{"id":"https://openalex.org/W1606799882","doi":"https://doi.org/10.1109/isce.2015.7177787","title":"Post-processing to reduce missing wedge effect using total variation minimization","display_name":"Post-processing to reduce missing wedge effect using total variation minimization","publication_year":2015,"publication_date":"2015-06-01","ids":{"openalex":"https://openalex.org/W1606799882","doi":"https://doi.org/10.1109/isce.2015.7177787","mag":"1606799882"},"language":"en","primary_location":{"id":"doi:10.1109/isce.2015.7177787","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isce.2015.7177787","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 International Symposium on Consumer Electronics (ISCE)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060777401","display_name":"Kyung-Chan Jin","orcid":null},"institutions":[{"id":"https://openalex.org/I89004649","display_name":"Korea Institute of Industrial Technology","ror":"https://ror.org/04qfph657","country_code":"KR","type":"other","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098","https://openalex.org/I89004649"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Kyung-Chan Jin","raw_affiliation_strings":["Manufacturing Systems, Korea Institute of Industrial Tech., Choenan, South Korea"],"affiliations":[{"raw_affiliation_string":"Manufacturing Systems, Korea Institute of Industrial Tech., Choenan, South Korea","institution_ids":["https://openalex.org/I89004649"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102061979","display_name":"Yun-Ho Song","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yun-Ho Song","raw_affiliation_strings":["Nano Electron-Source Creative Research Center, Elec. and Telecomm. Research Institute, Daegeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Nano Electron-Source Creative Research Center, Elec. and Telecomm. Research Institute, Daegeon, South Korea","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005315436","display_name":"Geun-Hee Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I4210139925","display_name":"Korea Basic Science Institute","ror":"https://ror.org/0417sdw47","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2801339556","https://openalex.org/I4210139925","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Geun-Hee Kim","raw_affiliation_strings":["Center of Anal. Instr. Development, Korea Basic Science Institute, Daegeon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center of Anal. Instr. Development, Korea Basic Science Institute, Daegeon, South Korea","institution_ids":["https://openalex.org/I4210139925"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5060777401"],"corresponding_institution_ids":["https://openalex.org/I89004649"],"apc_list":null,"apc_paid":null,"fwci":0.1973,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.56432306,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"137","issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wedge","display_name":"Wedge (geometry)","score":0.7983584403991699},{"id":"https://openalex.org/keywords/missing-data","display_name":"Missing data","score":0.6049368977546692},{"id":"https://openalex.org/keywords/minification","display_name":"Minification","score":0.5836641192436218},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5498596429824829},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5445539951324463},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5415381193161011},{"id":"https://openalex.org/keywords/oblique-case","display_name":"Oblique case","score":0.5080406665802002},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4283858835697174},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.4165344834327698},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.25958144664764404},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.24313420057296753},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17138761281967163}],"concepts":[{"id":"https://openalex.org/C47422493","wikidata":"https://www.wikidata.org/wiki/Q2755127","display_name":"Wedge (geometry)","level":2,"score":0.7983584403991699},{"id":"https://openalex.org/C9357733","wikidata":"https://www.wikidata.org/wiki/Q6878417","display_name":"Missing data","level":2,"score":0.6049368977546692},{"id":"https://openalex.org/C147764199","wikidata":"https://www.wikidata.org/wiki/Q6865248","display_name":"Minification","level":2,"score":0.5836641192436218},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5498596429824829},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5445539951324463},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5415381193161011},{"id":"https://openalex.org/C160697094","wikidata":"https://www.wikidata.org/wiki/Q1233197","display_name":"Oblique case","level":2,"score":0.5080406665802002},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4283858835697174},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.4165344834327698},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.25958144664764404},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.24313420057296753},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17138761281967163},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isce.2015.7177787","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isce.2015.7177787","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 International Symposium on Consumer Electronics (ISCE)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2005089986","https://openalex.org/W2048401914","https://openalex.org/W2060848059","https://openalex.org/W2163973643","https://openalex.org/W6684002821"],"related_works":["https://openalex.org/W2385104873","https://openalex.org/W2150654092","https://openalex.org/W3024870410","https://openalex.org/W2410652950","https://openalex.org/W4380150146","https://openalex.org/W3001809259","https://openalex.org/W4283773154","https://openalex.org/W3139174110","https://openalex.org/W4289597203","https://openalex.org/W1600457464"],"abstract_inverted_index":{"The":[0],"use":[1,52,87],"of":[2,21,53,62,88,122],"X-ray":[3,27],"inspection":[4,28],"for":[5,29],"analyzing":[6],"faults":[7],"in":[8,56,77],"printed":[9],"circuit":[10],"board":[11],"components":[12,55],"is":[13,115],"becoming":[14],"more":[15],"important":[16],"with":[17,157],"the":[18,51,60,68,86,92,111,119,123,134,140,146],"ongoing":[19],"development":[20],"3D":[22,79],"integrated":[23],"circuits.":[24],"Achieving":[25],"optimal":[26],"a":[30],"slab-like":[31],"flat":[32,54],"object":[33],"depends":[34],"on":[35],"selecting":[36],"an":[37,45],"appropriate":[38],"computed":[39],"tomography":[40],"(CT)":[41],"geometry,":[42],"such":[43],"as":[44],"off-centered":[46],"cone-beam":[47],"geometry.":[48],"However,":[49],"because":[50],"tomographic":[57],"reconstruction":[58,132],"restricts":[59],"range":[61,114],"viewing":[63,108],"angles,":[64],"CT":[65,125],"leads":[66],"to":[67,90,154],"missing":[69,74,93,141],"wedge":[70,94,142],"problem,":[71],"which":[72],"causes":[73],"angle":[75],"artifacts":[76],"reconstructed":[78],"data.":[80],"In":[81],"this":[82],"paper,":[83],"we":[84],"propose":[85],"post-processing":[89],"reduce":[91],"effect":[95,143],"via":[96],"total":[97],"variation":[98],"minimization,":[99],"when":[100],"sinogram":[101],"images":[102],"have":[103],"equal":[104],"quality":[105,152],"at":[106],"all":[107],"angles":[109],"and":[110,144],"accessible":[112],"tilt":[113],"restricted":[116],"only":[117],"by":[118],"physical":[120],"limits":[121],"oblique-view":[124],"system.":[126],"We":[127],"demonstrate":[128],"that":[129,145,155],"axial":[130],"slice":[131],"using":[133],"proposed":[135,147],"processing":[136],"method":[137,148],"substantially":[138],"reduces":[139],"provides":[149],"overall":[150],"image":[151],"superior":[153],"achieved":[156],"existing":[158],"denoising":[159],"methods.":[160]},"counts_by_year":[{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}