{"id":"https://openalex.org/W3157085000","doi":"https://doi.org/10.1109/iscas51556.2021.9401350","title":"A Dynamic Highly Reliable SRAM-Based PUF Retaining Memory Function","display_name":"A Dynamic Highly Reliable SRAM-Based PUF Retaining Memory Function","publication_year":2021,"publication_date":"2021-04-27","ids":{"openalex":"https://openalex.org/W3157085000","doi":"https://doi.org/10.1109/iscas51556.2021.9401350","mag":"3157085000"},"language":"en","primary_location":{"id":"doi:10.1109/iscas51556.2021.9401350","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401350","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://pureadmin.qub.ac.uk/ws/files/240729473/Zhanghu_PUF_NUAA_pure.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101831413","display_name":"Zhang Hu","orcid":"https://orcid.org/0000-0003-0912-4870"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hu Zhang","raw_affiliation_strings":["College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055800000","display_name":"Chenghua Wang","orcid":"https://orcid.org/0000-0001-8415-0548"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenghua Wang","raw_affiliation_strings":["College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055635944","display_name":"Chenggang Yan","orcid":"https://orcid.org/0000-0001-5957-3207"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chenggang Yan","raw_affiliation_strings":["College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011952918","display_name":"Yijun Cui","orcid":"https://orcid.org/0000-0002-6262-2329"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yijun Cui","raw_affiliation_strings":["College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089292929","display_name":"Chongyan Gu","orcid":"https://orcid.org/0000-0002-3028-8004"},"institutions":[{"id":"https://openalex.org/I126231945","display_name":"Queen's University Belfast","ror":"https://ror.org/00hswnk62","country_code":"GB","type":"education","lineage":["https://openalex.org/I126231945"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Chongyan Gu","raw_affiliation_strings":["Centre for Secure Information Technologies, Queen\u2019s University Belfast, Belfast, U.K","Centre for Secure Information Technologies, Queen's University Belfast, Belfast, U.K"],"affiliations":[{"raw_affiliation_string":"Centre for Secure Information Technologies, Queen\u2019s University Belfast, Belfast, U.K","institution_ids":["https://openalex.org/I126231945"]},{"raw_affiliation_string":"Centre for Secure Information Technologies, Queen's University Belfast, Belfast, U.K","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034288437","display_name":"Maire OaNeill","orcid":null},"institutions":[{"id":"https://openalex.org/I126231945","display_name":"Queen's University Belfast","ror":"https://ror.org/00hswnk62","country_code":"GB","type":"education","lineage":["https://openalex.org/I126231945"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Maire OaNeill","raw_affiliation_strings":["Queen's University Belfast, Belfast, UK"],"affiliations":[{"raw_affiliation_string":"Queen's University Belfast, Belfast, UK","institution_ids":["https://openalex.org/I126231945"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023734605","display_name":"Weiqiang Liu","orcid":"https://orcid.org/0000-0001-8398-8648"},"institutions":[{"id":"https://openalex.org/I9842412","display_name":"Nanjing University of Aeronautics and Astronautics","ror":"https://ror.org/01scyh794","country_code":"CN","type":"education","lineage":["https://openalex.org/I9842412"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiqiang Liu","raw_affiliation_strings":["College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China","institution_ids":["https://openalex.org/I9842412"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101831413"],"corresponding_institution_ids":["https://openalex.org/I9842412"],"apc_list":null,"apc_paid":null,"fwci":0.7075,"has_fulltext":true,"cited_by_count":5,"citation_normalized_percentile":{"value":0.65537329,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.713626503944397},{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.704813539981842},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5865256190299988},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.5397736430168152},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5058157444000244},{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.4966598153114319},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.48483192920684814},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.471534788608551},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4709183871746063},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.44351592659950256},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3690989911556244},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34204915165901184},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3272343873977661},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2771788239479065},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2718867361545563},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2653988003730774},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22396442294120789},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.13405722379684448},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.09161970019340515}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.713626503944397},{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.704813539981842},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5865256190299988},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.5397736430168152},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5058157444000244},{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.4966598153114319},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.48483192920684814},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.471534788608551},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4709183871746063},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.44351592659950256},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3690989