{"id":"https://openalex.org/W3090518500","doi":"https://doi.org/10.1109/iscas45731.2020.9180724","title":"A Low Voltage Discriminant Circuit for Pattern Recognition Exploiting the Asymmetrical Characteristics of Tunnel FET","display_name":"A Low Voltage Discriminant Circuit for Pattern Recognition Exploiting the Asymmetrical Characteristics of Tunnel FET","publication_year":2020,"publication_date":"2020-09-29","ids":{"openalex":"https://openalex.org/W3090518500","doi":"https://doi.org/10.1109/iscas45731.2020.9180724","mag":"3090518500"},"language":"en","primary_location":{"id":"doi:10.1109/iscas45731.2020.9180724","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas45731.2020.9180724","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046189427","display_name":"Aditya Japa","orcid":"https://orcid.org/0000-0003-2408-5400"},"institutions":[{"id":"https://openalex.org/I188963388","display_name":"International Institute of Information Technology","ror":"https://ror.org/02dernx73","country_code":"IN","type":"education","lineage":["https://openalex.org/I188963388"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Aditya Japa","raw_affiliation_strings":["Department of Electronics and Communication Engineering, DSPM International Institute of Information Technology, Naya Raipur, Chhattisgarh 493-661, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, DSPM International Institute of Information Technology, Naya Raipur, Chhattisgarh 493-661, India","institution_ids":["https://openalex.org/I188963388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044228245","display_name":"Yellappa Palagani","orcid":"https://orcid.org/0000-0001-9149-2490"},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yellappa Palagani","raw_affiliation_strings":["School of Electronics Engineering, College of IT Engineering, Kyungpook National University, Daegu, South Korea 702-701"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, College of IT Engineering, Kyungpook National University, Daegu, South Korea 702-701","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014560064","display_name":"Venkateswarlu Gonuguntla","orcid":"https://orcid.org/0000-0002-6857-2254"},"institutions":[{"id":"https://openalex.org/I2802194831","display_name":"Samsung Medical Center","ror":"https://ror.org/05a15z872","country_code":"KR","type":"healthcare","lineage":["https://openalex.org/I2250650973","https://openalex.org/I2802194831"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Venkateswarlu Gonuguntla","raw_affiliation_strings":["Medical Science Research Institute, Samsung Medical Center, Seoul, South Korea","Samsung Medical Center, Medical Science Research Institute, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Medical Science Research Institute, Samsung Medical Center, Seoul, South Korea","institution_ids":["https://openalex.org/I2802194831"]},{"raw_affiliation_string":"Samsung Medical Center, Medical Science Research Institute, Seoul, South Korea","institution_ids":["https://openalex.org/I2802194831"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028265686","display_name":"Manoj Kumar Majumder","orcid":"https://orcid.org/0000-0002-6928-8191"},"institutions":[{"id":"https://openalex.org/I188963388","display_name":"International Institute of Information Technology","ror":"https://ror.org/02dernx73","country_code":"IN","type":"education","lineage":["https://openalex.org/I188963388"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manoj Kumar Majumder","raw_affiliation_strings":["Department of Electronics and Communication Engineering, DSPM International Institute of Information Technology, Naya Raipur, Chhattisgarh 493-661, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, DSPM International Institute of Information Technology, Naya Raipur, Chhattisgarh 493-661, India","institution_ids":["https://openalex.org/I188963388"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101471458","display_name":"Subhendu Kumar Sahoo","orcid":"https://orcid.org/0000-0002-4619-2939"},"institutions":[{"id":"https://openalex.org/I4210101034","display_name":"Birla Institute of Technology and Science - Hyderabad Campus","ror":"https://ror.org/014ctt859","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210101034","https://openalex.org/I74796645"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Subhendu K. Sahoo","raw_affiliation_strings":["Department of Electrical and Electronics Engineering, Birla Institute of Technology and Science, Hyderabad 500078, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronics Engineering, Birla Institute of Technology and Science, Hyderabad 500078, India","institution_ids":["https://openalex.org/I4210101034"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113492673","display_name":"Jun Rim Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I31419693","display_name":"Kyungpook National University","ror":"https://ror.org/040c17130","country_code":"KR","type":"education","lineage":["https://openalex.org/I31419693"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jun Rim Choi","raw_affiliation_strings":["School of Electronics Engineering, College of IT Engineering, Kyungpook National University, Daegu, South Korea 702-701"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics Engineering, College of IT Engineering, Kyungpook National University, Daegu, South Korea 702-701","institution_ids":["https://openalex.org/I31419693"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5086107411","display_name":"Ramesh Vaddi","orcid":"https://orcid.org/0000-0003-3158-4013"},"institutions":[{"id":"https://openalex.org/I4210100463","display_name":"SRM University, Andhra Pradesh","ror":"https://ror.org/013vs5h31","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210100463"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ramesh Vaddi","raw_affiliation_strings":["Department of Electronics and Communication, School of Engineering and Applied Sciences, SRM