{"id":"https://openalex.org/W4411726052","doi":"https://doi.org/10.1109/iscas56072.2025.11043539","title":"Instantaneous Capacitance Matching based Current Response Algorithm for EM Reliability Analysis","display_name":"Instantaneous Capacitance Matching based Current Response Algorithm for EM Reliability Analysis","publication_year":2025,"publication_date":"2025-05-25","ids":{"openalex":"https://openalex.org/W4411726052","doi":"https://doi.org/10.1109/iscas56072.2025.11043539"},"language":"en","primary_location":{"id":"doi:10.1109/iscas56072.2025.11043539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas56072.2025.11043539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100923501","display_name":"Zongfeng Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I157773358","display_name":"Sun Yat-sen University","ror":"https://ror.org/0064kty71","country_code":"CN","type":"education","lineage":["https://openalex.org/I157773358"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zongfeng Ma","raw_affiliation_strings":["Sun Yat-sen University,School of Microelectronics Science and Technology,Zhuhai,China"],"affiliations":[{"raw_affiliation_string":"Sun Yat-sen University,School of Microelectronics Science and Technology,Zhuhai,China","institution_ids":["https://openalex.org/I157773358"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101943194","display_name":"Zhong Guan","orcid":"https://orcid.org/0000-0003-1238-1739"},"institutions":[{"id":"https://openalex.org/I157773358","display_name":"Sun Yat-sen University","ror":"https://ror.org/0064kty71","country_code":"CN","type":"education","lineage":["https://openalex.org/I157773358"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhong Guan","raw_affiliation_strings":["Sun Yat-sen University,School of Microelectronics Science and Technology,Zhuhai,China"],"affiliations":[{"raw_affiliation_string":"Sun Yat-sen University,School of Microelectronics Science and Technology,Zhuhai,China","institution_ids":["https://openalex.org/I157773358"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5100923501"],"corresponding_institution_ids":["https://openalex.org/I157773358"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.21170682,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.871999979019165,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.871999979019165,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.8353999853134155,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14156","display_name":"Engineering Applied Research","score":0.767799973487854,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6494283676147461},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6145702004432678},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5526134967803955},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5151975750923157},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5092307329177856},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.48772844672203064},{"id":"https://openalex.org/keywords/algorithm-design","display_name":"Algorithm design","score":0.44270214438438416},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.37958139181137085},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21951231360435486},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.21004828810691833},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15773484110832214},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15227854251861572},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.1004854142665863},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.08239081501960754},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.0735614001750946}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6494283676147461},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6145702004432678},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5526134967803955},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5151975750923157},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5092307329177856},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.48772844672203064},{"id":"https://openalex.org/C106516650","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm design","level":2,"score":0.44270214438438416},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37958139181137085},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21951231360435486},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.21004828810691833},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15773484110832214},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15227854251861572},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.1004854142665863},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.08239081501960754},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0735614001750946},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas56072.2025.11043539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas56072.2025.11043539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4000000059604645}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1920321889","https://openalex.org/W1988631834","https://openalex.org/W2029040443","https://openalex.org/W2051725270","https://openalex.org/W2091384027","https://openalex.org/W2142896025","https://openalex.org/W2170653271","https://openalex.org/W2532647687","https://openalex.org/W3092337895","https://openalex.org/W3137237606","https://openalex.org/W3142980239","https://openalex.org/W4396949013"],"related_works":["https://openalex.org/W2347585086","https://openalex.org/W1527953837","https://openalex.org/W2042100038","https://openalex.org/W1966596465","https://openalex.org/W3086500945","https://openalex.org/W2018850574","https://openalex.org/W2781651239","https://openalex.org/W2368367884","https://openalex.org/W2764319374","https://openalex.org/W3032934611"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3,34],"present":[4],"a":[5],"novel":[6],"algorithm":[7,56,95],"for":[8,81],"signal":[9,67,116],"line":[10],"current":[11,17,23,61],"estimation.":[12],"Our":[13],"approach":[14,77],"predicts":[15],"the":[16,21,31,41,60,66,79,112],"waveform":[18],"by":[19,30],"utilizing":[20],"driver\u2019s":[22],"response":[24],"to":[25,57,103],"multiple":[26],"fixed":[27],"capacitors":[28],"provided":[29],"foundry.":[32],"Additionally,":[33],"introduce":[35],"an":[36],"innovative":[37],"method":[38],"that":[39,93],"leverages":[40],"equivalence":[42],"between":[43],"RC":[44,83],"tree":[45],"compression":[46],"and":[47,99],"recovery":[48],"during":[49],"each":[50],"computation":[51],"step,":[52],"which":[53],"allows":[54],"our":[55,76,94],"accurately":[58],"determine":[59],"of":[62,115],"any":[63],"element":[64],"within":[65],"line.":[68],"Unlike":[69],"traditional":[70],"methods":[71],"based":[72],"on":[73],"effective":[74],"capacitance,":[75],"eliminates":[78],"need":[80],"prior":[82],"network":[84],"reduction":[85],"or":[86],"additional":[87],"transient":[88],"simulations.":[89],"Experimental":[90],"results":[91],"demonstrate":[92],"delivers":[96],"excellent":[97],"accuracy":[98],"competitive":[100],"runtime":[101],"compared":[102],"golden":[104],"reference":[105],"results,":[106],"proving":[107],"its":[108],"effectiveness":[109],"in":[110],"evaluating":[111],"electromigration":[113],"reliability":[114],"lines.":[117]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}