{"id":"https://openalex.org/W3159575167","doi":"https://doi.org/10.1109/iscas51556.2021.9401363","title":"IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs","display_name":"IC Age Estimation Methodology Using IO Pad Protection Diodes for Prevention of Recycled ICs","publication_year":2021,"publication_date":"2021-04-27","ids":{"openalex":"https://openalex.org/W3159575167","doi":"https://doi.org/10.1109/iscas51556.2021.9401363","mag":"3159575167"},"language":"en","primary_location":{"id":"doi:10.1109/iscas51556.2021.9401363","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401363","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027291505","display_name":"Srisubha Kalanadhabhatta","orcid":null},"institutions":[{"id":"https://openalex.org/I65181880","display_name":"Indian Institute of Technology Hyderabad","ror":"https://ror.org/01j4v3x97","country_code":"IN","type":"education","lineage":["https://openalex.org/I65181880"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Srisubha Kalanadhabhatta","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology(IIT), Hyderabad, Telangana, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology(IIT), Hyderabad, Telangana, India","institution_ids":["https://openalex.org/I65181880"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053763755","display_name":"Rashi Dutt","orcid":"https://orcid.org/0000-0001-7552-3269"},"institutions":[{"id":"https://openalex.org/I65181880","display_name":"Indian Institute of Technology Hyderabad","ror":"https://ror.org/01j4v3x97","country_code":"IN","type":"education","lineage":["https://openalex.org/I65181880"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rashi Dutt","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology(IIT), Hyderabad, Telangana, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology(IIT), Hyderabad, Telangana, India","institution_ids":["https://openalex.org/I65181880"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107854382","display_name":"Saqib Khursheed","orcid":"https://orcid.org/0000-0002-5720-0607"},"institutions":[{"id":"https://openalex.org/I146655781","display_name":"University of Liverpool","ror":"https://ror.org/04xs57h96","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Saqib Khursheed","raw_affiliation_strings":["Department of Electrical Engineering and Electronics, University of Liverpool, UK"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Electronics, University of Liverpool, UK","institution_ids":["https://openalex.org/I146655781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044085104","display_name":"Amit Acharyya","orcid":"https://orcid.org/0000-0002-5636-0676"},"institutions":[{"id":"https://openalex.org/I65181880","display_name":"Indian Institute of Technology Hyderabad","ror":"https://ror.org/01j4v3x97","country_code":"IN","type":"education","lineage":["https://openalex.org/I65181880"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Amit Acharyya","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology(IIT), Hyderabad, Telangana, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology(IIT), Hyderabad, Telangana, India","institution_ids":["https://openalex.org/I65181880"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5027291505"],"corresponding_institution_ids":["https://openalex.org/I65181880"],"apc_list":null,"apc_paid":null,"fwci":0.3046,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.5540035,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5633934140205383},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.5557060241699219},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.5209913849830627},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5184164047241211},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5168371796607971},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4567486047744751},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41861382126808167},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.4129411578178406},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.38013696670532227},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3550340533256531},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3344639837741852},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3278070092201233},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31042689085006714}],"concepts":[{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5633934140205383},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5557060241699219},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.5209913849830627},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5184164047241211},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5168371796607971},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4567486047744751},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41861382126808167},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.4129411578178406},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.38013696670532227},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3550340533256531},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3344639837741852},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3278070092201233},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31042689085006714},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas51556.2021.9401363","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401363","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:raiith.iith.ac.in:10308","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306400292","display_name":"Research Archive of Indian Institute of Technology Hyderabad (Indian Institute of Technology Hyderabad)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I65181880","host_organization_name":"Indian Institute of Technology Hyderabad","host_organization_lineage":["https://openalex.org/I65181880"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1967726944","https://openalex.org/W2007280892","https://openalex.org/W2047667198","https://openalex.org/W2091664166","https://openalex.org/W2104967787","https://openalex.org/W2210885409","https://openalex.org/W2307493678","https://openalex.org/W2546909542","https://openalex.org/W2775903597","https://openalex.org/W2781775347","https://openalex.org/W2808163898","https://openalex.org/W2808442774","https://openalex.org/W2810695183","https://openalex.org/W2884859021","https://openalex.org/W2900865058","https://openalex.org/W2945899287","https://openalex.org/W2949793452","https://openalex.org/W2983493345","https://openalex.org/W3033133180","https://openalex.org/W3083551261","https://openalex.org/W4241472700"],"related_works":["https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W1976168335","https://openalex.org/W3211992815","https://openalex.org/W179354024"],"abstract_inverted_index":{"Recycled":[0],"ICs":[1,9,21,146],"have":[2,131],"become":[3],"a":[4,85,89,151,155],"major":[5],"threat":[6],"to":[7,34,57,75,87,94,132,198],"the":[8,16,26,36,43,49,61,77,100,106,117,163,171,179,189,192],"used":[10,149],"in":[11,121,174],"safety":[12],"critical":[13],"systems.":[14],"In":[15,80],"current":[17],"state-of-the-art":[18],"techniques,":[19],"recycled":[20,78,90],"are":[22,148],"detected":[23,160],"by":[24,98,112,161],"measuring":[25,113],"frequency,":[27],"current,":[28],"path":[29],"delay":[30],"or":[31],"power-up":[32],"values":[33],"estimate":[35,60,95,188],"HCI,":[37],"BTI":[38],"and":[39,59,73,92,135],"EM":[40],"effects":[41],"on":[42],"transistors":[44],"with":[45,201],"age.":[46],"Some":[47],"of":[48,63,154,165,191,204],"state-":[50],"of-the-art":[51],"techniques":[52],"require":[53],"additional":[54,129],"on-chip":[55],"sensors":[56,130],"detect":[58,76,88],"age":[62,97,109,190],"an":[64],"IC":[65,91,193],"while":[66],"others":[67],"use":[68],"existing":[69,101],"logic":[70],"like":[71],"SRAM":[72],"Flip-flops":[74],"ICs.":[79],"this":[81,126,143,175],"paper,":[82],"we":[83],"provide":[84],"methodology":[86,186],"also":[93],"its":[96],"using":[99,162],"IO":[102,122],"pad":[103,123],"structures.":[104],"For":[105],"first":[107,172],"time,":[108],"is":[110,138],"estimated":[111],"voltage":[114],"drop":[115],"across":[116],"protection":[118],"diodes":[119],"present":[120],"structure.":[124],"With":[125,142],"methodology,":[127,145],"no":[128,139],"be":[133,158],"added":[134],"hence":[136],"there":[137],"area":[140],"overhead.":[141],"proposed":[144,185],"that":[147],"for":[150,170,181],"minimum":[152],"period":[153],"day":[156],"can":[157,187],"effectively":[159],"concept":[164],"extended":[166],"Kalman":[167],"filtering":[168],"technique":[169],"time":[173],"domain.":[176],"By":[177],"stressing":[178],"part":[180],"five":[182],"days,":[183],"our":[184],"aged":[194],"between":[195],"1":[196],"month":[197],"5":[199],"years":[200],"95%":[202],"percent":[203],"accuracy.":[205]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}