{"id":"https://openalex.org/W4312884710","doi":"https://doi.org/10.1109/iscas48785.2022.9937540","title":"SEE Sensitivity of a 16GHz LC-Tank VCO in a 22nm FinFET Technology","display_name":"SEE Sensitivity of a 16GHz LC-Tank VCO in a 22nm FinFET Technology","publication_year":2022,"publication_date":"2022-05-28","ids":{"openalex":"https://openalex.org/W4312884710","doi":"https://doi.org/10.1109/iscas48785.2022.9937540"},"language":"en","primary_location":{"id":"doi:10.1109/iscas48785.2022.9937540","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas48785.2022.9937540","pdf_url":null,"source":{"id":"https://openalex.org/S4363604393","display_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007274048","display_name":"David Dolt","orcid":"https://orcid.org/0009-0000-8995-7359"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"David Dolt","raw_affiliation_strings":["Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States"],"affiliations":[{"raw_affiliation_string":"Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053352111","display_name":"Quintin Livingston","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Quintin Livingston","raw_affiliation_strings":["Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States"],"affiliations":[{"raw_affiliation_string":"Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100392648","display_name":"Tong Liu","orcid":"https://orcid.org/0000-0002-4563-167X"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tong Liu","raw_affiliation_strings":["Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States"],"affiliations":[{"raw_affiliation_string":"Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ankur Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ankur Kumar","raw_affiliation_strings":["Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States"],"affiliations":[{"raw_affiliation_string":"Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States","institution_ids":["https://openalex.org/I117023288"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002814402","display_name":"Samuel Palermo","orcid":"https://orcid.org/0000-0002-6555-1474"},"institutions":[{"id":"https://openalex.org/I117023288","display_name":"Analog Devices (United States)","ror":"https://ror.org/01545pm61","country_code":"US","type":"company","lineage":["https://openalex.org/I117023288"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Samuel Palermo","raw_affiliation_strings":["Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States"],"affiliations":[{"raw_affiliation_string":"Texas A&#x0026;M University,Analog and Mixed-Signal Center College Station,TX,United States","institution_ids":["https://openalex.org/I117023288"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5007274048"],"corresponding_institution_ids":["https://openalex.org/I117023288"],"apc_list":null,"apc_paid":null,"fwci":1.2795,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.79325652,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"254","last_page":"257"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-controlled-oscillator","display_name":"Voltage-controlled oscillator","score":0.8948113918304443},{"id":"https://openalex.org/keywords/phase-noise","display_name":"Phase noise","score":0.5884247422218323},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5192261338233948},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5110663175582886},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4894779920578003},{"id":"https://openalex.org/keywords/linear-energy-transfer","display_name":"Linear energy transfer","score":0.4818671643733978},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45196446776390076},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.44556111097335815},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41736865043640137},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4108223021030426},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.39526116847991943},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3520869016647339},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3368683457374573},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2721886932849884},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.12070783972740173}],"concepts":[{"id":"https://openalex.org/C5291336","wikidata":"https://www.wikidata.org/wiki/Q852341","display_name":"Voltage-controlled oscillator","level":3,"score":0.8948113918304443},{"id":"https://openalex.org/C89631360","wikidata":"https://www.wikidata.org/wiki/Q1428766","display_name":"Phase noise","level":2,"score":0.5884247422218323},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5192261338233948},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5110663175582886},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4894779920578003},{"id":"https://openalex.org/C86611320","wikidata":"https://www.wikidata.org/wiki/Q1699996","display_name":"Linear energy transfer","level":3,"score":0.4818671643733978},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45196446776390076},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.44556111097335815},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41736865043640137},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4108223021030426},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.39526116847991943},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3520869016647339},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3368683457374573},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2721886932849884},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.12070783972740173},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas48785.2022.9937540","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas48785.2022.9937540","pdf_url":null,"source":{"id":"https://openalex.org/S4363604393","display_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2099064239","https://openalex.org/W2525440932","https://openalex.org/W2765556146","https://openalex.org/W2791440917","https://openalex.org/W2914643564","https://openalex.org/W2921602684","https://openalex.org/W3189459149"],"related_works":["https://openalex.org/W3129408886","https://openalex.org/W4233090067","https://openalex.org/W2365946217","https://openalex.org/W1964543336","https://openalex.org/W2368638770","https://openalex.org/W2365449259","https://openalex.org/W2057338677","https://openalex.org/W2105518569","https://openalex.org/W2285615337","https://openalex.org/W2539579532"],"abstract_inverted_index":{"Voltage-controlled":[0],"oscillators":[1],"(VCOs)":[2],"are":[3,130],"essential":[4,46],"components":[5],"of":[6,52,104],"frequency":[7],"synthesizers":[8],"used":[9],"in":[10,14,56,71,137],"space-based":[11],"applications.":[12],"Radiation":[13],"harsh":[15],"space":[16],"environments":[17],"can":[18,62],"cause":[19],"SEEs":[20],"(single-event":[21],"effects)":[22],"when":[23,109],"a":[24,33,53,72,86,90,98,115],"charged":[25],"particle":[26],"hits":[27],"the":[28,37,49],"silicon":[29],"substrate":[30],"and":[31,76,81],"induces":[32],"transient":[34],"current":[35],"within":[36],"circuit":[38],"that":[39,61],"causes":[40],"erroneous":[41],"behavior.":[42],"Hence,":[43],"it":[44],"is":[45,69,95],"to":[47,58,121],"understand":[48],"radiation":[50],"sensitivity":[51,94],"given":[54],"process":[55,75],"order":[57],"design":[59],"circuits":[60],"tolerate":[63],"these":[64],"conditions.":[65],"An":[66],"LC-tank":[67],"VCO":[68,100,135],"designed":[70],"22nm":[73],"FinFET":[74],"achieves":[77],"12.5-16.8GHz":[78],"tuning":[79],"range":[80],"\u2212126dBc/Hz":[82],"phase":[83],"noise":[84],"at":[85],"10MHz":[87],"offset":[88],"from":[89,119],"16.0GHz":[91],"carrier.":[92],"SEE":[93],"quantified":[96],"with":[97,111,114],"measured":[99],"maximum":[101],"cross-sectional":[102],"area":[103],"350um":[105],"<sup":[106,124],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[107,125],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[108,126],"testing":[110],"heavy":[112],"ions":[113],"linear":[116],"energy":[117],"transfer":[118],"10":[120],"90":[122],"MeV.cm":[123],"/mg.":[127],"These":[128],"results":[129],"pertinent":[131],"for":[132],"future":[133],"radiation-hardened":[134],"designs":[136],"this":[138],"process.":[139]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}