{"id":"https://openalex.org/W3158615101","doi":"https://doi.org/10.1109/iscas51556.2021.9401190","title":"FreePDK15TFET: An Open-Source Process Design Kit for 15nm CMOS and TFET devices","display_name":"FreePDK15TFET: An Open-Source Process Design Kit for 15nm CMOS and TFET devices","publication_year":2021,"publication_date":"2021-04-27","ids":{"openalex":"https://openalex.org/W3158615101","doi":"https://doi.org/10.1109/iscas51556.2021.9401190","mag":"3158615101"},"language":"en","primary_location":{"id":"doi:10.1109/iscas51556.2021.9401190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401190","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033564217","display_name":"Kaiquan Chen","orcid":"https://orcid.org/0000-0003-2484-6644"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kaiquan Chen","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101449175","display_name":"Ce Ma","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ce Ma","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110132991","display_name":"Qing Zhang","orcid":"https://orcid.org/0000-0002-9111-9693"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qing Zhang","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100764158","display_name":"Yongfu Li","orcid":"https://orcid.org/0000-0002-6322-8614"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongfu Li","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045329560","display_name":"Jian Zhao","orcid":"https://orcid.org/0000-0003-2140-1236"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian Zhao","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101945679","display_name":"Mingyi Chen","orcid":"https://orcid.org/0000-0003-3886-9441"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingyi Chen","raw_affiliation_strings":["Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China"],"affiliations":[{"raw_affiliation_string":"Department of Micro-Nano Electronics and MoE Key Lab of Artificial Intelligence, Shanghai Jiao Tong University, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5033564217"],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":0.5056,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.63289459,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cadence","display_name":"Cadence","score":0.7164590954780579},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6180636286735535},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5652160048484802},{"id":"https://openalex.org/keywords/open-source","display_name":"Open source","score":0.5633516907691956},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4823702871799469},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.45806175470352173},{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.4513987898826599},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.44416236877441406},{"id":"https://openalex.org/keywords/integrated-circuit-design","display_name":"Integrated circuit design","score":0.41215741634368896},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3504626154899597},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3049905598163605},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.23586228489875793},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23384591937065125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1641765832901001},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13802039623260498},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08279314637184143},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.08261048793792725}],"concepts":[{"id":"https://openalex.org/C2777125575","wikidata":"https://www.wikidata.org/wiki/Q14088448","display_name":"Cadence","level":2,"score":0.7164590954780579},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6180636286735535},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5652160048484802},{"id":"https://openalex.org/C3018397939","wikidata":"https://www.wikidata.org/wiki/Q3644502","display_name":"Open source","level":3,"score":0.5633516907691956},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4823702871799469},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.45806175470352173},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.4513987898826599},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.44416236877441406},{"id":"https://openalex.org/C74524168","wikidata":"https://www.wikidata.org/wiki/Q1074539","display_name":"Integrated circuit design","level":2,"score":0.41215741634368896},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3504626154899597},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3049905598163605},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.23586228489875793},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23384591937065125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1641765832901001},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13802039623260498},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08279314637184143},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.08261048793792725}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas51556.2021.9401190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas51556.2021.9401190","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","id":"https://metadata.un.org/sdg/16","score":0.6100000143051147}],"awards":[],"funders":[{"id":"https://openalex.org/F4320337504","display_name":"Research and Development","ror":"https://ror.org/027s68j25"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1896020517","https://openalex.org/W1991353080","https://openalex.org/W2005237402","https://openalex.org/W2005375718","https://openalex.org/W2035066119","https://openalex.org/W2040389404","https://openalex.org/W2043393912","https://openalex.org/W2046728768","https://openalex.org/W2066949876","https://openalex.org/W2107493323","https://openalex.org/W2108189051","https://openalex.org/W2120000030","https://openalex.org/W2126570492","https://openalex.org/W2137923776","https://openalex.org/W2143451736","https://openalex.org/W2148274083","https://openalex.org/W2296487105","https://openalex.org/W2346205343","https://openalex.org/W2362493683","https://openalex.org/W2403120204","https://openalex.org/W2509214963","https://openalex.org/W2515432102","https://openalex.org/W2516816469","https://openalex.org/W2518738266","https://openalex.org/W2534246225","https://openalex.org/W2583522611","https://openalex.org/W2612823585","https://openalex.org/W2745363217","https://openalex.org/W2751364724","https://openalex.org/W2811336796","https://openalex.org/W2943339956","https://openalex.org/W2964469666","https://openalex.org/W2965634106","https://openalex.org/W2977387063","https://openalex.org/W3013639471","https://openalex.org/W3082956421","https://openalex.org/W3098560727","https://openalex.org/W3104831066","https://openalex.org/W3157939802","https://openalex.org/W6651883897","https://openalex.org/W6725286647","https://openalex.org/W6725492686","https://openalex.org/W6737630556","https://openalex.org/W6743457036"],"related_works":["https://openalex.org/W4289538008","https://openalex.org/W3186427148","https://openalex.org/W2138282914","https://openalex.org/W2065850627","https://openalex.org/W2017012638","https://openalex.org/W1966793535","https://openalex.org/W2071885361","https://openalex.org/W1964447062","https://openalex.org/W2088265144","https://openalex.org/W1704530861"],"abstract_inverted_index":{"With":[0],"Moore's":[1],"law":[2],"reaching":[3],"its":[4,78],"limits,":[5],"the":[6,18,99,105,108,112,115],"use":[7],"of":[8,21,36,45,107],"new":[9,12,132],"materials":[10],"or":[11],"devices'":[13],"structure":[14],"has":[15],"emerged":[16],"as":[17],"next":[19],"generation":[20],"CMOS":[22],"devices.":[23,134],"Among":[24],"all,":[25],"tunneling":[26],"field-effect":[27],"transistors":[28],"(TFETs)":[29],"have":[30],"achieved":[31],"a":[32,43,46],"steep":[33],"sub-threshold":[34],"slope":[35],"less":[37],"than":[38],"60mV/decade":[39],"yet":[40],"there":[41],"is":[42,66],"lack":[44],"complete":[47],"process":[48],"design":[49,95],"kit":[50],"(PDK)":[51],"for":[52,73],"large-scale":[53],"circuit":[54,97,113],"design.":[55],"Hence,":[56],"we":[57],"present":[58],"an":[59],"open-source":[60,74,122],"15nm":[61],"TFET":[62,75],"PDK":[63,123],"(15nmTFETPDK),":[64],"which":[65],"based":[67],"on":[68],"FreePDK15":[69],"with":[70,131],"additional":[71],"support":[72],"models":[76],"and":[77,86,103,111],"associated":[79],"Cadence":[80,100],"Virtuoso":[81,101],"pcell":[82],"in":[83,98],"OA":[84],"format":[85],"Mentor":[87],"Calibre":[88,116],"physical":[89],"verification":[90],"files.":[91],"Our":[92],"users":[93],"can":[94],"their":[96,129],"platform":[102],"verify":[104],"consistency":[106],"drawn":[109],"layout":[110],"through":[114],"Platform.":[117],"We":[118],"hope":[119],"that":[120],"this":[121],"allows":[124],"them":[125],"to":[126],"further":[127],"advance":[128],"research":[130],"emerging":[133]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2021,"cited_by_count":1}],"updated_date":"2026-03-12T08:34:05.389933","created_date":"2025-10-10T00:00:00"}