{"id":"https://openalex.org/W3157243988","doi":"https://doi.org/10.1109/iscas51556.2021.9401294","title":"Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory","display_name":"Fully Single Event Double Node Upset Tolerant Design for Magnetic Random Access Memory","publication_year":2021,"publication_date":"2021-04-27","ids":{"openalex":"https://openalex.org/W3157243988","doi":"https://doi.org/10.1109/iscas51556.2021.9401294","mag":"3157243988"},"language":"en","primary_location":{"id":"doi:10.1109/iscas51556.2021.9401294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401294","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015796602","display_name":"Deming Zhang","orcid":"https://orcid.org/0000-0001-7261-371X"},"institutions":[{"id":"https://openalex.org/I4210135175","display_name":"Hefei Institute of Technology Innovation","ror":"https://ror.org/044wmmj34","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210135175"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Deming Zhang","raw_affiliation_strings":["Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","Hefei Innovation Research Institute, Beihang University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hefei Innovation Research Institute, Beihang University, Hefei, China","institution_ids":["https://openalex.org/I4210135175","https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100352422","display_name":"Xian Wang","orcid":"https://orcid.org/0000-0003-4113-8084"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xian Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100679705","display_name":"Kaili Zhang","orcid":"https://orcid.org/0000-0002-5926-2019"},"institutions":[{"id":"https://openalex.org/I4210135175","display_name":"Hefei Institute of Technology Innovation","ror":"https://ror.org/044wmmj34","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210135175"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaili Zhang","raw_affiliation_strings":["Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","Hefei Innovation Research Institute, Beihang University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hefei Innovation Research Institute, Beihang University, Hefei, China","institution_ids":["https://openalex.org/I4210135175","https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004861658","display_name":"Lang Zeng","orcid":"https://orcid.org/0000-0003-3157-1087"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lang Zeng","raw_affiliation_strings":["Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100430217","display_name":"You Wang","orcid":"https://orcid.org/0000-0002-6917-2199"},"institutions":[{"id":"https://openalex.org/I4210135175","display_name":"Hefei Institute of Technology Innovation","ror":"https://ror.org/044wmmj34","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210135175"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"You Wang","raw_affiliation_strings":["Hefei Innovation Research Institute, Beihang University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei Innovation Research Institute, Beihang University, Hefei, China","institution_ids":["https://openalex.org/I4210135175","https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071375151","display_name":"Wang Bi","orcid":"https://orcid.org/0000-0002-3591-4764"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bi Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076875525","display_name":"Erya Deng","orcid":"https://orcid.org/0000-0001-5064-8057"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Erya Deng","raw_affiliation_strings":["Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081405502","display_name":"Chuanjie Wang","orcid":"https://orcid.org/0000-0002-5171-7322"},"institutions":[{"id":"https://openalex.org/I4210135175","display_name":"Hefei Institute of Technology Innovation","ror":"https://ror.org/044wmmj34","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210135175"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuanjie Wang","raw_affiliation_strings":["Hefei Innovation Research Institute, Beihang University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei Innovation Research Institute, Beihang University, Hefei, China","institution_ids":["https://openalex.org/I4210135175","https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033366028","display_name":"Peng Wu","orcid":"https://orcid.org/0000-0001-7031-410X"},"institutions":[{"id":"https://openalex.org/I4210135175","display_name":"Hefei Institute of Technology Innovation","ror":"https://ror.org/044wmmj34","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210135175"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Wu","raw_affiliation_strings":["Hefei Innovation Research Institute, Beihang University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hefei Innovation Research Institute, Beihang University, Hefei, China","institution_ids":["https://openalex.org/I4210135175","https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018693228","display_name":"Youguang Zhang","orcid":"https://orcid.org/0009-0008-0928-4210"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Youguang Zhang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066473925","display_name":"Weisheng Zhao","orcid":"https://orcid.org/0000-0001-8088-0404"},"institutions":[{"id":"https://openalex.org/I4210135175","display_name":"Hefei Institute of Technology Innovation","ror":"https://ror.org/044wmmj34","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210135175"]},{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weisheng Zhao","raw_affiliation_strings":["Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","Hefei Innovation Research Institute, Beihang University, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"Hefei Innovation Research Institute, Beihang