{"id":"https://openalex.org/W2943449094","doi":"https://doi.org/10.1109/iscas.2019.8702122","title":"Composite Optimization for Electromigration Reliability and Noise in Power Grid Networks","display_name":"Composite Optimization for Electromigration Reliability and Noise in Power Grid Networks","publication_year":2019,"publication_date":"2019-05-01","ids":{"openalex":"https://openalex.org/W2943449094","doi":"https://doi.org/10.1109/iscas.2019.8702122","mag":"2943449094"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2019.8702122","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2019.8702122","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101984165","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0002-9653-7253"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Wang","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science & Technology, Department of Computer Science & Technology, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science & Technology, Department of Computer Science & Technology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100894724","display_name":"Yici Cai","orcid":null},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yici Cai","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science & Technology, Department of Computer Science & Technology, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science & Technology, Department of Computer Science & Technology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101530192","display_name":"Ming Yan","orcid":"https://orcid.org/0000-0003-0077-5749"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Yan","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science & Technology, Department of Computer Science & Technology, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science & Technology, Department of Computer Science & Technology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101929509","display_name":"Qiang Zhou","orcid":"https://orcid.org/0000-0003-1348-8861"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Zhou","raw_affiliation_strings":["Tsinghua National Laboratory for Information Science & Technology, Department of Computer Science & Technology, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tsinghua National Laboratory for Information Science & Technology, Department of Computer Science & Technology, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I99065089"],"apc_list":null,"apc_paid":null,"fwci":1.9325,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.80133994,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":"22","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.8287698030471802},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7360727787017822},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.673574686050415},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5595873594284058},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4748547375202179},{"id":"https://openalex.org/keywords/power-grid","display_name":"Power grid","score":0.4659973382949829},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.4355591833591461},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.379192054271698},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3473353981971741},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2692415416240692},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24285197257995605},{"id":"https://openalex.org/keywords/interconnection","display_name":"Interconnection","score":0.13668698072433472},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12422195076942444},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.06294503808021545}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.8287698030471802},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7360727787017822},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.673574686050415},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5595873594284058},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4748547375202179},{"id":"https://openalex.org/C2983254600","wikidata":"https://www.wikidata.org/wiki/Q1096907","display_name":"Power grid","level":3,"score":0.4659973382949829},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.4355591833591461},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.379192054271698},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3473353981971741},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2692415416240692},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24285197257995605},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.13668698072433472},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12422195076942444},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.06294503808021545},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2019.8702122","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2019.8702122","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Symposium on Circuits and Systems (ISCAS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.4699999988079071,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1590174303","https://openalex.org/W1977146073","https://openalex.org/W1978838828","https://openalex.org/W2064477270","https://openalex.org/W2091384027","https://openalex.org/W2117186310","https://openalex.org/W2150608324","https://openalex.org/W2159884881","https://openalex.org/W2295208369","https://openalex.org/W2344964871","https://openalex.org/W2613570260","https://openalex.org/W2626746672","https://openalex.org/W2736959725","https://openalex.org/W2769038840","https://openalex.org/W6645106826","https://openalex.org/W6745943690"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Electromigration(EM)":[0],"and":[1,23,46,92],"power":[2,13,24,47,94],"supply":[3,25],"noise":[4,26,48,95],"has":[5],"been":[6],"considered":[7],"serious":[8],"reliability":[9,21,72],"issue":[10],"in":[11,19],"the":[12,52,77,99],"grid":[14],"networks.":[15],"Several":[16],"performance":[17],"goals":[18],"EM":[20,45,58,62],"optimization":[22,27,41,49,73,90],"are":[28],"typically":[29],"conflict":[30],"with":[31,87],"each":[32],"other.":[33],"In":[34,51],"this":[35],"paper,":[36],"we":[37,54],"propose":[38],"a":[39,56],"composite":[40,71,100],"method":[42,74],"trading":[43],"off":[44],"process.":[50],"method,":[53],"expand":[55],"temperature-aware":[57],"model,":[59],"which":[60],"takes":[61],"transient":[63],"effect":[64],"into":[65],"account.":[66],"Experimental":[67],"results":[68],"show":[69],"that":[70],"can":[75],"lengthen":[76],"lifetime":[78],"of":[79],"an":[80],"entire":[81],"circuit":[82],"by":[83],"approximately":[84],"10%":[85],"compared":[86],"previous":[88],"respective":[89],"strategy":[91],"no":[93],"violations":[96],"exists":[97],"after":[98],"optimization.":[101]},"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}