{"id":"https://openalex.org/W3162388065","doi":"https://doi.org/10.1109/ises50453.2020.00038","title":"Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis","display_name":"Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis","publication_year":2020,"publication_date":"2020-12-01","ids":{"openalex":"https://openalex.org/W3162388065","doi":"https://doi.org/10.1109/ises50453.2020.00038","mag":"3162388065"},"language":"en","primary_location":{"id":"doi:10.1109/ises50453.2020.00038","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ises50453.2020.00038","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053653686","display_name":"Lang Lin","orcid":"https://orcid.org/0000-0001-7432-6722"},"institutions":[{"id":"https://openalex.org/I21160419","display_name":"Ansys (United States)","ror":"https://ror.org/05cf5b117","country_code":"US","type":"company","lineage":["https://openalex.org/I21160419"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Lang Lin","raw_affiliation_strings":["Semiconductor Unit, ANSYS Inc, USA"],"affiliations":[{"raw_affiliation_string":"Semiconductor Unit, ANSYS Inc, USA","institution_ids":["https://openalex.org/I21160419"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080529396","display_name":"Dinesh Selvakumaran","orcid":null},"institutions":[{"id":"https://openalex.org/I21160419","display_name":"Ansys (United States)","ror":"https://ror.org/05cf5b117","country_code":"US","type":"company","lineage":["https://openalex.org/I21160419"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dinesh Selvakumaran","raw_affiliation_strings":["Semiconductor Unit, ANSYS Inc, USA"],"affiliations":[{"raw_affiliation_string":"Semiconductor Unit, ANSYS Inc, USA","institution_ids":["https://openalex.org/I21160419"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050363606","display_name":"Deqi Zhu","orcid":null},"institutions":[{"id":"https://openalex.org/I21160419","display_name":"Ansys (United States)","ror":"https://ror.org/05cf5b117","country_code":"US","type":"company","lineage":["https://openalex.org/I21160419"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Deqi Zhu","raw_affiliation_strings":["Semiconductor Unit, ANSYS Inc, USA"],"affiliations":[{"raw_affiliation_string":"Semiconductor Unit, ANSYS Inc, USA","institution_ids":["https://openalex.org/I21160419"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070536710","display_name":"Norman Chang","orcid":"https://orcid.org/0000-0003-2524-0935"},"institutions":[{"id":"https://openalex.org/I21160419","display_name":"Ansys (United States)","ror":"https://ror.org/05cf5b117","country_code":"US","type":"company","lineage":["https://openalex.org/I21160419"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Norman Chang","raw_affiliation_strings":["Semiconductor Unit, ANSYS Inc, USA"],"affiliations":[{"raw_affiliation_string":"Semiconductor Unit, ANSYS Inc, USA","institution_ids":["https://openalex.org/I21160419"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068322489","display_name":"Calvin Chow","orcid":"https://orcid.org/0000-0002-8938-966X"},"institutions":[{"id":"https://openalex.org/I21160419","display_name":"Ansys (United States)","ror":"https://ror.org/05cf5b117","country_code":"US","type":"company","lineage":["https://openalex.org/I21160419"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Calvin Chow","raw_affiliation_strings":["Semiconductor Unit, ANSYS Inc, USA"],"affiliations":[{"raw_affiliation_string":"Semiconductor Unit, ANSYS Inc, USA","institution_ids":["https://openalex.org/I21160419"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070370721","display_name":"Makoto Nagata","orcid":"https://orcid.org/0000-0002-0625-9107"},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Nagata","raw_affiliation_strings":["Graduate School of Science, Technology and Innovation, Kobe University, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Science, Technology and Innovation, Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021790530","display_name":"Kazuki Monta","orcid":"https://orcid.org/0000-0003-1590-4822"},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuki Monta","raw_affiliation_strings":["Graduate School of Science, Technology and Innovation, Kobe University, Japan"],"affiliations":[{"raw_affiliation_string":"Graduate School of Science, Technology and Innovation, Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5053653686"],"corresponding_institution_ids":["https://openalex.org/I21160419"],"apc_list":null,"apc_paid":null,"fwci":0.6628,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.77133276,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"133","last_page":"138"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10951","display_name":"Cryptographic Implementations and Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11424","display_name":"Security and Verification in Computing","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/side-channel-attack","display_name":"Side channel