{"id":"https://openalex.org/W4400235169","doi":"https://doi.org/10.1109/iscas58744.2024.10558651","title":"All-Digital High-Resolution Frequency Measurement SoC for Rapid MEMS Readouts","display_name":"All-Digital High-Resolution Frequency Measurement SoC for Rapid MEMS Readouts","publication_year":2024,"publication_date":"2024-05-19","ids":{"openalex":"https://openalex.org/W4400235169","doi":"https://doi.org/10.1109/iscas58744.2024.10558651"},"language":"en","primary_location":{"id":"doi:10.1109/iscas58744.2024.10558651","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iscas58744.2024.10558651","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108925236","display_name":"Hitesh Kumar Sahu","orcid":null},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Hitesh Kumar Sahu","raw_affiliation_strings":["IIT Bombay,Department of Electrical Engineering,Mumbai,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIT Bombay,Department of Electrical Engineering,Mumbai,India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5092519466","display_name":"Emon Sarkar","orcid":null},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Emon Sarkar","raw_affiliation_strings":["IIT Bombay,Department of Electrical Engineering,Mumbai,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIT Bombay,Department of Electrical Engineering,Mumbai,India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093477164","display_name":"Pushkar Sathe","orcid":null},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Pushkar Sathe","raw_affiliation_strings":["IIT Bombay,Department of Electrical Engineering,Mumbai,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIT Bombay,Department of Electrical Engineering,Mumbai,India","institution_ids":["https://openalex.org/I162827531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5014129932","display_name":"Laxmeesha Somappa","orcid":"https://orcid.org/0000-0002-4330-3103"},"institutions":[{"id":"https://openalex.org/I162827531","display_name":"Indian Institute of Technology Bombay","ror":"https://ror.org/02qyf5152","country_code":"IN","type":"education","lineage":["https://openalex.org/I162827531"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Laxmeesha Somappa","raw_affiliation_strings":["IIT Bombay,Department of Electrical Engineering,Mumbai,India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IIT Bombay,Department of Electrical Engineering,Mumbai,India","institution_ids":["https://openalex.org/I162827531"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I162827531"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11104981,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.5378633141517639},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48401352763175964},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.178598552942276},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.13197413086891174}],"concepts":[{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.5378633141517639},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48401352763175964},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.178598552942276},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.13197413086891174}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas58744.2024.10558651","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iscas58744.2024.10558651","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W187099230","https://openalex.org/W654799228","https://openalex.org/W1549055430","https://openalex.org/W1608288008","https://openalex.org/W1964615589","https://openalex.org/W1971312784","https://openalex.org/W1972869596","https://openalex.org/W1979792591","https://openalex.org/W1996874179","https://openalex.org/W2002246236","https://openalex.org/W2007693829","https://openalex.org/W2013692566","https://openalex.org/W2060197691","https://openalex.org/W2092028533","https://openalex.org/W2105093937","https://openalex.org/W2120822374","https://openalex.org/W2140575501","https://openalex.org/W2167030572","https://openalex.org/W2219472191","https://openalex.org/W2414663953","https://openalex.org/W2494646569","https://openalex.org/W2507843741","https://openalex.org/W2513702809","https://openalex.org/W2518741856","https://openalex.org/W2579888408","https://openalex.org/W2609578273","https://openalex.org/W2766626786","https://openalex.org/W2773611323","https://openalex.org/W2804896529","https://openalex.org/W2811162328","https://openalex.org/W2943336588","https://openalex.org/W3010598465"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2272290532","https://openalex.org/W2120483398","https://openalex.org/W1530711136","https://openalex.org/W1763916368","https://openalex.org/W2319192085","https://openalex.org/W2391127530","https://openalex.org/W2390279801","https://openalex.org/W2045074154"],"abstract_inverted_index":{"This":[0],"work":[1],"proposes":[2],"an":[3],"all-digital":[4],"on-chip":[5],"digital":[6],"Frequency":[7],"measuring":[8,18],"system":[9],"(FMS)":[10],"that":[11,93],"is":[12,24],"intended":[13],"to":[14,124],"replace":[15],"conventional":[16],"low-resolution":[17],"instruments.":[19],"The":[20,66,81],"method":[21],"of":[22,84,114],"measurement":[23,59],"a":[25,29,34,55,76,88,101,111],"two-step":[26],"process":[27],"with":[28,110,121],"coarse":[30],"estimate":[31],"followed":[32],"by":[33],"fine":[35],"resolution":[36,109],"frequency":[37,58],"estimation":[38],"from":[39],"three":[40],"DFT":[41],"samples":[42],"using":[43],"the":[44,49,85,94],"Candan":[45],"method.":[46],"We":[47],"describe":[48],"design,":[50],"and":[51,73],"performance":[52],"evaluation,":[53],"as":[54],"high-resolution":[56],"rapid":[57],"system,":[60],"particularly":[61],"for":[62,118],"high-precision":[63],"MEMS":[64,119],"applications.":[65],"proposed":[67],"FMS":[68],"has":[69],"been":[70],"synthesized,":[71],"implemented":[72],"verified":[74],"on":[75,87],"Xilinx":[77],"ZYNQ":[78],"XC7Z020-1CLG400C":[79],"SoC.":[80],"ASIC":[82],"implementation":[83],"SoC":[86],"65nm":[89],"CMOS":[90],"technology":[91],"reveals":[92],"design":[95],"consumes":[96],"120":[97],"mW":[98],"power":[99],"at":[100],"100":[102],"MHz":[103],"clock":[104],"while":[105],"providing":[106],"sub-5":[107],"ppm":[108],"readout":[112],"time":[113],"5.7":[115],"\u03bcs,":[116],"suitable":[117],"applications":[120],"bandwidth":[122],"up":[123],"10":[125],"MHz.":[126]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}