{"id":"https://openalex.org/W2164612707","doi":"https://doi.org/10.1109/isese.2002.1166927","title":"Estimating mixed software reliability models based on the EM algorithm","display_name":"Estimating mixed software reliability models based on the EM algorithm","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2164612707","doi":"https://doi.org/10.1109/isese.2002.1166927","mag":"2164612707"},"language":"en","primary_location":{"id":"doi:10.1109/isese.2002.1166927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isese.2002.1166927","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings International Symposium on Empirical Software Engineering","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023917662","display_name":"Hiroyuki Okamura","orcid":"https://orcid.org/0000-0001-6881-0593"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"H. Okamura","raw_affiliation_strings":["Department of Information Engineering, Graduate School of Engineering, Hiroshima University, Higashihiroshima, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Graduate School of Engineering, Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101613849","display_name":"Yasuhiro Watanabe","orcid":"https://orcid.org/0009-0009-3198-8078"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Watanabe","raw_affiliation_strings":["Department of Information Engineering, Graduate School of Engineering, Hiroshima University, Higashihiroshima, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Graduate School of Engineering, Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077724142","display_name":"Tadashi Dohi","orcid":"https://orcid.org/0000-0003-2954-0388"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"T. Dohi","raw_affiliation_strings":["Department of Information Engineering, Graduate School of Engineering, Hiroshima University, Higashihiroshima, Japan"],"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Graduate School of Engineering, Hiroshima University, Higashihiroshima, Japan","institution_ids":["https://openalex.org/I113306721"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5023917662"],"corresponding_institution_ids":["https://openalex.org/I113306721"],"apc_list":null,"apc_paid":null,"fwci":3.3719,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.92693498,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"69","last_page":"78"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9549000263214111,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.742003858089447},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.6534588932991028},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5836713314056396},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4734577536582947},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.4723922908306122},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44490036368370056},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4259323477745056},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.20732471346855164},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.1550082564353943},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08906599879264832}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.742003858089447},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.6534588932991028},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5836713314056396},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4734577536582947},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.4723922908306122},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44490036368370056},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4259323477745056},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.20732471346855164},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.1550082564353943},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08906599879264832},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isese.2002.1166927","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isese.2002.1166927","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings International Symposium on Empirical Software Engineering","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":42,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W625509508","https://openalex.org/W1523596170","https://openalex.org/W1554758995","https://openalex.org/W1968903302","https://openalex.org/W1980595883","https://openalex.org/W1982161663","https://openalex.org/W1999987370","https://openalex.org/W2000297466","https://openalex.org/W2007595806","https://openalex.org/W2024793058","https://openalex.org/W2036810709","https://openalex.org/W2047164750","https://openalex.org/W2049633694","https://openalex.org/W2053742104","https://openalex.org/W2058815839","https://openalex.org/W2078533963","https://openalex.org/W2098037992","https://openalex.org/W2108193906","https://openalex.org/W2112961043","https://openalex.org/W2117039703","https://openalex.org/W2123838014","https://openalex.org/W2137209303","https://openalex.org/W2142635246","https://openalex.org/W2149091499","https://openalex.org/W2153033877","https://openalex.org/W2153242493","https://openalex.org/W2159890123","https://openalex.org/W2165238463","https://openalex.org/W2168175751","https://openalex.org/W2168479209","https://openalex.org/W2171242934","https://openalex.org/W2317912355","https://openalex.org/W2491546792","https://openalex.org/W2517473813","https://openalex.org/W2759785425","https://openalex.org/W2914956942","https://openalex.org/W4212891423","https://openalex.org/W6659668871","https://openalex.org/W6684845054","https://openalex.org/W6726483135","https://openalex.org/W7048738093"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W2382583096","https://openalex.org/W147463599"],"abstract_inverted_index":{"This":[0],"paper":[1],"considers":[2],"the":[3,18,29,46,57,62,69,72,76,79,83],"mixture":[4],"models":[5,10],"to":[6],"unify":[7],"software":[8,22,88],"reliability":[9],"(SRMs).":[11],"The":[12],"modeling":[13],"framework":[14],"is":[15],"based":[16,60],"on":[17,61],"randomization":[19],"of":[20,71,78],"a":[21],"fault":[23],"detection":[24],"rate.":[25],"Our":[26],"models,":[27],"called":[28],"mixed":[30,58,80],"SRMs":[31,39,59,81],"in":[32],"this":[33],"paper,":[34],"can":[35],"include":[36],"some":[37],"existing":[38],"such":[40],"as":[41],"Littlewood":[42],"NHPP":[43],"model":[44],"and":[45,66,75],"hyperexponential":[47],"SRM.":[48],"We":[49],"develop":[50],"an":[51],"efficient":[52],"parameter":[53],"estimation":[54],"algorithm":[55,74],"for":[56],"EM":[63,73],"(Expectation-Maximization)":[64],"principle,":[65],"investigate":[67],"both":[68],"effectiveness":[70],"validity":[77],"through":[82],"numerical":[84],"examples":[85],"with":[86],"real":[87],"failure":[89],"data.":[90]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}