attack","score":0.860129177570343},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6055216193199158},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5954334735870361},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5046828985214233},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4935866594314575},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4676019549369812},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.4449477195739746},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32634544372558594},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2895869016647339},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.22022497653961182},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15157273411750793},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.08963283896446228}],"concepts":[{"id":"https://openalex.org/C49289754","wikidata":"https://www.wikidata.org/wiki/Q2267081","display_name":"Side channel attack","level":3,"score":0.860129177570343},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6055216193199158},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5954334735870361},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5046828985214233},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4935866594314575},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4676019549369812},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.4449477195739746},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32634544372558594},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2895869016647339},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.22022497653961182},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15157273411750793},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.08963283896446228},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ises50453.2020.00038","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ises50453.2020.00038","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1520194899","https://openalex.org/W1548571590","https://openalex.org/W1607006990","https://openalex.org/W1984655843","https://openalex.org/W2011233216","https://openalex.org/W2053666879","https://openalex.org/W2140475081","https://openalex.org/W2144630005","https://openalex.org/W2154909745","https://openalex.org/W2604388769","https://openalex.org/W2745693247","https://openalex.org/W2902086429","https://openalex.org/W3001499944","https://openalex.org/W3030260606","https://openalex.org/W3035863582","https://openalex.org/W3036190363","https://openalex.org/W3086904882","https://openalex.org/W3103137679","https://openalex.org/W3105103435","https://openalex.org/W3158285714","https://openalex.org/W4231098049","https://openalex.org/W6636192615","https://openalex.org/W6681009213","https://openalex.org/W6682554491","https://openalex.org/W6778481387","https://openalex.org/W6783019539"],"related_works":["https://openalex.org/W4323824501","https://openalex.org/W3014521742","https://openalex.org/W2355552010","https://openalex.org/W2136687465","https://openalex.org/W3016859066","https://openalex.org/W2617868873","https://openalex.org/W4200321003","https://openalex.org/W3204141294","https://openalex.org/W5280335","https://openalex.org/W4386230336"],"abstract_inverted_index":{"Side-channel":[0],"attacks":[1],"can":[2,28],"non-invasively":[3],"extract":[4],"secret":[5,31],"information":[6],"from":[7],"hardware":[8],"devices":[9],"with":[10,198],"a":[11,25,89,115,139,153,164],"large":[12],"number":[13],"of":[14,24,59,74,132,192,206],"\u201cside-channel\u201d":[15],"measurements.":[16],"For":[17],"example,":[18],"measuring":[19],"the":[20,30,39,45,72,75,79,96,147,159,203],"dynamic":[21,107],"voltage":[22],"drop":[23],"cryptographic":[26],"chip":[27,166],"disclose":[29],"keys":[32],"by":[33,209],"power-noise":[34,61,99,108,142],"side-channel":[35,49,62,109,133,207],"emission.":[36],"To":[37,104],"identify":[38],"design":[40,46,51,150],"vulnerabilities":[41],"and":[42,67,78,91,178],"to":[43,71,125,128,144,201],"verify":[44],"countermeasures":[47],"against":[48],"attacks,":[50],"time":[52,113],"simulation":[53,58,77,93,211],"tools":[54],"are":[55,64],"required.":[56],"However,":[57],"these":[60],"emissions":[63],"highly":[65],"complex":[66],"computationally":[68],"intensive":[69],"due":[70],"scale":[73],"time-domain":[76],"multi-physics":[80],"models":[81],"involved.":[82],"In":[83],"this":[84],"paper,":[85],"we":[86,136,156],"have":[87,137,157,195],"proposed":[88,160],"fast":[90,106],"comprehensive":[92],"methodology":[94,162],"for":[95],"layout":[97,149],"based":[98,175],"Side-Channel":[100],"Leakage":[101],"Analysis":[102],"(SCLA).":[103],"enable":[105],"emission":[110],"simulations":[111],"in":[112,185,190],"domain,":[114],"novel":[116],"Direct":[117],"Vector":[118],"Control":[119],"(DVC)":[120],"method":[121],"is":[122],"precisely":[123],"applied":[124],"security-sensitive":[126],"nets":[127],"capture":[129],"all":[130],"sources":[131],"leakage.":[134],"Further,":[135],"enabled":[138],"location":[140],"dependent":[141],"SCLA":[143,161],"root":[145],"cause":[146],"potential":[148],"weakness.":[151],"As":[152],"case":[154],"study,":[155],"validated":[158],"on":[163],"test":[165],"which":[167],"has":[168],"two":[169],"128-bit":[170],"AES":[171],"ASIC":[172],"implementations":[173],"(CMOS":[174],"standard-cell":[176],"logic":[177],"Wave":[179],"Dynamic":[180],"Differential":[181],"Logic":[182],"(WDDL))":[183],"embedded":[184],"it.":[186],"Both":[187],"Simulation":[188],"results":[189],"terms":[191],"measurement-to-disclosure":[193],"(MTD)":[194],"been":[196],"correlated":[197],"silicon":[199],"measurements":[200],"demonstrate":[202],"accurate":[204],"detection":[205],"leakage":[208],"our":[210],"framework.":[212]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}