911556244},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34204915165901184},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3272343873977661},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2771788239479065},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2718867361545563},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2653988003730774},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22396442294120789},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.13405722379684448},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.09161970019340515},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas51556.2021.9401350","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401350","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:pure.qub.ac.uk/portal:publications/4d2358e4-d4a9-46d1-8f6e-b61368a7338c","is_oa":true,"landing_page_url":"https://pure.qub.ac.uk/en/publications/4d2358e4-d4a9-46d1-8f6e-b61368a7338c","pdf_url":"https://pureadmin.qub.ac.uk/ws/files/240729473/Zhanghu_PUF_NUAA_pure.pdf","source":{"id":"https://openalex.org/S4306402319","display_name":"Research Portal (Queen's University Belfast)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I126231945","host_organization_name":"Queen's University Belfast","host_organization_lineage":["https://openalex.org/I126231945"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Zhang, H, Wang, C, Yan, C, Cui, Y, Gu, C, O'Neill, M & Liu, W 2021, A Dynamic Highly Reliable SRAM-Based PUF Retaining Memory Function. in 2021 IEEE International Symposium on Circuits and Systems (ISCAS). IEEE International Symposium on Circuits and Systems (ISCAS): Proceedings, Institute of Electrical and Electronics Engineers Inc.","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:pure.qub.ac.uk/portal:publications/4d2358e4-d4a9-46d1-8f6e-b61368a7338c","is_oa":true,"landing_page_url":"https://pure.qub.ac.uk/en/publications/4d2358e4-d4a9-46d1-8f6e-b61368a7338c","pdf_url":"https://pureadmin.qub.ac.uk/ws/files/240729473/Zhanghu_PUF_NUAA_pure.pdf","source":{"id":"https://openalex.org/S4306402319","display_name":"Research Portal (Queen's University Belfast)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I126231945","host_organization_name":"Queen's University Belfast","host_organization_lineage":["https://openalex.org/I126231945"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Zhang, H, Wang, C, Yan, C, Cui, Y, Gu, C, O'Neill, M & Liu, W 2021, A Dynamic Highly Reliable SRAM-Based PUF Retaining Memory Function. in 2021 IEEE International Symposium on Circuits and Systems (ISCAS). IEEE International Symposium on Circuits and Systems (ISCAS): Proceedings, Institute of Electrical and Electronics Engineers Inc.","raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"score":0.6200000047683716,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G2241406505","display_name":null,"funder_award_id":"EP/R007187/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G5445011987","display_name":null,"funder_award_id":"EP/K004379/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G6577499357","display_name":null,"funder_award_id":"EP/N508664/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322769","display_name":"Natural Science Foundation of Jiangsu Province","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320326182","display_name":"Six Talent Peaks Project in Jiangsu Province","ror":null},{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3157085000.pdf","grobid_xml":"https://content.openalex.org/works/W3157085000.grobid-xml"},"referenced_works_count":12,"referenced_works":["https://openalex.org/W2001067488","https://openalex.org/W2046467839","https://openalex.org/W2308470952","https://openalex.org/W2580334840","https://openalex.org/W2931380630","https://openalex.org/W2942647760","https://openalex.org/W2971643716","https://openalex.org/W2979803752","https://openalex.org/W2999571526","https://openalex.org/W3004468114","https://openalex.org/W3015154936","https://openalex.org/W3094745711"],"related_works":["https://openalex.org/W2217098757","https://openalex.org/W3208688275","https://openalex.org/W2088771128","https://openalex.org/W2263373136","https://openalex.org/W2796085262","https://openalex.org/W754115298","https://openalex.org/W4390606075","https://openalex.org/W2891188466","https://openalex.org/W2775062502","https://openalex.org/W2302863414"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,36,65,137],"highly":[4],"reliable":[5],"SRAM":[6],"based":[7],"Physical":[8],"Unclonable":[9],"Function":[10],"(PUF),":[11],"which":[12,52],"retains":[13],"the":[14,31,39,42,45,55,89,126,129],"memory":[15,134],"function":[16,135],"is":[17,23,62,95,139],"proposed.":[18],"The":[19,59],"mismatch":[20],"of":[21,41],"NMOS":[22],"extracted":[24],"during":[25],"discharge":[26,43],"process":[27,68],"and":[28,57,69,112],"amplified":[29],"by":[30],"cross-coupled":[32],"inverter":[33],"to":[34,109,118],"generate":[35],"response.":[37],"At":[38],"beginning":[40],"process,":[44],"NMOSs":[46],"are":[47],"biased":[48],"at":[49],"sub-threshold":[50],"region,":[51],"can":[53,132],"improve":[54],"reliability":[56],"stability.":[58],"proposed":[60,130],"PUF":[61,131],"designed":[63],"in":[64],"40nm":[66],"CMOS":[67],"each":[70],"bit":[71,90],"cell":[72],"only":[73],"consumes":[74],"4.98":[75],"\u03bcm":[76],"<sup":[77,81],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[78,82],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[79,83],"(3112F":[80],").":[84],"Post":[85],"simulation":[86],"shows":[87],"that":[88],"error":[91],"rate":[92],"(BER)":[93],"deterioration":[94],"0.96%":[96],"per":[97,100],"0.1V,":[98],"0.36%":[99],"10\u00b0":[101],"C":[102,108,111],"with":[103],"temperature":[104],"variations":[105,115],"from":[106,116],"-40\u00b0":[107],"80\u00b0":[110],"supply":[113],"voltage":[114],"0.9V":[117],"1.3V.":[119],"It":[120],"achieves":[121],"1.8%":[122],"native":[123],"instability":[124],"through":[125],"simulation.":[127],"Meanwhile,":[128],"retain":[133],"after":[136],"response":[138],"generated.":[140]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":3}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}