{"id":"https://openalex.org/W4411724765","doi":"https://doi.org/10.1109/iscas56072.2025.11044089","title":"A 6-bit Capacitance-to-Digital Converter with 690nJ/c-s FoM Based on Metal Oxide TFTs for Flexible Electronics","display_name":"A 6-bit Capacitance-to-Digital Converter with 690nJ/c-s FoM Based on Metal Oxide TFTs for Flexible Electronics","publication_year":2025,"publication_date":"2025-05-25","ids":{"openalex":"https://openalex.org/W4411724765","doi":"https://doi.org/10.1109/iscas56072.2025.11044089"},"language":"en","primary_location":{"id":"doi:10.1109/iscas56072.2025.11044089","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas56072.2025.11044089","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091134344","display_name":"Yixin Fu","orcid":null},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yixin Fu","raw_affiliation_strings":["Beijing Information Science and Technology University,Beijing,China,102206"],"affiliations":[{"raw_affiliation_string":"Beijing Information Science and Technology University,Beijing,China,102206","institution_ids":["https://openalex.org/I78675632"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046729236","display_name":"Zhixuan Wang","orcid":"https://orcid.org/0000-0002-1044-214X"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhixuan Wang","raw_affiliation_strings":["Peking University,School of Integrated Circuits,Beijing,China,100871"],"affiliations":[{"raw_affiliation_string":"Peking University,School of Integrated Circuits,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039032609","display_name":"Shuai Yuan","orcid":"https://orcid.org/0000-0003-3329-0481"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Yuan","raw_affiliation_strings":["Peking University,School of Software and Microelectronics,Beijing,China,100871"],"affiliations":[{"raw_affiliation_string":"Peking University,School of Software and Microelectronics,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040397688","display_name":"Yudi Zhao","orcid":"https://orcid.org/0000-0002-8444-763X"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yudi Zhao","raw_affiliation_strings":["Beijing Information Science and Technology University,Beijing,China,102206"],"affiliations":[{"raw_affiliation_string":"Beijing Information Science and Technology University,Beijing,China,102206","institution_ids":["https://openalex.org/I78675632"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101411641","display_name":"Junchen Dong","orcid":"https://orcid.org/0000-0002-2139-2184"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junchen Dong","raw_affiliation_strings":["Beijing Information Science and Technology University,Beijing,China,102206"],"affiliations":[{"raw_affiliation_string":"Beijing Information Science and Technology University,Beijing,China,102206","institution_ids":["https://openalex.org/I78675632"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5105412549","display_name":"Kai Zhao","orcid":"https://orcid.org/0000-0002-0977-5094"},"institutions":[{"id":"https://openalex.org/I78675632","display_name":"Beijing Information Science & Technology University","ror":"https://ror.org/04xnqep60","country_code":"CN","type":"education","lineage":["https://openalex.org/I78675632"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Zhao","raw_affiliation_strings":["Beijing Information Science and Technology University,Beijing,China,102206"],"affiliations":[{"raw_affiliation_string":"Beijing Information Science and Technology University,Beijing,China,102206","institution_ids":["https://openalex.org/I78675632"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5091134344"],"corresponding_institution_ids":["https://openalex.org/I78675632"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16357338,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.9659000039100647,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6455138921737671},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.6189135909080505},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5650582909584045},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49637657403945923},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.49190855026245117},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.4636930227279663},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44454875588417053},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4026804268360138},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.27055323123931885},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20758691430091858},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.14221978187561035},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.12558409571647644},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10798797011375427}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6455138921737671},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.6189135909080505},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5650582909584045},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49637657403945923},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.49190855026245117},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.4636930227279663},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44454875588417053},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4026804268360138},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27055323123931885},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20758691430091858},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14221978187561035},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.12558409571647644},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10798797011375427},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas56072.2025.11044089","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas56072.2025.11044089","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7699999809265137,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1555887201","https://openalex.org/W2005546781","https://openalex.org/W2069389000","https://openalex.org/W2091220318","https://openalex.org/W2092769912","https://openalex.org/W2120169493","https://openalex.org/W2127730492","https://openalex.org/W2321721245","https://openalex.org/W2546872860","https://openalex.org/W2593916221","https://openalex.org/W2765969489","https://openalex.org/W2773134638","https://openalex.org/W2780756707","https://openalex.org/W2803852595","https://openalex.org/W3025224585","https://openalex.org/W3090960375","https://openalex.org/W3095101926","https://openalex.org/W3159551743","https://openalex.org/W3209164364","https://openalex.org/W4226437734","https://openalex.org/W4282968836","https://openalex.org/W4319988733","https://openalex.org/W4365420492","https://openalex.org/W4388561302","https://openalex.org/W4396629480"],"related_works":["https://openalex.org/W4327546585","https://openalex.org/W2411923897","https://openalex.org/W4394546135","https://openalex.org/W2532740565","https://openalex.org/W2527471840","https://openalex.org/W4285347720","https://openalex.org/W2049246612","https://openalex.org/W2271044277","https://openalex.org/W4200259850","https://openalex.org/W2333831899"],"abstract_inverted_index":{"Metal":[0],"Oxide":[1],"Thin":[2],"Film":[3],"Transistors":[4],"(MO":[5],"TFTs),":[6],"known":[7],"for":[8,30,129],"their":[9,31],"flexibility":[10],"and":[11,20,34,42,115],"low":[12,35],"cost,":[13,36],"are":[14,28,54],"widely":[15],"used":[16,56],"in":[17,88,134],"wearable":[18],"electronics":[19],"biomedical":[21],"fields.":[22],"In":[23],"these":[24,48],"applications,":[25],"capacitive":[26],"sensors":[27],"important":[29],"high":[32],"sensitivity":[33],"enabling":[37],"accurate":[38],"detection":[39],"of":[40,47,85,126,139,142,147],"touch":[41],"pressure.":[43],"To":[44,144],"make":[45],"use":[46],"sensor":[49],"signals,":[50],"Capacitive-to-Digital":[51],"Converters":[52],"(CDCs)":[53],"typically":[55],"to":[57,112,132],"convert":[58],"the":[59,83,145,152],"signals":[60],"into":[61],"digital":[62],"form.":[63],"Traditional":[64],"silicon-based":[65],"CDCs":[66],"rely":[67],"on":[68,109,156],"Switched-Capacitor":[69],"(SC)":[70],"circuits,":[71],"with":[72,136],"accuracy":[73,114],"primarily":[74],"determined":[75],"by":[76],"high-gain":[77,86],"Operational":[78],"Transconductance":[79],"Amplifiers":[80],"(OTAs).":[81],"However,":[82],"lack":[84],"OTAs":[87],"TFT":[89,99,157],"technique":[90],"limits":[91],"SC-based":[92],"CDC":[93,100],"precision.":[94],"This":[95],"paper":[96],"presents":[97],"a":[98,122,137],"design":[101,120],"using":[102],"an":[103],"iterative":[104],"discharge":[105],"method,":[106],"avoiding":[107],"reliance":[108],"OTA":[110],"gain":[111],"enhance":[113],"energy":[116],"efficiency.":[117],"The":[118],"proposed":[119],"achieves":[121],"6.2-bit":[123],"Effective":[124],"Number":[125],"Bits":[127],"(ENOB)":[128],"capacitances":[130],"up":[131],"100pF":[133],"14ms,":[135],"Figure":[138],"Merit":[140],"(FoM)":[141],"690nJ/c-s.":[143],"best":[146],"our":[148],"knowledge,":[149],"this":[150],"is":[151],"first":[153],"comprehensive":[154],"study":[155],"CDCs.":[158]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}