{"id":"https://openalex.org/W4312893281","doi":"https://doi.org/10.1109/iscas48785.2022.9937644","title":"Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection","display_name":"Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection","publication_year":2022,"publication_date":"2022-05-28","ids":{"openalex":"https://openalex.org/W4312893281","doi":"https://doi.org/10.1109/iscas48785.2022.9937644"},"language":"en","primary_location":{"id":"doi:10.1109/iscas48785.2022.9937644","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas48785.2022.9937644","pdf_url":null,"source":{"id":"https://openalex.org/S4363604393","display_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5085774561","display_name":"Marampally Saikiran","orcid":"https://orcid.org/0000-0002-1178-4600"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Marampally Saikiran","raw_affiliation_strings":["Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091599715","display_name":"Mona Ganji","orcid":null},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mona Ganji","raw_affiliation_strings":["Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA","institution_ids":["https://openalex.org/I173911158"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Iowa, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5085774561"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":2.5735,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.91465863,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1580","last_page":"1584"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.6092394590377808},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.6006015539169312},{"id":"https://openalex.org/keywords/spice","display_name":"Spice","score":0.593621015548706},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5644133687019348},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5441771745681763},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5334874391555786},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5151525735855103},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.49521151185035706},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4501408040523529},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.4184276759624481},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.29588812589645386},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2332984209060669},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2219873070716858},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09949031472206116}],"concepts":[{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.6092394590377808},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6006015539169312},{"id":"https://openalex.org/C2780077345","wikidata":"https://www.wikidata.org/wiki/Q16891888","display_name":"Spice","level":2,"score":0.593621015548706},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5644133687019348},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5441771745681763},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5334874391555786},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5151525735855103},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.49521151185035706},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4501408040523529},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.4184276759624481},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.29588812589645386},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2332984209060669},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2219873070716858},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09949031472206116},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas48785.2022.9937644","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas48785.2022.9937644","pdf_url":null,"source":{"id":"https://openalex.org/S4363604393","display_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.550000011920929}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W3758558","https://openalex.org/W2109125616","https://openalex.org/W2482574974","https://openalex.org/W2576845151","https://openalex.org/W2767758697","https://openalex.org/W2781709338","https://openalex.org/W3038743613","https://openalex.org/W3039413211","https://openalex.org/W3124483665","https://openalex.org/W3173039236","https://openalex.org/W4246714199"],"related_works":["https://openalex.org/W2204879205","https://openalex.org/W2096437374","https://openalex.org/W1943174035","https://openalex.org/W1928481607","https://openalex.org/W3135165657","https://openalex.org/W1485582195","https://openalex.org/W57337972","https://openalex.org/W2313216219","https://openalex.org/W1561306903","https://openalex.org/W2912670917"],"abstract_inverted_index":{"The":[0,82,99],"number":[1],"of":[2,15,33,102,133],"electronic":[3],"components":[4],"in":[5,24,36,77,96,147,161,180],"mission-critical":[6],"applications":[7],"is":[8,20,32,52],"increasing":[9,40],"rapidly":[10],"and,":[11],"with":[12,45],"the":[13,25,39,54,103,109,134],"dawn":[14],"electric":[16],"vehicles,":[17],"this":[18,63,162],"increase":[19],"expected":[21],"to":[22,57,74,92,131,177],"accelerate":[23],"near":[26],"future.":[27],"As":[28],"functional":[29],"safety":[30],"(FuSa)":[31],"utmost":[34],"importance":[35],"these":[37],"applications,":[38],"demand":[41],"for":[42,68],"integrated":[43],"circuits":[44],"zero":[46],"defective":[47],"parts":[48],"per":[49],"million":[50],"(DPPM)":[51],"pressing":[53],"chip":[55],"industry":[56],"achieve":[58],"high":[59,137],"defect":[60],"coverage.":[61],"In":[62],"paper,":[64],"simple":[65,146,168],"digital":[66,86,100],"Design":[67],"Test":[69],"(DfT)":[70],"techniques":[71],"are":[72,145,150],"presented":[73],"detect":[75,93,129],"defects":[76,95,135],"Low":[78],"Drop-Out":[79],"Regulators":[80],"(LDO).":[81],"proposed":[83,104],"method":[84,105,127],"uses":[85],"mismatch":[87],"injection":[88],"and":[89,115,143,154,169],"digital-like":[90],"detectors":[91,144],"various":[94],"an":[97],"LDO.":[98],"nature":[101],"can":[106,128,174],"help":[107],"reduce":[108],"test":[110],"cost":[111],"by":[112],"avoiding":[113],"expensive":[114],"time-consuming":[116],"analog":[117],"testing":[118],"circuitry.":[119],"Using":[120],"spice":[121],"simulations,":[122],"we":[123,164],"show":[124],"that":[125,173],"our":[126,141],"up":[130],"97.5%":[132],"providing":[136],"defect-coverage.":[138],"Additionally,":[139],"as":[140],"injectors":[142],"nature,":[148],"they":[149],"not":[151],"only":[152],"area-efficient":[153],"easy-to-design":[155],"but":[156],"also":[157,165],"easily":[158],"scalable.":[159],"Furthermore,":[160],"work,":[163],"introduce":[166],"a":[167],"robust":[170],"dual-threshold":[171],"detector":[172],"be":[175],"used":[176],"monitor":[178],"faults":[179],"biasing":[181],"circuits.":[182]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":3}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}