682","mag":"3021578907"},"language":"en","primary_location":{"id":"doi:10.1109/isgt45199.2020.9087682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isgt45199.2020.9087682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Power & Energy Society Innovative Smart Grid Technologies Conference (ISGT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100445032","display_name":"Hongming Zhang","orcid":"https://orcid.org/0000-0002-6131-2505"},"institutions":[{"id":"https://openalex.org/I4210119464","display_name":"Quality and Reliability (Greece)","ror":"https://ror.org/02f8mda22","country_code":"GR","type":"company","lineage":["https://openalex.org/I4210119464"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Hongming Zhang","raw_affiliation_strings":["Peak Reliability,600 NE 41st St #201, Vancouver,WA,USA,98662","Peak Reliability, 600 NE 41st St #201, Vancouver, WA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peak Reliability,600 NE 41st St #201, Vancouver,WA,USA,98662","institution_ids":["https://openalex.org/I4210119464"]},{"raw_affiliation_string":"Peak Reliability, 600 NE 41st St #201, Vancouver, WA, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003263341","display_name":"Slaven Kincic","orcid":"https://orcid.org/0000-0002-2003-0499"},"institutions":[{"id":"https://openalex.org/I4210119464","display_name":"Quality and Reliability (Greece)","ror":"https://ror.org/02f8mda22","country_code":"GR","type":"company","lineage":["https://openalex.org/I4210119464"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Slaven Kincic","raw_affiliation_strings":["Peak Reliability,600 NE 41st St #201, Vancouver,WA,USA,98662","Peak Reliability, 600 NE 41st St #201, Vancouver, WA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peak Reliability,600 NE 41st St #201, Vancouver,WA,USA,98662","institution_ids":["https://openalex.org/I4210119464"]},{"raw_affiliation_string":"Peak Reliability, 600 NE 41st St #201, Vancouver, WA, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109386016","display_name":"Frederic Howell","orcid":null},"institutions":[{"id":"https://openalex.org/I4210139002","display_name":"Powertech Labs (Canada)","ror":"https://ror.org/045ygyt79","country_code":"CA","type":"company","lineage":["https://openalex.org/I4210139002"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Frederic Howell","raw_affiliation_strings":["Powertech Labs Inc.,12388 88 Ave, Surrey,BC,Canada,V3W 7R7","Powertech Labs Inc., 12388 88 Ave, Surrey, BC, Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Powertech Labs Inc.,12388 88 Ave, Surrey,BC,Canada,V3W 7R7","institution_ids":["https://openalex.org/I4210139002"]},{"raw_affiliation_string":"Powertech Labs Inc., 12388 88 Ave, Surrey, BC, Canada","institution_ids":["https://openalex.org/I4210139002"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.04862742,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7929105758666992},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6589479446411133},{"id":"https://openalex.org/keywords/inertia","display_name":"Inertia","score":0.5982949733734131},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.5650817155838013},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.5247198343276978},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.5002667903900146},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.5001668930053711},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4511161148548126},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4325532615184784},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.43067270517349243},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.42659685015678406},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.39813148975372314},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.35429298877716064},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34778499603271484},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16301295161247253},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15943506360054016},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09968236088752747},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09953579306602478},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08810865879058838}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7929105758666992},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6589479446411133},{"id":"https://openalex.org/C110407247","wikidata":"https://www.wikidata.org/wiki/Q122508","display_name":"Inertia","level":2,"score":0.5982949733734131},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.5650817155838013},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.5247198343276978},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.5002667903900146},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.5001668930053711},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4511161148548126},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4325532615184784},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.43067270517349243},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.42659685015678406},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.39813148975372314},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.35429298877716064},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34778499603271484},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16301295161247253},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15943506360054016},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09968236088752747},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09953579306602478},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08810865879058838},{"id":"https://openalex.org/C74650414","wikidata":"https://www.wikidata.org/wiki/Q11397","display_name":"Classical mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isgt45199.2020.9087682","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isgt45199.2020.9087682","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE Power & Energy Society Innovative Smart Grid Technologies Conference (ISGT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1971185369","https://openalex.org/W2068945249","https://openalex.org/W2100711682","https://openalex.org/W2131717373","https://openalex.org/W2145616301","https://openalex.org/W2147608301","https://openalex.org/W2147814355","https://openalex.org/W2552928992","https://openalex.org/W2785760110","https://openalex.org/W2786403568","https://openalex.org/W2888566096","https://openalex.org/W2888737126","https://openalex.org/W6667712418"],"related_works":["https://openalex.org/W2155019192","https://openalex.org/W1979758163","https://openalex.org/W2014709025","https://openalex.org/W2766970861","https://openalex.org/W2294490033","https://openalex.org/W2316958959","https://openalex.org/W3174436460","https://openalex.org/W2056500914","https://openalex.org/W2315956789","https://openalex.org/W837744586"],"abstract_inverted_index":{"This":[0,33],"paper":[1],"introduces":[2],"Peak":[3],"Reliability":[4],"(`PEAK'),":[5],"online":[6],"transient":[7],"stability":[8,54],"analysis":[9],"tool":[10],"(TSAT)":[11],"that":[12],"has":[13],"been":[14],"successfully":[15],"running":[16],"on":[17],"a":[18,87],"large":[19],"scale":[20],"West":[21],"wide":[22],"System":[23],"Model":[24],"(WSM)":[25],"in":[26,76],"the":[27,64,77],"control":[28],"room":[29],"since":[30],"late":[31],"2017.":[32],"new":[34],"tool,":[35],"henceforth":[36],"abbreviated":[37],"as":[38],"`WSM-TSAT',":[39],"was":[40],"implemented":[41],"for":[42,63,86],"applications":[43],"of":[44],"system":[45,58,90],"model":[46],"validation":[47],"(MOD-033),":[48],"dynamic":[49],"RAS":[50],"interaction":[51],"monitoring,":[52],"IROL/system":[53],"limit":[55],"calculation,":[56],"and":[57,71,81],"inertia/frequency":[59],"response":[60],"real-time":[61],"assessment":[62],"Western":[65],"Interconnection":[66],"(WI).":[67],"Practical":[68],"implementation":[69],"experience":[70],"lessons":[72],"learned":[73],"are":[74,84],"presented":[75],"paper.":[78],"WSM-TSAT":[79],"simulation":[80],"study":[82],"results":[83],"provided":[85],"few":[88],"major":[89],"events.":[91]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}