University, Hefei, China","institution_ids":["https://openalex.org/I4210135175","https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7110477685928345},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.5890188813209534},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5637438893318176},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5429515838623047},{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.5041064023971558},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.4874139130115509},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.4485546052455902},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41465669870376587},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3306617736816406},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3229178786277771},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3002891540527344},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.24485960602760315},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22126376628875732},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19038125872612}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7110477685928345},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.5890188813209534},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5637438893318176},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5429515838623047},{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.5041064023971558},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.4874139130115509},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.4485546052455902},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41465669870376587},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3306617736816406},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3229178786277771},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3002891540527344},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.24485960602760315},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22126376628875732},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19038125872612},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas51556.2021.9401294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401294","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1517543257","https://openalex.org/W1992189211","https://openalex.org/W1999684426","https://openalex.org/W2083945164","https://openalex.org/W2277230396","https://openalex.org/W2328430807","https://openalex.org/W2343971715","https://openalex.org/W2563033551","https://openalex.org/W2563149694","https://openalex.org/W2606629210","https://openalex.org/W2773210904","https://openalex.org/W2906571642","https://openalex.org/W2908947028","https://openalex.org/W2964089300","https://openalex.org/W2966392516","https://openalex.org/W2980855339","https://openalex.org/W3010771362","https://openalex.org/W6996061272"],"related_works":["https://openalex.org/W2102538861","https://openalex.org/W2765704306","https://openalex.org/W2123934961","https://openalex.org/W1540420234","https://openalex.org/W2161646799","https://openalex.org/W3208260600","https://openalex.org/W2065552285","https://openalex.org/W2051386096","https://openalex.org/W1490775144","https://openalex.org/W2139254480"],"abstract_inverted_index":{"Benefitting":[0],"from":[1],"its":[2,28,57,114,123,127,158,162],"non-volatility,":[3],"high":[4,29],"speed,":[5],"low":[6,215],"power":[7],"and":[8,23,40,56,71,121,143,160,214],"inherent":[9],"radiation":[10],"hardened":[11],"characteristic,":[12],"magnetic":[13],"random":[14],"access":[15],"memory":[16],"(MRAM)":[17],"has":[18,37],"been":[19,38,154],"used":[20,42],"in":[21,43,102],"aerospace":[22],"avionic":[24],"electronics.":[25],"Owing":[26],"to":[27,62,98,156,188],"sensing":[30,58],"reliability,":[31],"precharge":[32],"differential":[33],"sense":[34],"amplifier":[35],"(PCDSA)":[36],"proposed":[39],"widely":[41],"MRAM":[44],"products.":[45],"However,":[46],"such":[47],"PCDSA":[48,97],"is":[49,60,134,201],"based":[50],"on":[51],"the":[52,66,73,81,87,100,104,117,130,172,175,178,192,196,223],"conventional":[53],"CMOS":[54,82,146],"technology":[55,83],"result":[59],"prone":[61],"be":[63],"affected":[64],"by":[65],"single":[67,74],"event":[68,75],"upset":[69,78],"(SEU)":[70],"even":[72],"double":[76],"node":[77,84],"(SEDU)":[79],"when":[80,113,126,174],"shrinks":[85],"into":[86],"nanometer":[88],"scale.":[89],"In":[90,191],"this":[91],"paper,":[92],"we":[93],"propose":[94],"a":[95,138,144,207],"novel":[96],"tolerate":[99,171],"SEDU,":[101],"which":[103],"special":[105],"three-input":[106],"C-element":[107],"that":[108,167],"behaves":[109],"as":[110],"an":[111],"inverter":[112],"inputs":[115,128],"have":[116,129,153],"same":[118],"logic":[119,132],"value":[120,125],"holds":[122],"previous":[124],"different":[131],"values":[133],"employed.":[135],"By":[136],"using":[137],"physics-based":[139],"STT-MTJ":[140],"compact":[141],"model":[142],"commercial":[145],"40":[147],"nm":[148],"design":[149],"kit,":[150],"hybrid":[151],"simulations":[152],"performed":[155],"demonstrate":[157],"functionality":[159],"evaluate":[161],"performance.":[163],"Simulation":[164],"results":[165],"show":[166],"it":[168,204],"can":[169,205],"fully":[170],"SEDU":[173],"amount":[176],"of":[177,211,219,229],"deposited":[179],"charge":[180],"(Q":[181],"<sub":[182,198,226],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[183,199,227],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">inj</sub>":[184,200],")":[185],"reaches":[186],"up":[187],"2":[189,202],"pC.":[190],"worst":[193],"case":[194],"where":[195],"Q":[197],"pC,":[203],"achieve":[206],"small":[208],"recover":[209,216],"time":[210],"1.3368":[212],"ns":[213],"energy":[217],"dissipation":[218],"1.967":[220],"pJ":[221],"with":[222],"optimized":[224],"V":[225],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</sub>":[228],"1":[230],"V.":[231]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}