{"id":"https://openalex.org/W3090741864","doi":"https://doi.org/10.1109/iscas45731.2020.9180675","title":"Process Variation Model and Analysis for Domain Wall-Magnetic Tunnel Junction Logic","display_name":"Process Variation Model and Analysis for Domain Wall-Magnetic Tunnel Junction Logic","publication_year":2020,"publication_date":"2020-09-29","ids":{"openalex":"https://openalex.org/W3090741864","doi":"https://doi.org/10.1109/iscas45731.2020.9180675","mag":"3090741864"},"language":"en","primary_location":{"id":"doi:10.1109/iscas45731.2020.9180675","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas45731.2020.9180675","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/biblio/1763164","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088513405","display_name":"Xuan Hu","orcid":"https://orcid.org/0000-0002-7337-6637"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Xuan Hu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072915239","display_name":"Alexander J. Edwards","orcid":"https://orcid.org/0000-0002-7050-3151"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alexander J. Edwards","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX USA","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011371394","display_name":"T. Patrick Xiao","orcid":"https://orcid.org/0000-0001-9066-2961"},"institutions":[{"id":"https://openalex.org/I192454743","display_name":"Sandia National Laboratories California","ror":"https://ror.org/058m7ey48","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1330989302","https://openalex.org/I192454743","https://openalex.org/I198811213","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T. Patrick Xiao","raw_affiliation_strings":["Sandia National Laboraties, Alburquerque, NM USA","Sandia National Laboraties, Alburquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboraties, Alburquerque, NM USA","institution_ids":["https://openalex.org/I192454743"]},{"raw_affiliation_string":"Sandia National Laboraties, Alburquerque, NM, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088323080","display_name":"Christopher H. Bennett","orcid":"https://orcid.org/0000-0002-6989-292X"},"institutions":[{"id":"https://openalex.org/I192454743","display_name":"Sandia National Laboratories California","ror":"https://ror.org/058m7ey48","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1330989302","https://openalex.org/I192454743","https://openalex.org/I198811213","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Christopher H. Bennett","raw_affiliation_strings":["Sandia National Laboraties, Alburquerque, NM USA","Sandia National Laboraties, Alburquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboraties, Alburquerque, NM USA","institution_ids":["https://openalex.org/I192454743"]},{"raw_affiliation_string":"Sandia National Laboraties, Alburquerque, NM, USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013365606","display_name":"Jean Anne C. Incorvia","orcid":"https://orcid.org/0000-0002-4805-2112"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jean Anne C. Incorvia","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017426058","display_name":"Matthew Marinella","orcid":"https://orcid.org/0000-0002-6537-1836"},"institutions":[{"id":"https://openalex.org/I192454743","display_name":"Sandia National Laboratories California","ror":"https://ror.org/058m7ey48","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1330989302","https://openalex.org/I192454743","https://openalex.org/I198811213","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew J. Marinella","raw_affiliation_strings":["Sandia National Laboraties, Alburquerque, NM USA","Sandia National Laboraties, Alburquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboraties, Alburquerque, NM USA","institution_ids":["https://openalex.org/I192454743"]},{"raw_affiliation_string":"Sandia National Laboraties, Alburquerque, NM, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001887370","display_name":"Joseph S. Friedman","orcid":"https://orcid.org/0000-0001-9847-4455"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joseph S. Friedman","raw_affiliation_strings":["Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, TX USA","institution_ids":["https://openalex.org/I162577319"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5088513405"],"corresponding_institution_ids":["https://openalex.org/I162577319"],"apc_list":null,"apc_paid":null,"fwci":0.2809,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.57663815,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"309","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.8213438987731934},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6954358220100403},{"id":"https://openalex.org/keywords/spintronics","display_name":"Spintronics","score":0.6312223076820374},{"id":"https://openalex.org/keywords/process-variation","display_name":"Process