University, Andhra Pradesh, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication, School of Engineering and Applied Sciences, SRM University, Andhra Pradesh, India","institution_ids":["https://openalex.org/I4210100463"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.09186243,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminant","display_name":"Discriminant","score":0.6971568465232849},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5469728112220764},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.5430968403816223},{"id":"https://openalex.org/keywords/linear-discriminant-analysis","display_name":"Linear discriminant analysis","score":0.5425409078598022},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.5250115990638733},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5219057202339172},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5189694762229919},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.4926798939704895},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4475807845592499},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4404471814632416},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.41985607147216797},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3432892858982086},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.32723650336265564},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32400768995285034},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26391905546188354},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.17431104183197021}],"concepts":[{"id":"https://openalex.org/C78397625","wikidata":"https://www.wikidata.org/wiki/Q192487","display_name":"Discriminant","level":2,"score":0.6971568465232849},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5469728112220764},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.5430968403816223},{"id":"https://openalex.org/C69738355","wikidata":"https://www.wikidata.org/wiki/Q1228929","display_name":"Linear discriminant analysis","level":2,"score":0.5425409078598022},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.5250115990638733},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5219057202339172},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5189694762229919},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.4926798939704895},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4475807845592499},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4404471814632416},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.41985607147216797},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3432892858982086},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32723650336265564},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32400768995285034},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26391905546188354},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.17431104183197021},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas45731.2020.9180724","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas45731.2020.9180724","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1760284886","https://openalex.org/W1984599282","https://openalex.org/W2047268472","https://openalex.org/W2088079958","https://openalex.org/W2088209560","https://openalex.org/W2093950219","https://openalex.org/W2141621279","https://openalex.org/W2153982456","https://openalex.org/W2241537608","https://openalex.org/W2332653257","https://openalex.org/W2343807391","https://openalex.org/W2343988147","https://openalex.org/W2346644627","https://openalex.org/W2498860800","https://openalex.org/W2507864219","https://openalex.org/W2526417533","https://openalex.org/W2533098220","https://openalex.org/W2546562252","https://openalex.org/W2550273991","https://openalex.org/W2563468918","https://openalex.org/W2577525055","https://openalex.org/W2794034558","https://openalex.org/W3103169341","https://openalex.org/W6637907185"],"related_works":["https://openalex.org/W2350751952","https://openalex.org/W1999647744","https://openalex.org/W2362114017","https://openalex.org/W3147024994","https://openalex.org/W2063246903","https://openalex.org/W2374055396","https://openalex.org/W1978302214","https://openalex.org/W2021817983","https://openalex.org/W3008559849","https://openalex.org/W2371177901"],"abstract_inverted_index":{"This":[0],"paper":[1],"exploits":[2],"tunnel":[3],"field-effect":[4],"transistors":[5],"(TFET)":[6],"unique":[7],"asymmetrical":[8],"device":[9],"characteristics,":[10,48],"demonstrating":[11],"discriminant":[12,84,121],"circuits":[13],"for":[14],"pattern":[15,76,127],"recognition":[16,128],"useful":[17],"in":[18,31,41,69],"machine":[19,114],"learning-based":[20,115],"VLSI":[21,116],"and":[22,107,131],"IoT":[23],"designs.":[24],"In":[25],"contrast":[26],"to":[27,46,74],"unidirectional":[28],"current":[29,38],"conduction":[30],"TFET,":[32],"it":[33],"exhibits":[34,52],"significant":[35],"p-i-n":[36],"leakage":[37],"with":[39,72,93],"increase":[40],"negative":[42],"drain-to-source":[43],"voltage.":[44],"Due":[45],"this":[47,56,81],"TFET":[49],"transmission":[50],"gate":[51],"distinct":[53],"behavior.":[54],"Exploiting":[55],"behavior,":[57],"a":[58,83],"ring":[59],"oscillator":[60],"(RO)":[61],"is":[62,86,89],"designed":[63],"that":[64],"can":[65],"sense":[66],"the":[67,75,110,124,133],"changes":[68],"operating":[70],"frequency":[71],"response":[73],"of":[77,98,104,112,120,126],"control":[78],"bits.":[79],"Utilizing":[80],"RO,":[82],"circuit":[85,122],"demonstrated":[87],"which":[88],"highly":[90],"energy":[91,96,134],"efficient":[92],"an":[94],"ultra-low":[95],"consumption":[97],"34.5":[99],"pJ":[100],"at":[101],"supply":[102],"voltage":[103],"0.4":[105],"V":[106],"much":[108],"suits":[109],"demands":[111],"emerging":[113],"systems.":[117],"The":[118],"simplicity":[119],"makes":[123],"architecture":[125],"engine":[129],"simpler":[130],"reduces":[132],"overheads.":[135]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}