{"id":"https://openalex.org/W4312919846","doi":"https://doi.org/10.1109/iscas48785.2022.9937843","title":"A High Resolution Chemical Sensing Front-end with Integrated Sigma Delta Quantisation","display_name":"A High Resolution Chemical Sensing Front-end with Integrated Sigma Delta Quantisation","publication_year":2022,"publication_date":"2022-05-28","ids":{"openalex":"https://openalex.org/W4312919846","doi":"https://doi.org/10.1109/iscas48785.2022.9937843"},"language":"en","primary_location":{"id":"doi:10.1109/iscas48785.2022.9937843","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas48785.2022.9937843","pdf_url":null,"source":{"id":"https://openalex.org/S4363604393","display_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100343262","display_name":"Xiuli Zhang","orcid":"https://orcid.org/0000-0003-1374-5100"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiuli Zhang","raw_affiliation_strings":["Beihang University,School of Integrated Circuit Science and Engineering,China","School of Integrated Circuit Science and Engineering, Beihang University, China"],"affiliations":[{"raw_affiliation_string":"Beihang University,School of Integrated Circuit Science and Engineering,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, Beihang University, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039799290","display_name":"Jinge Ma","orcid":"https://orcid.org/0009-0004-7249-8175"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinge Ma","raw_affiliation_strings":["Beihang University,School of Integrated Circuit Science and Engineering,China","School of Integrated Circuit Science and Engineering, Beihang University, China"],"affiliations":[{"raw_affiliation_string":"Beihang University,School of Integrated Circuit Science and Engineering,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, Beihang University, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101698140","display_name":"Yuanqi Hu","orcid":"https://orcid.org/0000-0001-9179-6603"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuanqi Hu","raw_affiliation_strings":["Beihang University,School of Integrated Circuit Science and Engineering,China","School of Integrated Circuit Science and Engineering, Beihang University, China"],"affiliations":[{"raw_affiliation_string":"Beihang University,School of Integrated Circuit Science and Engineering,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Integrated Circuit Science and Engineering, Beihang University, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5100343262"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":3.7888,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.94214876,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"2831","last_page":"2835"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11434","display_name":"Electrochemical Analysis and Applications","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/1603","display_name":"Electrochemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oversampling","display_name":"Oversampling","score":0.8381026983261108},{"id":"https://openalex.org/keywords/resistor","display_name":"Resistor","score":0.6449770927429199},{"id":"https://openalex.org/keywords/front-and-back-ends","display_name":"Front and back ends","score":0.5933603048324585},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.5295753479003906},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5096859931945801},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5093889832496643},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5057427883148193},{"id":"https://openalex.org/keywords/correlated-double-sampling","display_name":"Correlated double sampling","score":0.4701566696166992},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4597388207912445},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4345168471336365},{"id":"https://openalex.org/keywords/sigma","display_name":"Sigma","score":0.43125927448272705},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40952032804489136},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38474327325820923},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3468441367149353},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.255850613117218},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.14188843965530396}],"concepts":[{"id":"https://openalex.org/C197323446","wikidata":"https://www.wikidata.org/wiki/Q331222","display_name":"Oversampling","level":3,"score":0.8381026983261108},{"id":"https://openalex.org/C137488568","wikidata":"https://www.wikidata.org/wiki/Q5321","display_name":"Resistor","level":3,"score":0.6449770927429199},{"id":"https://openalex.org/C53016008","wikidata":"https://www.wikidata.org/wiki/Q620167","display_name":"Front and back ends","level":2,"score":0.5933603048324585},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.5295753479003906},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5096859931945801},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5093889832496643},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5057427883148193},{"id":"https://openalex.org/C118277053","wikidata":"https://www.wikidata.org/wiki/Q5172837","display_name":"Correlated double sampling","level":4,"score":0.4701566696166992},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4597388207912445},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4345168471336365},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.43125927448272705},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40952032804489136},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38474327325820923},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3468441367149353},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.255850613117218},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.14188843965530396},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas48785.2022.9937843","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas48785.2022.9937843","pdf_url":null,"source":{"id":"https://openalex.org/S4363604393","display_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1488906674","https://openalex.org/W1965337435","https://openalex.org/W1988929438","https://openalex.org/W2050955442","https://openalex.org/W2087000982","https://openalex.org/W2338846602","https://openalex.org/W2467093478","https://openalex.org/W2497865807","https://openalex.org/W2908311510","https://openalex.org/W2937598339","https://openalex.org/W2962639249","https://openalex.org/W3010520048","https://openalex.org/W3132918761"],"related_works":["https://openalex.org/W2097165798","https://openalex.org/W3106820999","https://openalex.org/W2109959073","https://openalex.org/W2098290082","https://openalex.org/W2027122833","https://openalex.org/W2072033551","https://openalex.org/W2156695921","https://openalex.org/W1580949387","https://openalex.org/W4312919846","https://openalex.org/W2391609987"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"propose":[4],"a":[5,76,109],"novel":[6],"high-resolution":[7],"chemical":[8,18,43,120],"sensing":[9,19],"front-end":[10],"with":[11,32,108],"integrated":[12],"sigma":[13],"delta":[14],"quantisation,":[15],"and":[16,71,94],"the":[17,24,42,46,53,64,69,98],"capability":[20],"is":[21,60,73],"realised":[22],"by":[23],"intrinsic":[25],"passivation":[26],"layer.":[27],"A":[28,58],"charge":[29],"transfer":[30],"amplifier":[31],"adjustable":[33],"pre-amplification":[34],"has":[35],"been":[36],"adopted":[37],"to":[38,45,62,83,104],"not":[39],"only":[40],"transmit":[41],"signal":[44],"next":[47],"sampling":[48],"stage,":[49],"but":[50],"also":[51],"alleviate":[52],"kT/C":[54],"thermal":[55],"noise":[56,95],"requirement.":[57],"pseudo-resistor":[59],"added":[61],"provide":[63],"DC":[65],"operating":[66],"points":[67],"for":[68,116],"front-end,":[70],"it":[72,114],"implemented":[74],"via":[75],"MOS":[77],"transistor":[78],"applying":[79],"direct":[80],"tunnelling":[81],"effect":[82],"achieve":[84],"huge":[85],"resistance":[86],"value.":[87],"Simulation":[88],"results":[89],"show":[90],"that":[91],"through":[92],"oversampling":[93],"shaping":[96],"functions,":[97],"final":[99],"resolution":[100],"can":[101],"reach":[102],"up":[103],"90.1":[105],"dB":[106],"even":[107],"0.3V":[110],"input":[111],"signal,":[112],"making":[113],"suitable":[115],"applications":[117],"requiring":[118],"high-precision":[119],"detection.":[121]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}