{"id":"https://openalex.org/W4411725861","doi":"https://doi.org/10.1109/iscas56072.2025.11043819","title":"Design of a Single-Event Upset Tolerant Low-Power Double-Tail Comparator","display_name":"Design of a Single-Event Upset Tolerant Low-Power Double-Tail Comparator","publication_year":2025,"publication_date":"2025-05-25","ids":{"openalex":"https://openalex.org/W4411725861","doi":"https://doi.org/10.1109/iscas56072.2025.11043819"},"language":"en","primary_location":{"id":"doi:10.1109/iscas56072.2025.11043819","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas56072.2025.11043819","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5107287883","display_name":"Ahmet Cirakoglu","orcid":"https://orcid.org/0009-0007-8152-5069"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Ahmet Cirakoglu","raw_affiliation_strings":["University of Edinburgh,Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering,Edinburgh,United Kingdom"],"affiliations":[{"raw_affiliation_string":"University of Edinburgh,Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering,Edinburgh,United Kingdom","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017301291","display_name":"Alexander Serb","orcid":"https://orcid.org/0000-0002-8034-2398"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Alex Serb","raw_affiliation_strings":["University of Edinburgh,Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering,Edinburgh,United Kingdom"],"affiliations":[{"raw_affiliation_string":"University of Edinburgh,Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering,Edinburgh,United Kingdom","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069930060","display_name":"Khaled Humood","orcid":"https://orcid.org/0000-0002-5275-6593"},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Khaled Humood","raw_affiliation_strings":["University of Edinburgh,Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering,Edinburgh,United Kingdom"],"affiliations":[{"raw_affiliation_string":"University of Edinburgh,Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering,Edinburgh,United Kingdom","institution_ids":["https://openalex.org/I98677209"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077466475","display_name":"Mark Zwoli\u0144ski","orcid":"https://orcid.org/0000-0002-2230-625X"},"institutions":[{"id":"https://openalex.org/I43439940","display_name":"University of Southampton","ror":"https://ror.org/01ryk1543","country_code":"GB","type":"education","lineage":["https://openalex.org/I43439940"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Mark Zwolinski","raw_affiliation_strings":["University of Southampton,School of Electronics and Computer Science,Southampton,UK,SO17 1BJ"],"affiliations":[{"raw_affiliation_string":"University of Southampton,School of Electronics and Computer Science,Southampton,UK,SO17 1BJ","institution_ids":["https://openalex.org/I43439940"]}]},{"author_position":"last","author":{"id":null,"display_name":"Themis Prodromakis","orcid":null},"institutions":[{"id":"https://openalex.org/I98677209","display_name":"University of Edinburgh","ror":"https://ror.org/01nrxwf90","country_code":"GB","type":"education","lineage":["https://openalex.org/I98677209"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Themis Prodromakis","raw_affiliation_strings":["University of Edinburgh,Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering,Edinburgh,United Kingdom"],"affiliations":[{"raw_affiliation_string":"University of Edinburgh,Centre for Electronics Frontiers, Institute for Integrated Micro and Nano Systems, School of Engineering,Edinburgh,United Kingdom","institution_ids":["https://openalex.org/I98677209"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5107287883"],"corresponding_institution_ids":["https://openalex.org/I98677209"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12553682,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11216","display_name":"Radiation Detection and Scintillator Technologies","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","score":0.9675999879837036,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.7997719645500183},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.7727468013763428},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.7649226188659668},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5242074728012085},{"id":"https://openalex.org/keywords/event","display_name":"Event (particle physics)","score":0.5095205903053284},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.47917640209198},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3712742030620575},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2354108989238739},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.213008314371109},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.18200844526290894},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.10295161604881287},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.0887179970741272},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.07456532120704651}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.7997719645500183},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.7727468013763428},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.7649226188659668},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5242074728012085},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.5095205903053284},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.47917640209198},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3712742030620575},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2354108989238739},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.213008314371109},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.18200844526290894},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.10295161604881287},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0887179970741272},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.07456532120704651},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas56072.2025.11043819","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas56072.2025.11043819","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:eprints.soton.ac.uk:510542","is_oa":false,"landing_page_url":"http://doi.org/10.1109/ISCAS56072.2025.11043819>).","pdf_url":null,"source":{"id":"https://openalex.org/S4306401020","display_name":"ePrints Soton (University of Southampton)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I43439940","host_organization_name":"University of Southampton","host_organization_lineage":["https://openalex.org/I43439940"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":null,"raw_type":"PeerReviewed"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","score":0.5099999904632568,"display_name":"Reduced inequalities"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1968632892","https://openalex.org/W2016016211","https://openalex.org/W2147768505","https://openalex.org/W2194775991","https://openalex.org/W2563262959","https://openalex.org/W2772291231","https://openalex.org/W2785663744","https://openalex.org/W2968365336","https://openalex.org/W2980855339","https://openalex.org/W3113229535","https://openalex.org/W3116299998","https://openalex.org/W3135439965","https://openalex.org/W3208792467","https://openalex.org/W4287847482","https://openalex.org/W4391547599","https://openalex.org/W4400802463","https://openalex.org/W4402572261"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W4411551091","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W2359969304","https://openalex.org/W764628369","https://openalex.org/W2155141467","https://openalex.org/W1502430142"],"abstract_inverted_index":{"Comparators":[0],"have":[1,100],"been":[2],"optimized":[3],"for":[4],"quick":[5],"decision-making":[6],"and":[7,73,91,122,141],"reduction":[8],"of":[9,15,60,79,86],"dynamic":[10,29],"power":[11,92],"consumption":[12],"through":[13],"years":[14],"research":[16],"by":[17,129],"incorporating":[18],"strong":[19],"positive":[20],"feedback":[21],"latches.":[22],"However,":[23],"these":[24,50],"advancements":[25],"can":[26,75],"make":[27],"double-tail":[28,64,109],"comparators":[30],"more":[31],"susceptible":[32],"to":[33,99,105],"single-event":[34],"effects":[35],"(SEEs).":[36],"In":[37],"this":[38],"work,":[39],"we":[40],"present":[41],"a":[42,57,61,68,106,112],"new":[43],"comparator":[44,96,110],"design":[45,55],"that":[46],"is":[47,56,97,127],"hardened":[48],"against":[49],"radiation":[51],"effects.":[52],"The":[53,94],"proposed":[54,95,124],"modified":[58],"version":[59],"low-voltage,":[62],"low-power":[63],"comparator,":[65],"designed":[66,116],"in":[67,88,117],"180":[69],"nm":[70],"technology":[71,120],"node,":[72,121],"it":[74],"achieve":[76],"high":[77],"levels":[78],"SEE":[80,102],"tolerance":[81,103],"with":[82,111,139],"an":[83],"acceptable":[84],"degree":[85],"trade-off":[87],"area,":[89],"delay,":[90],"consumption.":[93],"shown":[98],"superior":[101],"compared":[104],"radiation-hardened":[107],"conventional":[108],"similar":[113],"electrical":[114],"performance":[115],"the":[118,123],"same":[119],"design\u2019s":[125],"functionality":[126],"proven":[128],"post-layout":[130],"simulations":[131],"across":[132],"extreme":[133],"simulation":[134],"corners,":[135],"combining":[136],"process":[137],"corners":[138],"temperature":[140],"supply":[142],"voltage":[143],"variations.":[144]},"counts_by_year":[],"updated_date":"2026-04-18T07:56:08.524223","created_date":"2025-10-10T00:00:00"}