{"id":"https://openalex.org/W3184184224","doi":"https://doi.org/10.1109/iscas51556.2021.9401432","title":"A Power Grids Electromigration Analysis with Via Array Using Current-Tracing Model","display_name":"A Power Grids Electromigration Analysis with Via Array Using Current-Tracing Model","publication_year":2021,"publication_date":"2021-04-27","ids":{"openalex":"https://openalex.org/W3184184224","doi":"https://doi.org/10.1109/iscas51556.2021.9401432","mag":"3184184224"},"language":"en","primary_location":{"id":"doi:10.1109/iscas51556.2021.9401432","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401432","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100378612","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0001-9735-6641"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jing Wang","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science & Technology, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science & Technology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100894724","display_name":"Yici Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yici Cai","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science & Technology, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science & Technology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101929509","display_name":"Qiang Zhou","orcid":"https://orcid.org/0000-0003-1348-8861"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Zhou","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science & Technology, Tsinghua University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science & Technology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100378612"],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":0.065,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.26751379,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":93},"biblio":{"volume":"23","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.8956372141838074},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.641948401927948},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.6266792416572571},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.604914128780365},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5994120836257935},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.5954045653343201},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5784953832626343},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.5171710848808289},{"id":"https://openalex.org/keywords/routing","display_name":"Routing (electronic design automation)","score":0.48629340529441833},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.474680632352829},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4730474352836609},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2800911068916321},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.176492840051651},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.16242140531539917},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.1510941982269287},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10825338959693909},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08065268397331238}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.8956372141838074},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.641948401927948},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.6266792416572571},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.604914128780365},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5994120836257935},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.5954045653343201},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5784953832626343},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.5171710848808289},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.48629340529441833},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.474680632352829},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4730474352836609},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2800911068916321},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.176492840051651},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.16242140531539917},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.1510941982269287},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10825338959693909},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08065268397331238},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas51556.2021.9401432","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401432","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7799999713897705,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320337504","display_name":"Research and Development","ror":"https://ror.org/027s68j25"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1590174303","https://openalex.org/W2003121593","https://openalex.org/W2058992420","https://openalex.org/W2128455324","https://openalex.org/W2135277685","https://openalex.org/W2150608324","https://openalex.org/W2295208369","https://openalex.org/W2338310953","https://openalex.org/W2344964871","https://openalex.org/W2394569310","https://openalex.org/W2587645287","https://openalex.org/W2613570260","https://openalex.org/W2626746672","https://openalex.org/W2736959725","https://openalex.org/W2943449094","https://openalex.org/W3014518153","https://openalex.org/W3148122453","https://openalex.org/W3149694916","https://openalex.org/W6650969681","https://openalex.org/W6776176871"],"related_works":["https://openalex.org/W2004615523","https://openalex.org/W2055638565","https://openalex.org/W2138118262","https://openalex.org/W2542708587","https://openalex.org/W4229007131","https://openalex.org/W2364197307","https://openalex.org/W4381800218","https://openalex.org/W2034853009","https://openalex.org/W2136403807","https://openalex.org/W796810817"],"abstract_inverted_index":{"Electromigration":[0],"(EM)":[1],"has":[2],"been":[3,29],"considered":[4,81],"to":[5,31,100,110],"be":[6,32],"a":[7,35,41,72,113],"severe":[8],"reliability":[9],"issue":[10],"in":[11,61,71,90,130],"power":[12,74,123,137,148],"grid":[13,138,149],"networks":[14,150],"of":[15,49,84,104,134],"large":[16],"integrated":[17],"circuits":[18],"(IC).":[19],"The":[20,65],"via":[21,52,63,93],"array":[22,53,94],"possesses":[23],"special":[24],"EM":[25,50,119,142],"characteristics":[26],"that":[27,88],"have":[28],"observed":[30],"distinct":[33],"from":[34],"single":[36],"via.":[37],"In":[38],"this":[39],"study,":[40],"compact":[42],"analytical":[43,106],"model":[44,67,107],"for":[45,51,77,116,121,146],"the":[46,58,62,78,82,85,91,97,102,105,111,131,135,141],"fast":[47],"estimation":[48],"was":[54,68,125],"proposed":[55,66],"by":[56],"calculating":[57],"current":[59,86],"distribution":[60],"arrays.":[64],"then":[69],"analyzed":[70],"multi-layer":[73,136],"grid,":[75],"which,":[76],"first":[79],"time,":[80],"impacts":[83],"propagation":[87],"exists":[89],"vertical":[92],"connected":[95],"within":[96],"multi-level":[98],"interconnection":[99],"improve":[101],"accuracy":[103],"further.":[108],"According":[109],"model,":[112],"novel":[114],"methodology":[115],"full-":[117],"chip":[118],"checking":[120],"multi-layered":[122],"grids":[124],"proposed.":[126],"This":[127],"method":[128],"factored":[129],"routing":[132],"structure":[133],"network,":[139],"ensuring":[140],"assessment":[143],"analysis's":[144],"efficiency":[145],"large-scale":[147],"without":[151],"sacrificing":[152],"accuracy.":[153]},"counts_by_year":[{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}