{"id":"https://openalex.org/W3091357698","doi":"https://doi.org/10.1109/iscas45731.2020.9180986","title":"A Low-Latency Multi-Touch Detector Based on Concurrent Processing of Redesigned Overlap Split and Connected Component Analysis","display_name":"A Low-Latency Multi-Touch Detector Based on Concurrent Processing of Redesigned Overlap Split and Connected Component Analysis","publication_year":2020,"publication_date":"2020-09-29","ids":{"openalex":"https://openalex.org/W3091357698","doi":"https://doi.org/10.1109/iscas45731.2020.9180986","mag":"3091357698"},"language":"en","primary_location":{"id":"doi:10.1109/iscas45731.2020.9180986","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas45731.2020.9180986","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5056175427","display_name":"Byeong Yong Kong","orcid":"https://orcid.org/0000-0001-5823-5505"},"institutions":[{"id":"https://openalex.org/I206597221","display_name":"Kongju National University","ror":"https://ror.org/0373nm262","country_code":"KR","type":"education","lineage":["https://openalex.org/I206597221"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Byeong Yong Kong","raw_affiliation_strings":["Division of Electrical, Electronic, and Control Engineering, Kongju National University, Cheonan, South Korea"],"affiliations":[{"raw_affiliation_string":"Division of Electrical, Electronic, and Control Engineering, Kongju National University, Cheonan, South Korea","institution_ids":["https://openalex.org/I206597221"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090635379","display_name":"Jooseung Lee","orcid":"https://orcid.org/0009-0003-2070-1496"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jooseung Lee","raw_affiliation_strings":["Memory Business, Samsung Electronics Co., Ltd., Hwaseong, South Korea"],"affiliations":[{"raw_affiliation_string":"Memory Business, Samsung Electronics Co., Ltd., Hwaseong, South Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087977408","display_name":"In\u2010Cheol Park","orcid":"https://orcid.org/0000-0003-3524-2838"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"In-Cheol Park","raw_affiliation_strings":["School of Electrical Engineering, KAIST, Daejeon, South Korea"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, KAIST, Daejeon, South Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5056175427"],"corresponding_institution_ids":["https://openalex.org/I206597221"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09315853,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12923","display_name":"Digital Image Processing Techniques","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/raster-graphics","display_name":"Raster graphics","score":0.8070996999740601},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.721389889717102},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.7111622095108032},{"id":"https://openalex.org/keywords/raster-scan","display_name":"Raster scan","score":0.6756400465965271},{"id":"https://openalex.org/keywords/latency","display_name":"Latency (audio)","score":0.6398518681526184},{"id":"https://openalex.org/keywords/low-latency","display_name":"Low latency (capital markets)","score":0.5166404843330383},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5116224884986877},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.4362727701663971},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.42654693126678467},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4172819256782532},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3754253387451172},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3458000421524048},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2827434241771698}],"concepts":[{"id":"https://openalex.org/C181844469","wikidata":"https://www.wikidata.org/wiki/Q182270","display_name":"Raster graphics","level":2,"score":0.8070996999740601},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.721389889717102},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.7111622095108032},{"id":"https://openalex.org/C145406643","wikidata":"https://www.wikidata.org/wiki/Q2641959","display_name":"Raster scan","level":2,"score":0.6756400465965271},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.6398518681526184},{"id":"https://openalex.org/C46637626","wikidata":"https://www.wikidata.org/wiki/Q6693015","display_name":"Low latency (capital markets)","level":2,"score":0.5166404843330383},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5116224884986877},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4362727701663971},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.42654693126678467},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4172819256782532},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3754253387451172},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3458000421524048},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2827434241771698},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas45731.2020.9180986","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas45731.2020.9180986","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2093392189","https://openalex.org/W1984055937","https://openalex.org/W4385770201","https://openalex.org/W1974004953","https://openalex.org/W2072796508","https://openalex.org/W204409194","https://openalex.org/W4397293267","https://openalex.org/W2377833861","https://openalex.org/W2028294394","https://openalex.org/W2027078417"],"abstract_inverted_index":{"A":[0],"low-latency":[1],"multi-touch":[2,36],"detector":[3,160,206],"architecture":[4],"for":[5,20,119,193],"locating":[6],"numerous":[7],"touches":[8],"in":[9,14,34,45,63,98,125,189],"large-panel":[10],"devices":[11],"is":[12,59,74,87,175],"presented":[13],"this":[15],"paper.":[16],"Two":[17],"respective":[18],"processors":[19,49,136],"the":[21,25,31,39,47,69,92,99,104,115,131,134,145,148,151,158,162,204,214],"overlap":[22],"split":[23],"and":[24,76,114,117,147,174,223],"connected":[26],"component":[27],"analysis":[28],"(CCA)":[29],"are":[30,50,101,127,137],"key":[32],"components":[33],"a":[35,54,64,77,156,167,172,178,190,194,210],"detector.":[37],"Exploiting":[38],"simplicity":[40],"of":[41,71,107,171,197,213],"typical":[42],"intensity":[43],"maps":[44],"practice,":[46],"two":[48,135],"first":[51],"redesigned":[52],"under":[53],"principle":[55],"that":[56,122,203],"every":[57],"pixel":[58],"processed":[60,112],"only":[61,219],"once":[62],"raster-scan":[65],"order.":[66],"More":[67],"specifically,":[68],"concept":[70],"valley":[72],"point":[73],"introduced,":[75],"simple":[78],"yet":[79],"effective":[80],"overlap-split":[81],"scheme":[82],"called":[83],"valley-point":[84],"division":[85],"(VPD)":[86],"newly":[88],"developed":[89],"based":[90],"on":[91,103,227],"concept.":[93],"In":[94],"addition,":[95],"equivalent":[96],"labels":[97],"CCA":[100,149],"handled":[102],"fly":[105],"instead":[106],"being":[108],"kept":[109],"to":[110,141,182],"be":[111],"later,":[113],"logics":[116],"memories":[118],"corner":[120],"cases":[121],"never":[123],"occur":[124],"practice":[126],"unloaded.":[128],"Enabled":[129],"by":[130],"redesign,":[132],"subsequently,":[133],"integrated":[138],"into":[139],"one":[140],"concurrently":[142],"conduct":[143],"both":[144],"VPD":[146],"during":[150],"same":[152],"raster":[153,169],"scan.":[154],"As":[155],"result,":[157],"proposed":[159,205],"completes":[161],"whole":[163],"detection":[164],"procedure":[165],"with":[166],"single":[168],"scan":[170],"map,":[173],"exempted":[176],"from":[177],"large":[179,195],"memory":[180],"required":[181],"hold":[183],"an":[184],"entire":[185],"map.":[186],"Implementation":[187],"results":[188],"65-nm":[191],"CMOS":[192],"panel":[196],"400":[198],"\u00d7":[199],"250":[200],"sensors":[201],"demonstrate":[202],"takes":[207],"less":[208],"than":[209],"half":[211],"latency":[212],"existing":[215],"ones":[216],"while":[217],"occupying":[218],"17%":[220],"silicon":[221],"area":[222],"consuming":[224],"52%":[225],"power":[226],"average.":[228]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}