{"id":"https://openalex.org/W4312897770","doi":"https://doi.org/10.1109/iscas48785.2022.9937296","title":"A 2.5-GS/s Time-Interleaved SAR-Assisted Ringamp-Based Pipelined ADC with Digital Background Calibration","display_name":"A 2.5-GS/s Time-Interleaved SAR-Assisted Ringamp-Based Pipelined ADC with Digital Background Calibration","publication_year":2022,"publication_date":"2022-05-28","ids":{"openalex":"https://openalex.org/W4312897770","doi":"https://doi.org/10.1109/iscas48785.2022.9937296"},"language":"en","primary_location":{"id":"doi:10.1109/iscas48785.2022.9937296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas48785.2022.9937296","pdf_url":null,"source":{"id":"https://openalex.org/S4363604393","display_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084951849","display_name":"Jingchao Lan","orcid":"https://orcid.org/0000-0003-2861-1906"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jingchao Lan","raw_affiliation_strings":["Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078440143","display_name":"Danfeng Zhai","orcid":"https://orcid.org/0000-0002-1616-9906"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Danfeng Zhai","raw_affiliation_strings":["Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101867100","display_name":"Yongzhen Chen","orcid":"https://orcid.org/0000-0002-1018-6289"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongzhen Chen","raw_affiliation_strings":["Tongji University,College of electronic and information engineering,Shanghai,China","College of electronic and information engineering, Tongji University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Tongji University,College of electronic and information engineering,Shanghai,China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"College of electronic and information engineering, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022489940","display_name":"Zhekan Ni","orcid":null},"institutions":[{"id":"https://openalex.org/I50760025","display_name":"Hangzhou Dianzi University","ror":"https://ror.org/0576gt767","country_code":"CN","type":"education","lineage":["https://openalex.org/I50760025"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhekan Ni","raw_affiliation_strings":["Hangzhou Dianzi University,The electronics and information college,Hangzhou,China","The electronics and information college, Hangzhou Dianzi University, Hangzhou, China"],"affiliations":[{"raw_affiliation_string":"Hangzhou Dianzi University,The electronics and information college,Hangzhou,China","institution_ids":["https://openalex.org/I50760025"]},{"raw_affiliation_string":"The electronics and information college, Hangzhou Dianzi University, Hangzhou, China","institution_ids":["https://openalex.org/I50760025"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073767046","display_name":"Xingchen Shen","orcid":"https://orcid.org/0009-0006-3993-9623"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingchen Shen","raw_affiliation_strings":["Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025053306","display_name":"Fan Ye","orcid":"https://orcid.org/0000-0002-1089-1498"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Ye","raw_affiliation_strings":["Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016448886","display_name":"Junyan Ren","orcid":"https://orcid.org/0000-0002-7799-6251"},"institutions":[{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junyan Ren","raw_affiliation_strings":["Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China"],"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of ASIC &#x0026; System,dept. Microelectronics,Shanghai,China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5084951849"],"corresponding_institution_ids":["https://openalex.org/I24943067","https://openalex.org/I4210132426"],"apc_list":null,"apc_paid":null,"fwci":1.6032,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.84731442,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"2655","last_page":"2659"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/spurious-free-dynamic-range","display_name":"Spurious-free dynamic range","score":0.8634403347969055},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7093760967254639},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.6298655271530151},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5140820145606995},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46164172887802124},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.455262690782547},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.4390369653701782},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.41632080078125},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18615645170211792},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18095925450325012},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1809365153312683},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.15623319149017334},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.06973400712013245}],"concepts":[{"id":"https://openalex.org/C119293636","wikidata":"https://www.wikidata.org/wiki/Q657480","display_name":"Spurious-free dynamic range","level":3,"score":0.8634403347969055},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7093760967254639},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.6298655271530151},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5140820145606995},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46164172887802124},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.455262690782547},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.4390369653701782},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.41632080078125},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18615645170211792},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18095925450325012},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1809365153312683},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.15623319149017334},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.06973400712013245},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas48785.2022.9937296","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas48785.2022.9937296","pdf_url":null,"source":{"id":"https://openalex.org/S4363604393","display_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1981215785","https://openalex.org/W2015794844","https://openalex.org/W2076110738","https://openalex.org/W2116928404","https://openalex.org/W2130395397","https://openalex.org/W2180407616","https://openalex.org/W2792962047","https://openalex.org/W2910052007","https://openalex.org/W2947289897","https://openalex.org/W2964782680","https://openalex.org/W2981076955","https://openalex.org/W3032392452","https://openalex.org/W3175188207","https://openalex.org/W6677428261"],"related_works":["https://openalex.org/W2552855081","https://openalex.org/W2098920926","https://openalex.org/W2143048169","https://openalex.org/W2029461083","https://openalex.org/W1591398904","https://openalex.org/W2139520010","https://openalex.org/W3134433513","https://openalex.org/W2953726986","https://openalex.org/W2157802116","https://openalex.org/W3047813805"],"abstract_inverted_index":{"A":[0,30,61],"2.5":[1,100],"GS/s12-bit":[2],"4-channel":[3],"time-interleaved":[4],"SAR-assisted":[5],"pipelined":[6],"ADC":[7,85],"is":[8,34,68],"proposed.":[9],"The":[10,76],"bias-enhanced":[11],"ring":[12],"amplifier":[13,18],"serves":[14],"as":[15],"a":[16,80,90],"residual":[17],"offering":[19],"high":[20,31],"bandwidth":[21],"and":[22,44],"superior":[23],"power":[24],"efficiency":[25],"over":[26],"conventional":[27],"operational":[28],"amplifier.":[29],"linearity":[32],"front-end":[33],"proposed":[35],"to":[36,70],"mitigate":[37],"the":[38,41,54,58,72,83],"non-linearity":[39],"of":[40,82,96],"ESD":[42],"diode":[43],"provide":[45],"sufficient":[46],"driving":[47],"ability.":[48],"In":[49],"addition,":[50],"it":[51],"can":[52],"reject":[53],"kickback":[55],"noise":[56],"from":[57],"core":[59],"ADC.":[60],"digital":[62],"background":[63],"calibration":[64],"method":[65],"with":[66,79],"digital-mixing":[67],"adopted":[69],"fix":[71],"mismatches":[73],"among":[74],"channels.":[75],"measured":[77],"SNDR/SFDR":[78],"low-frequency":[81],"prototype":[84],"are":[86],"51.0/68.0":[87],"dB,":[88],"achieving":[89],"competitive":[91],"FoM":[92],"<inf":[93],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[94],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">w</inf>":[95],"0.48":[97],"pJ/conv.-step":[98],"at":[99],"GS/s.":[101]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}