{"id":"https://openalex.org/W7165121370","doi":"https://doi.org/10.1109/iscas66217.2026.11562995","title":"64-Point Radix-4 fast Fourier transform (FFT) Implementation in an 8 \u00d7 4 1T1R RRAM Array","display_name":"64-Point Radix-4 fast Fourier transform (FFT) Implementation in an 8 \u00d7 4 1T1R RRAM Array","publication_year":2026,"publication_date":"2026-05-24","ids":{"openalex":"https://openalex.org/W7165121370","doi":"https://doi.org/10.1109/iscas66217.2026.11562995"},"language":null,"primary_location":{"id":"doi:10.1109/iscas66217.2026.11562995","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas66217.2026.11562995","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5138889846","display_name":"Siyuan Jia","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Siyuan Jia","raw_affiliation_strings":["RWTH Aachen,Institute of Materials in Electrical Engineering and Information Technology II,Aachen,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RWTH Aachen,Institute of Materials in Electrical Engineering and Information Technology II,Aachen,Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138927236","display_name":"Xiaohua Liu","orcid":null},"institutions":[{"id":"https://openalex.org/I2799978770","display_name":"X-Fab (Germany)","ror":"https://ror.org/030bh9196","country_code":"DE","type":"company","lineage":["https://openalex.org/I2799978770"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Xiaohua Liu","raw_affiliation_strings":["Forschungszentrum J&#x00FC;lich GmbH,Peter Gr&#x00FC;nberg Institute (PGI-7),J&#x00FC;lich,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum J&#x00FC;lich GmbH,Peter Gr&#x00FC;nberg Institute (PGI-7),J&#x00FC;lich,Germany","institution_ids":["https://openalex.org/I2799978770"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138850774","display_name":"Rainer Waser","orcid":null},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rainer Waser","raw_affiliation_strings":["RWTH Aachen,Institute of Materials in Electrical Engineering and Information Technology II,Aachen,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RWTH Aachen,Institute of Materials in Electrical Engineering and Information Technology II,Aachen,Germany","institution_ids":["https://openalex.org/I887968799"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078615149","display_name":"Stefan Wiefels","orcid":"https://orcid.org/0000-0003-2820-9677"},"institutions":[{"id":"https://openalex.org/I2799978770","display_name":"X-Fab (Germany)","ror":"https://ror.org/030bh9196","country_code":"DE","type":"company","lineage":["https://openalex.org/I2799978770"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stefan Wiefels","raw_affiliation_strings":["Forschungszentrum J&#x00FC;lich GmbH,Peter Gr&#x00FC;nberg Institute (PGI-7),J&#x00FC;lich,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum J&#x00FC;lich GmbH,Peter Gr&#x00FC;nberg Institute (PGI-7),J&#x00FC;lich,Germany","institution_ids":["https://openalex.org/I2799978770"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070287728","display_name":"Stephan Menzel","orcid":"https://orcid.org/0000-0002-4258-2673"},"institutions":[{"id":"https://openalex.org/I2799978770","display_name":"X-Fab (Germany)","ror":"https://ror.org/030bh9196","country_code":"DE","type":"company","lineage":["https://openalex.org/I2799978770"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Stephan Menzel","raw_affiliation_strings":["Forschungszentrum J&#x00FC;lich GmbH,Peter Gr&#x00FC;nberg Institute (PGI-7),J&#x00FC;lich,Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Forschungszentrum J&#x00FC;lich GmbH,Peter Gr&#x00FC;nberg Institute (PGI-7),J&#x00FC;lich,Germany","institution_ids":["https://openalex.org/I2799978770"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.76386596,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"2440","last_page":"2444"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10232","display_name":"Optical Network Technologies","score":0.6661999821662903,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10232","display_name":"Optical Network Technologies","score":0.6661999821662903,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.03460000082850456,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11034","display_name":"Digital Filter Design and Implementation","score":0.031300000846385956,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.3700999915599823},{"id":"https://openalex.org/keywords/fourier-transform","display_name":"Fourier transform","score":0.3174999952316284},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.3043000102043152},{"id":"https://openalex.org/keywords/fast-fourier-transform","display_name":"Fast Fourier transform","score":0.29580000042915344},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.27379998564720154}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4537000060081482},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4426000118255615},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.3700999915599823},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33809998631477356},{"id":"https://openalex.org/C102519508","wikidata":"https://www.wikidata.org/wiki/Q6520159","display_name":"Fourier transform","level":2,"score":0.3174999952316284},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.3043000102043152},{"id":"https://openalex.org/C75172450","wikidata":"https://www.wikidata.org/wiki/Q623950","display_name":"Fast Fourier transform","level":2,"score":0.29580000042915344},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29420000314712524},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.27379998564720154},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.27129998803138733},{"id":"https://openalex.org/C57733114","wikidata":"https://www.wikidata.org/wiki/Q1006032","display_name":"Discrete Fourier transform (general)","level":5,"score":0.2689000070095062},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2685999870300293},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26440000534057617},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.2628999948501587},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.2590999901294708},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.2556000053882599}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas66217.2026.11562995","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas66217.2026.11562995","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.49088573455810547,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W2074357625","https://openalex.org/W2154231179","https://openalex.org/W2776589185","https://openalex.org/W2972825382","https://openalex.org/W3081302630","https://openalex.org/W3085709740","https://openalex.org/W4207063504","https://openalex.org/W4210530509","https://openalex.org/W4214557309","https://openalex.org/W4243672348","https://openalex.org/W4292121737","https://openalex.org/W4324378493","https://openalex.org/W4386736788","https://openalex.org/W4386880198","https://openalex.org/W4401568812","https://openalex.org/W4411472663","https://openalex.org/W4412375179","https://openalex.org/W4412713386"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-06-19T00:00:00"}
