{"id":"https://openalex.org/W7165170437","doi":"https://doi.org/10.1109/iscas66217.2026.11561936","title":"A CMOS E-band Noise-canceling Low Noise Amplifier with 4.5 dB Noise Figure","display_name":"A CMOS E-band Noise-canceling Low Noise Amplifier with 4.5 dB Noise Figure","publication_year":2026,"publication_date":"2026-05-24","ids":{"openalex":"https://openalex.org/W7165170437","doi":"https://doi.org/10.1109/iscas66217.2026.11561936"},"language":null,"primary_location":{"id":"doi:10.1109/iscas66217.2026.11561936","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas66217.2026.11561936","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113311023","display_name":"Lingtao Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lingtao Jiang","raw_affiliation_strings":["South China University of Technology,School of Microelectronics,Guangzhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"South China University of Technology,School of Microelectronics,Guangzhou,China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063752548","display_name":"Shangyao Huang","orcid":"https://orcid.org/0009-0002-8134-8705"},"institutions":[{"id":"https://openalex.org/I4210128412","display_name":"Beike Biotechnology (China)","ror":"https://ror.org/03fd44j44","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210128412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shangyao Huang","raw_affiliation_strings":["Shenzhen Jelicomm Co., Ltd,Shenzhen,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shenzhen Jelicomm Co., Ltd,Shenzhen,China","institution_ids":["https://openalex.org/I4210128412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022495651","display_name":"Xianfeng Que","orcid":"https://orcid.org/0000-0002-6241-2727"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianfeng Que","raw_affiliation_strings":["South China University of Technology,School of Microelectronics,Guangzhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"South China University of Technology,School of Microelectronics,Guangzhou,China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5138898237","display_name":"Bing Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bing Cai","raw_affiliation_strings":["South China University of Technology,School of Microelectronics,Guangzhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"South China University of Technology,School of Microelectronics,Guangzhou,China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5138932920","display_name":"Yanjie Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanjie Wang","raw_affiliation_strings":["South China University of Technology,School of Microelectronics,Guangzhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"South China University of Technology,School of Microelectronics,Guangzhou,China","institution_ids":["https://openalex.org/I90610280"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.77631051,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"16","last_page":"19"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.8808000087738037,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.8808000087738037,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.046300001442432404,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.014800000004470348,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.4722999930381775},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4643000066280365},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.4410000145435333},{"id":"https://openalex.org/keywords/noise-generator","display_name":"Noise generator","score":0.43959999084472656},{"id":"https://openalex.org/keywords/noise-figure-meter","display_name":"Noise-figure meter","score":0.4325999915599823},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.3984000086784363},{"id":"https://openalex.org/keywords/effective-input-noise-temperature","display_name":"Effective input noise temperature","score":0.3806999921798706},{"id":"https://openalex.org/keywords/flicker-noise","display_name":"Flicker noise","score":0.3785000145435333}],"concepts":[{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.47679999470710754},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.4722999930381775},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4643000066280365},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.4410000145435333},{"id":"https://openalex.org/C74342258","wikidata":"https://www.wikidata.org/wiki/Q2133526","display_name":"Noise generator","level":5,"score":0.43959999084472656},{"id":"https://openalex.org/C90166738","wikidata":"https://www.wikidata.org/wiki/Q7047656","display_name":"Noise-figure meter","level":5,"score":0.4325999915599823},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.43149998784065247},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4000999927520752},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.3984000086784363},{"id":"https://openalex.org/C12252657","wikidata":"https://www.wikidata.org/wiki/Q5347266","display_name":"Effective input noise temperature","level":5,"score":0.3806999921798706},{"id":"https://openalex.org/C113873419","wikidata":"https://www.wikidata.org/wiki/Q1410810","display_name":"Flicker noise","level":5,"score":0.3785000145435333},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.36419999599456787},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3610000014305115},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3303999900817871},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3221000134944916},{"id":"https://openalex.org/C52660251","wikidata":"https://www.wikidata.org/wiki/Q17083145","display_name":"Noise temperature","level":3,"score":0.320499986410141},{"id":"https://openalex.org/C166576357","wikidata":"https://www.wikidata.org/wiki/Q8045715","display_name":"Y-factor","level":5,"score":0.31700000166893005},{"id":"https://openalex.org/C14245642","wikidata":"https://www.wikidata.org/wiki/Q399804","display_name":"Preamplifier","level":4,"score":0.30160000920295715},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.29280000925064087},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.28060001134872437},{"id":"https://openalex.org/C100675267","wikidata":"https://www.wikidata.org/wiki/Q1371624","display_name":"Background noise","level":2,"score":0.2777000069618225},{"id":"https://openalex.org/C89123640","wikidata":"https://www.wikidata.org/wiki/Q1523756","display_name":"Instrumentation amplifier","level":5,"score":0.27709999680519104},{"id":"https://openalex.org/C187612029","wikidata":"https://www.wikidata.org/wiki/Q17083130","display_name":"Noise floor","level":4,"score":0.26840001344680786},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.26600000262260437},{"id":"https://openalex.org/C142083831","wikidata":"https://www.wikidata.org/wiki/Q2926532","display_name":"Burst noise","level":5,"score":0.2655999958515167},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.2630999982357025}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas66217.2026.11561936","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas66217.2026.11561936","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.564441442489624,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2143948542","https://openalex.org/W3012161122","https://openalex.org/W3127203506","https://openalex.org/W3134601120","https://openalex.org/W3203030749","https://openalex.org/W4226513698","https://openalex.org/W4285065840","https://openalex.org/W4385337851","https://openalex.org/W4390788356","https://openalex.org/W4408519632","https://openalex.org/W4410492003"],"related_works":[],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2026-06-19T00:00:00"}