{"id":"https://openalex.org/W4385187403","doi":"https://doi.org/10.1109/iscas46773.2023.10181960","title":"Identification of Nodes Most Vulnerable to Voltage Collapse in Cascading Failures of Power Systems","display_name":"Identification of Nodes Most Vulnerable to Voltage Collapse in Cascading Failures of Power Systems","publication_year":2023,"publication_date":"2023-05-21","ids":{"openalex":"https://openalex.org/W4385187403","doi":"https://doi.org/10.1109/iscas46773.2023.10181960"},"language":"en","primary_location":{"id":"doi:10.1109/iscas46773.2023.10181960","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas46773.2023.10181960","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020872843","display_name":"Meixuan Jade Li","orcid":"https://orcid.org/0000-0002-1569-6210"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"Meixuan Jade Li","raw_affiliation_strings":["City University of Hong Kong,Department of Electrical Engineering,Hong Kong","Department of Electrical Engineering, City University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong","institution_ids":["https://openalex.org/I168719708"]},{"raw_affiliation_string":"Department of Electrical Engineering, City University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021923917","display_name":"Chi K. Tse","orcid":"https://orcid.org/0000-0002-0462-3999"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"Chi K. Tse","raw_affiliation_strings":["City University of Hong Kong,Department of Electrical Engineering,Hong Kong","Department of Electrical Engineering, City University of Hong Kong, Hong Kong"],"affiliations":[{"raw_affiliation_string":"City University of Hong Kong,Department of Electrical Engineering,Hong Kong","institution_ids":["https://openalex.org/I168719708"]},{"raw_affiliation_string":"Department of Electrical Engineering, City University of Hong Kong, Hong Kong","institution_ids":["https://openalex.org/I168719708"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5020872843"],"corresponding_institution_ids":["https://openalex.org/I168719708"],"apc_list":null,"apc_paid":null,"fwci":0.9168,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.7406362,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cascading-failure","display_name":"Cascading failure","score":0.8737165927886963},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.6484030485153198},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.6371989846229553},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5926240086555481},{"id":"https://openalex.org/keywords/load-shedding","display_name":"Load Shedding","score":0.5712196230888367},{"id":"https://openalex.org/keywords/power-network","display_name":"Power network","score":0.5280155539512634},{"id":"https://openalex.org/keywords/power-system-protection","display_name":"Power-system protection","score":0.5024373531341553},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5022320747375488},{"id":"https://openalex.org/keywords/power-flow","display_name":"Power flow","score":0.501983642578125},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4282287359237671},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.42552435398101807},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4222016930580139},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.40147513151168823},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3597715198993683},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23849961161613464},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.11496403813362122},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0929507315158844}],"concepts":[{"id":"https://openalex.org/C119323957","wikidata":"https://www.wikidata.org/wiki/Q5048226","display_name":"Cascading failure","level":4,"score":0.8737165927886963},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.6484030485153198},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.6371989846229553},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5926240086555481},{"id":"https://openalex.org/C2779777743","wikidata":"https://www.wikidata.org/wiki/Q5255048","display_name":"Load Shedding","level":4,"score":0.5712196230888367},{"id":"https://openalex.org/C2989126829","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Power network","level":4,"score":0.5280155539512634},{"id":"https://openalex.org/C38361682","wikidata":"https://www.wikidata.org/wiki/Q1756067","display_name":"Power-system protection","level":4,"score":0.5024373531341553},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5022320747375488},{"id":"https://openalex.org/C2986056383","wikidata":"https://www.wikidata.org/wiki/Q556030","display_name":"Power flow","level":4,"score":0.501983642578125},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4282287359237671},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.42552435398101807},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4222016930580139},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.40147513151168823},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3597715198993683},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23849961161613464},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.11496403813362122},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0929507315158844},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas46773.2023.10181960","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas46773.2023.10181960","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"id":"https://metadata.un.org/sdg/11","display_name":"Sustainable cities and communities"}],"awards":[{"id":"https://openalex.org/G1949804966","display_name":null,"funder_award_id":"7005463","funder_id":"https://openalex.org/F4320309893","funder_display_name":"City University of Hong Kong"}],"funders":[{"id":"https://openalex.org/F4320309893","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2084426671","https://openalex.org/W2106126426","https://openalex.org/W2106424475","https://openalex.org/W2107489482","https://openalex.org/W2117082743","https://openalex.org/W2140813422","https://openalex.org/W2284066940","https://openalex.org/W2381162371","https://openalex.org/W2500635232","https://openalex.org/W2580247244","https://openalex.org/W2641613025","https://openalex.org/W2762475736","https://openalex.org/W2901577110","https://openalex.org/W3100116198","https://openalex.org/W4205927411","https://openalex.org/W4210522914"],"related_works":["https://openalex.org/W2350289070","https://openalex.org/W2166439605","https://openalex.org/W2545853327","https://openalex.org/W3092553027","https://openalex.org/W2336056369","https://openalex.org/W2391874384","https://openalex.org/W1991416024","https://openalex.org/W4376481015","https://openalex.org/W2093765635","https://openalex.org/W2766276228"],"abstract_inverted_index":{"Some":[0],"components":[1,28],"in":[2,50,61,120],"a":[3,54,116],"power":[4,82],"system":[5],"are":[6,44,136],"more":[7,137],"vulnerable":[8,27,138],"than":[9,143],"others.":[10,144],"Limited":[11],"by":[12],"the":[13,16,31,41,80,87,90,94,99,106,110,121,134],"capability":[14],"of":[15,21,33,112,133],"existing":[17],"quasi-steady-state":[18],"(QSS)":[19],"models":[20],"cascading":[22,51],"failures,":[23],"previous":[24],"analysis":[25],"on":[26,79],"typically":[29],"omits":[30],"influence":[32],"voltage":[34,48,64,117,140],"collapse.":[35],"In":[36],"this":[37],"paper,":[38],"we":[39],"identify":[40],"nodes":[42],"that":[43,57,114,130],"most":[45],"susceptible":[46],"to":[47,63,89,123,139],"collapse":[49,118,141],"failures":[52],"with":[53],"QSS":[55],"model":[56,76,88],"applies":[58],"practical":[59],"measures":[60],"response":[62],"collapse,":[65],"i.e.,":[66],"undervoltage":[67],"load":[68],"shedding":[69],"(UVLS)":[70],"and":[71,98,108],"protection":[72],"relays.":[73],"The":[74],"proposed":[75],"is":[77],"based":[78],"continuation":[81],"flow":[83],"(CPF).":[84],"We":[85,104],"apply":[86],"IEEE":[91,95],"118-bus":[92],"system,":[93,97],"300-bus":[96],"Polish":[100],"2383":[101],"bus":[102],"system.":[103],"count":[105],"times":[107],"plot":[109],"locations":[111],"buses":[113],"exhibit":[115],"event":[119],"network":[122,135],"assess":[124],"structural":[125],"vulnerability.":[126],"Numerical":[127],"results":[128],"show":[129],"some":[131],"parts":[132],"events":[142]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2026-03-25T14:56:36.534964","created_date":"2025-10-10T00:00:00"}