{"id":"https://openalex.org/W4411725672","doi":"https://doi.org/10.1109/iscas56072.2025.11043722","title":"Fast and High-Precision Analog In-Sensor Visual Computing Using Fully Amorphous Metal Oxide Thin-Film Transistors","display_name":"Fast and High-Precision Analog In-Sensor Visual Computing Using Fully Amorphous Metal Oxide Thin-Film Transistors","publication_year":2025,"publication_date":"2025-05-25","ids":{"openalex":"https://openalex.org/W4411725672","doi":"https://doi.org/10.1109/iscas56072.2025.11043722"},"language":"en","primary_location":{"id":"doi:10.1109/iscas56072.2025.11043722","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas56072.2025.11043722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101387590","display_name":"Lingxiao Qian","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lingxiao Qian","raw_affiliation_strings":["Peking University,School of Electronic and Computer Engineering,Shenzhen,China"],"affiliations":[{"raw_affiliation_string":"Peking University,School of Electronic and Computer Engineering,Shenzhen,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071329920","display_name":"Tengyan Huang","orcid":"https://orcid.org/0000-0001-8217-0852"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tengyan Huang","raw_affiliation_strings":["Peking University,School of Electronic and Computer Engineering,Shenzhen,China"],"affiliations":[{"raw_affiliation_string":"Peking University,School of Electronic and Computer Engineering,Shenzhen,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Haotian Han","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haotian Han","raw_affiliation_strings":["Peking University,School of Electronic and Computer Engineering,Shenzhen,China"],"affiliations":[{"raw_affiliation_string":"Peking University,School of Electronic and Computer Engineering,Shenzhen,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103269562","display_name":"Yuxuan Zhu","orcid":"https://orcid.org/0000-0003-3624-9564"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxuan Zhu","raw_affiliation_strings":["Peking University,School of Electronic and Computer Engineering,Shenzhen,China"],"affiliations":[{"raw_affiliation_string":"Peking University,School of Electronic and Computer Engineering,Shenzhen,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103223904","display_name":"Congwei Liao","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Congwei Liao","raw_affiliation_strings":["Peking University,School of Electronic and Computer Engineering,Shenzhen,China"],"affiliations":[{"raw_affiliation_string":"Peking University,School of Electronic and Computer Engineering,Shenzhen,China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021481432","display_name":"Shengdong Zhang","orcid":"https://orcid.org/0000-0002-1815-8661"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengdong Zhang","raw_affiliation_strings":["Peking University,School of Electronic and Computer Engineering,Shenzhen,China"],"affiliations":[{"raw_affiliation_string":"Peking University,School of Electronic and Computer Engineering,Shenzhen,China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5101387590"],"corresponding_institution_ids":["https://openalex.org/I20231570"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.12498125,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9842000007629395,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9743000268936157,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.8391889333724976},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.635405421257019},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.6045708656311035},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5911146402359009},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5619969367980957},{"id":"https://openalex.org/keywords/amorphous-solid","display_name":"Amorphous solid","score":0.5341412425041199},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5002701282501221},{"id":"https://openalex.org/keywords/oxide-thin-film-transistor","display_name":"Oxide thin-film transistor","score":0.4645528495311737},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34980708360671997},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.29913339018821716},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.26924434304237366},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10912549495697021},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10879486799240112},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.10499143600463867}],"concepts":[{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.8391889333724976},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.635405421257019},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.6045708656311035},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5911146402359009},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5619969367980957},{"id":"https://openalex.org/C56052488","wikidata":"https://www.wikidata.org/wiki/Q103382","display_name":"Amorphous solid","level":2,"score":0.5341412425041199},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5002701282501221},{"id":"https://openalex.org/C162743726","wikidata":"https://www.wikidata.org/wiki/Q7115642","display_name":"Oxide thin-film transistor","level":4,"score":0.4645528495311737},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34980708360671997},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.29913339018821716},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.26924434304237366},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10912549495697021},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10879486799240112},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.10499143600463867},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas56072.2025.11043722","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas56072.2025.11043722","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320337504","display_name":"Research and Development","ror":"https://ror.org/027s68j25"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W2012696426","https://openalex.org/W2112796928","https://openalex.org/W2156933657","https://openalex.org/W2291760220","https://openalex.org/W2774669597","https://openalex.org/W2785249606","https://openalex.org/W2972984303","https://openalex.org/W3009114326","https://openalex.org/W3009994855","https://openalex.org/W3015271406","https://openalex.org/W3048680376","https://openalex.org/W3100958316","https://openalex.org/W3104775050","https://openalex.org/W3109162959","https://openalex.org/W3133578396","https://openalex.org/W3174208823","https://openalex.org/W3214737855","https://openalex.org/W4225983077","https://openalex.org/W4255871134","https://openalex.org/W4285120541","https://openalex.org/W4366506645","https://openalex.org/W4387871244","https://openalex.org/W4388554549","https://openalex.org/W4389961047","https://openalex.org/W4391406927","https://openalex.org/W4400081392","https://openalex.org/W4400230302","https://openalex.org/W4401567933"],"related_works":["https://openalex.org/W1994369710","https://openalex.org/W2049246612","https://openalex.org/W2526607624","https://openalex.org/W2994890534","https://openalex.org/W2532740565","https://openalex.org/W3023403424","https://openalex.org/W2184097764","https://openalex.org/W2010614780","https://openalex.org/W2908014730","https://openalex.org/W2464760298"],"abstract_inverted_index":{"In-Sensor":[0],"computing":[1,18],"has":[2],"emerged":[3],"as":[4],"a":[5,47,60,93,97,117],"promising":[6],"approach":[7],"for":[8,28],"fast,":[9],"energy-efficient":[10],"visual":[11,37],"perception.":[12],"This":[13],"paper":[14],"presents":[15],"an":[16],"in-sensor":[17],"system":[19,40,86],"that":[20,106],"leverages":[21],"amorphous":[22],"metal":[23],"oxide":[24],"thin-film":[25],"transistors":[26],"(TFTs)":[27],"photo-sensing,":[29],"computation,":[30],"and":[31,35,53],"control,":[32],"enabling":[33],"rapid":[34],"precise":[36],"processing.":[38],"The":[39,66],"directly":[41],"computes":[42],"the":[43,82,85],"first":[44],"layer":[45],"of":[46,62],"neural":[48],"network":[49],"(NN)":[50],"during":[51],"exposure":[52],"supports":[54],"high-resolution":[55],"raw":[56],"image":[57],"readout":[58],"once":[59],"target":[61],"interest":[63],"is":[64],"detected.":[65],"pixel":[67],"circuit":[68],"incorporates":[69],"threshold":[70],"voltage":[71],"(V<inf":[72],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[73,100],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">TH</inf>)":[74],"compensation":[75],"to":[76],"ensure":[77],"computational":[78],"accuracy.":[79],"Validated":[80],"on":[81],"MNIST":[83],"dataset,":[84],"achieves":[87],"88%":[88],"classification":[89],"accuracy":[90],"with":[91],"only":[92],"2.2%":[94],"degradation":[95],"under":[96],"2V":[98],"V<inf":[99],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">TH</inf>":[101],"shift.":[102],"Post-Simulation":[103],"results":[104],"show":[105],"one":[107],"computation":[108],"frame":[109],"can":[110],"be":[111],"finished":[112],"within":[113],"500":[114],"ns,":[115],"demonstrating":[116],"20\u00d7":[118],"speed":[119],"enhancement":[120],"over":[121],"state-of-the-art":[122],"silicon-based":[123],"solutions.":[124]},"counts_by_year":[],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}