{"id":"https://openalex.org/W4400232009","doi":"https://doi.org/10.1109/iscas58744.2024.10558401","title":"Exploring Error Correction Circuits on RISC-V based Systems for Space Applications","display_name":"Exploring Error Correction Circuits on RISC-V based Systems for Space Applications","publication_year":2024,"publication_date":"2024-05-19","ids":{"openalex":"https://openalex.org/W4400232009","doi":"https://doi.org/10.1109/iscas58744.2024.10558401"},"language":"en","primary_location":{"id":"doi:10.1109/iscas58744.2024.10558401","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas58744.2024.10558401","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5014626587","display_name":"Nazim Altar Koca","orcid":null},"institutions":[{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]},{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Nazim Altar Koca","raw_affiliation_strings":["A*STAR (Agency for Science, Technology and Research),Institute of Microelectronics,Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"A*STAR (Agency for Science, Technology and Research),Institute of Microelectronics,Singapore","institution_ids":["https://openalex.org/I115228651","https://openalex.org/I4210090209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029335324","display_name":"Chip-Hong Chang","orcid":"https://orcid.org/0000-0002-8897-6176"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Chip Hong Chang","raw_affiliation_strings":["Nanyang Technological University,School of Electrical and Electronic Engineering,Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University,School of Electrical and Electronic Engineering,Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101615706","display_name":"Anh Tuan","orcid":"https://orcid.org/0000-0002-8320-6818"},"institutions":[{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]},{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Anh Tuan Do","raw_affiliation_strings":["A*STAR (Agency for Science, Technology and Research),Institute of Microelectronics,Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"A*STAR (Agency for Science, Technology and Research),Institute of Microelectronics,Singapore","institution_ids":["https://openalex.org/I115228651","https://openalex.org/I4210090209"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036682724","display_name":"Vishnu P. Nambiar","orcid":"https://orcid.org/0000-0001-5570-5911"},"institutions":[{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]},{"id":"https://openalex.org/I4210090209","display_name":"Institute of Microelectronics","ror":"https://ror.org/009rw8n36","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210090209","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Vishnu P. Nambiar","raw_affiliation_strings":["A*STAR (Agency for Science, Technology and Research),Institute of Microelectronics,Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"A*STAR (Agency for Science, Technology and Research),Institute of Microelectronics,Singapore","institution_ids":["https://openalex.org/I115228651","https://openalex.org/I4210090209"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.964900016784668,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12449","display_name":"Spacecraft Design and Technology","score":0.9638000130653381,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7078920602798462},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5270595550537109},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4625396728515625},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.18326669931411743},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.17127686738967896},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12709251046180725}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7078920602798462},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5270595550537109},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4625396728515625},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.18326669931411743},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.17127686738967896},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12709251046180725}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas58744.2024.10558401","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas58744.2024.10558401","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1971144063","https://openalex.org/W1980073965","https://openalex.org/W2021708499","https://openalex.org/W2099569658","https://openalex.org/W2150025103","https://openalex.org/W2294537163","https://openalex.org/W2770369928","https://openalex.org/W2944339534","https://openalex.org/W3023961462","https://openalex.org/W3025260258","https://openalex.org/W3041000665","https://openalex.org/W4310731691","https://openalex.org/W6987144925"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W2382290278","https://openalex.org/W4395014643"],"abstract_inverted_index":{"RISC-V":[0,49,75],"systems":[1],"are":[2],"becoming":[3],"increasingly":[4],"adopted":[5],"in":[6,48],"space":[7],"applications.":[8],"SRAM":[9,29,170],"(Static":[10],"Random-Access":[11],"Memory)":[12],"data":[13,122],"memory":[14,46,101],"is":[15,30,137],"a":[16,21,94,106],"critical":[17],"component":[18],"that":[19],"occupies":[20],"large":[22],"portion":[23],"of":[24,84,135,156,168],"the":[25,61,79,125,132,141,151,165,169],"processor":[26],"peripheral":[27],"system.":[28,76],"vulnerable":[31],"to":[32,68,110,123,139],"single-event":[33],"upsets":[34],"(SEUs).":[35],"Existing":[36],"studies":[37],"mainly":[38],"considered":[39],"Hamming":[40,176],"error":[41,108,142,166],"correction":[42],"codes":[43],"(ECCs)":[44],"for":[45,74,131],"protection":[47,102],"processor.":[50],"In":[51],"this":[52],"paper,":[53],"we":[54,92],"explore":[55],"different":[56,112],"ECCs":[57],"as":[58,60,66],"well":[59],"triple":[62],"modular":[63,96],"redundancy":[64,97],"(TMR)":[65],"solutions":[67],"mitigate":[69],"SEU":[70],"effects":[71],"on":[72],"SRAMs":[73,136],"To":[77],"overcome":[78],"area":[80,154],"and":[81,153,160,163,175],"power":[82,152],"overhead":[83,155],"TMR":[85,157],"with":[86,99,147,173],"higher":[87],"fault":[88],"tolerance":[89],"than":[90],"ECCs,":[91],"propose":[93],"dual":[95],"(DMR)":[98],"ECC":[100,148,177],"scheme.":[103],"We":[104],"conduct":[105],"comprehensive":[107],"analysis":[109],"evaluate":[111],"fault-tolerant":[113],"designs":[114],"under":[115],"various":[116],"radiation":[117],"attack":[118],"scenarios,":[119],"utilizing":[120],"real-world":[121],"devise":[124],"fault-injection":[126],"campaign.":[127],"An":[128],"efficient":[129],"scheduling":[130],"self-refresh":[133],"operation":[134],"proposed":[138,145],"prevent":[140],"accumulation.":[143],"The":[144],"DMR":[146],"design":[149],"reduces":[150],"by":[158],"28%":[159],"11%":[161],"respectively":[162],"improve":[164],"resilience":[167],"significantly":[171],"compared":[172],"Hsiao":[174],"schemes.":[178]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}