variation","score":0.5841391086578369},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5172260999679565},{"id":"https://openalex.org/keywords/fabrication","display_name":"Fabrication","score":0.5143502950668335},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5003414154052734},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43834492564201355},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42552807927131653},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4020811915397644},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3641268014907837},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2742050290107727},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22802519798278809},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.19842615723609924},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13821694254875183},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.07464933395385742}],"concepts":[{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.8213438987731934},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6954358220100403},{"id":"https://openalex.org/C207999682","wikidata":"https://www.wikidata.org/wiki/Q258659","display_name":"Spintronics","level":3,"score":0.6312223076820374},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.5841391086578369},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5172260999679565},{"id":"https://openalex.org/C136525101","wikidata":"https://www.wikidata.org/wiki/Q5428139","display_name":"Fabrication","level":3,"score":0.5143502950668335},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5003414154052734},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43834492564201355},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42552807927131653},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4020811915397644},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3641268014907837},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2742050290107727},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22802519798278809},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.19842615723609924},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13821694254875183},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.07464933395385742},{"id":"https://openalex.org/C204787440","wikidata":"https://www.wikidata.org/wiki/Q188504","display_name":"Alternative medicine","level":2,"score":0.0},{"id":"https://openalex.org/C82217956","wikidata":"https://www.wikidata.org/wiki/Q184207","display_name":"Ferromagnetism","level":2,"score":0.0},{"id":"https://openalex.org/C142724271","wikidata":"https://www.wikidata.org/wiki/Q7208","display_name":"Pathology","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iscas45731.2020.9180675","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas45731.2020.9180675","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},{"id":"pmh:oai:osti.gov:1763164","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1763164","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:osti.gov:1763164","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1763164","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[{"score":0.8999999761581421,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1964288235","https://openalex.org/W1985330137","https://openalex.org/W2037906217","https://openalex.org/W2039375332","https://openalex.org/W2040687898","https://openalex.org/W2063517113","https://openalex.org/W2079103493","https://openalex.org/W2095928257","https://openalex.org/W2101091847","https://openalex.org/W2105827747","https://openalex.org/W2138670105","https://openalex.org/W2164138286","https://openalex.org/W2169757251","https://openalex.org/W2259424429","https://openalex.org/W2289158019","https://openalex.org/W2320724838","https://openalex.org/W2623494632","https://openalex.org/W2759071019","https://openalex.org/W2790154111","https://openalex.org/W2898009051","https://openalex.org/W2920979543","https://openalex.org/W2946089153","https://openalex.org/W2971824093","https://openalex.org/W2989820016"],"related_works":["https://openalex.org/W4281706696","https://openalex.org/W3014386030","https://openalex.org/W2787498336","https://openalex.org/W3106163966","https://openalex.org/W3042825715","https://openalex.org/W2182734591","https://openalex.org/W4206789007","https://openalex.org/W2472345086","https://openalex.org/W2395319712","https://openalex.org/W2116187372"],"abstract_inverted_index":{"The":[0],"domain":[1],"wall-magnetic":[2],"tunnel":[3],"junction":[4],"(DW-MTJ)":[5],"is":[6,29,42,75,82],"a":[7,38,56,102],"spintronic":[8,34,142],"device":[9,127],"that":[10,106,129],"enables":[11,50],"efficient":[12],"logic":[13,59,63,135],"circuit":[14,125],"design":[15,52,128],"because":[16],"of":[17,31,55,88,110,119,133,140],"its":[18],"low":[19],"energy":[20],"consumption,":[21],"small":[22],"size,":[23],"and":[24,53,71,117,126,136],"non-volatility.":[25],"Furthermore,":[26],"the":[27,32,66,86,94,108,115,131,138],"DW-MTJ":[28,58,62,90,104,120,134],"one":[30],"few":[33],"devices":[35,91],"for":[36],"which":[37,74],"direct":[39],"cascading":[40],"mechanism":[41],"experimentally":[43],"demonstrated":[44],"without":[45],"any":[46],"extra":[47],"buffers;":[48],"this":[49],"potential":[51],"fabrication":[54],"large-scale":[57],"system.":[60],"However,":[61],"relies":[64],"on":[65],"conversion":[67],"between":[68],"electrical":[69],"signals":[70],"magnetic":[72],"states":[73],"sensitive":[76],"to":[77,84,92,113],"process":[78,111],"imperfection.":[79],"Therefore,":[80],"it":[81],"important":[83],"analyze":[85],"robustness":[87,132],"such":[89],"anticipate":[93],"system":[95],"reliability":[96],"before":[97],"fabrication.":[98],"Here":[99],"we":[100],"propose":[101],"new":[103],"model":[105],"integrates":[107],"impacts":[109],"variation":[112],"enable":[114],"analysis":[116],"optimization":[118],"logic.":[121],"This":[122],"will":[123],"allow":[124],"enhances":[130],"advances":[137],"development":[139],"energy-efficient":[141],"computing":[143],"systems.":[144]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}