{"id":"https://openalex.org/W7165123534","doi":"https://doi.org/10.1109/iscas66217.2026.11563025","title":"Hierarchical Fault Mitigation Architecture in Radiation-Hardened STT-MRAM","display_name":"Hierarchical Fault Mitigation Architecture in Radiation-Hardened STT-MRAM","publication_year":2026,"publication_date":"2026-05-24","ids":{"openalex":"https://openalex.org/W7165123534","doi":"https://doi.org/10.1109/iscas66217.2026.11563025"},"language":null,"primary_location":{"id":"doi:10.1109/iscas66217.2026.11563025","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas66217.2026.11563025","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017721619","display_name":"Yantong Di","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yantong Di","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138944981","display_name":"Haoran Du","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoran Du","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100656710","display_name":"Yibo Liu","orcid":"https://orcid.org/0000-0002-3474-3908"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yibo Liu","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082279954","display_name":"H M Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huanghui Wang","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138943176","display_name":"Wen Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wen Wang","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138895706","display_name":"Jingchao Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingchao Zhang","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138886383","display_name":"Chao Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Ma","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138863347","display_name":"Bo Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bo Liu","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5138953541","display_name":"Hao Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Cai","raw_affiliation_strings":["Southeast University,School of Integrated Circuits,Nanjing,China,210096"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,School of Integrated Circuits,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.7646219,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"2803","last_page":"2807"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6814000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6814000010490417,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.07840000092983246,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.05460000038146973,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.3978999853134155},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.3346000015735626},{"id":"https://openalex.org/keywords/systems-architecture","display_name":"Systems architecture","score":0.3091000020503998},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.2921999990940094},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.2694000005722046}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5539000034332275},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.3978999853134155},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.3346000015735626},{"id":"https://openalex.org/C98025372","wikidata":"https://www.wikidata.org/wiki/Q477538","display_name":"Systems architecture","level":3,"score":0.3091000020503998},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2921999990940094},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27720001339912415},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2743000090122223},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.2694000005722046},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.26649999618530273},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.26440000534057617},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.2500999867916107}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas66217.2026.11563025","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas66217.2026.11563025","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6934373378753662,"id":"https://metadata.un.org/sdg/13","display_name":"Climate action"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1975904824","https://openalex.org/W1996171855","https://openalex.org/W2023856022","https://openalex.org/W2120330712","https://openalex.org/W2121052741","https://openalex.org/W2124843111","https://openalex.org/W2131271035","https://openalex.org/W2141068710","https://openalex.org/W2148071019","https://openalex.org/W2277230396","https://openalex.org/W2303314981","https://openalex.org/W2802865644","https://openalex.org/W2977046634","https://openalex.org/W2980855339","https://openalex.org/W2990800025","https://openalex.org/W3113755556","https://openalex.org/W3143207446","https://openalex.org/W3149326353","https://openalex.org/W3159674372","https://openalex.org/W4206901801","https://openalex.org/W4388967015","https://openalex.org/W4391622518","https://openalex.org/W4404484667","https://openalex.org/W4411725239","https://openalex.org/W7113898685"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-06-19T00:00:00"}